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Ni-CeO2/SBA-15 Catalyst Prepared by Glycine-Assisted Impregnation Method for Low-Temperature Dry Reforming of Methane. CRYSTALS 2022. [DOI: 10.3390/cryst12050713] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
Abstract
Developing low-temperature nickel-based catalysts with good resistance to coking and sintering for dry reforming of methane (DRM) is of great significance. In this work, Ni (5 wt%) and CeO2 (5 wt%) were supported on SBA-15 porous material by glycine-assisted impregnation method to obtain Ni-CeO2/SBA-15-G catalyst. XRD and TEM results showed that the addition of glycine can effectively promote the dispersion of NiO and CeO2 in the pores of SBA-15. H2-TPR and XPS results confirmed the formation of stronger metal-support interaction. In addition, after the addition of glycine, the NixCe1−xOy solid solution content was increased significantly, meanwhile, the Ce3+ concentration was increased from 31% to 49%, accompanied by more oxygen vacancies and generation of active oxygen species. For the above reasons, Ni-CeO2/SBA-15-G had better catalytic performance in the low-temperature DRM test (20 h, 600 °C) with high GHSV (600,000 mL/gcat/h), its CH4 conversion after reaction of 20 h was 2 times that of Ni-CeO2/SBA-15-C catalyst prepared by a conventional impregnation method. TGA-DTA test also proved that Ni-CeO2/SBA-15-G almost completely eliminated carbon deposition. The above advantages of the Ni-CeO2/SBA-15-G catalyst may have originated from the complexation of glycine with metal cations and can prevent them from gathering.
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Petersen H, Weidenthaler C. A review of recent developments for the in situ/operando characterization of nanoporous materials. Inorg Chem Front 2022. [DOI: 10.1039/d2qi00977c] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
This is a review on up-to-date in situ/operando methods for a comprehensive characterization of nanoporous materials. The group of nanoporous materials is constantly growing, and with it, the variety of...
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Narayanan T, Konovalov O. Synchrotron Scattering Methods for Nanomaterials and Soft Matter Research. MATERIALS (BASEL, SWITZERLAND) 2020; 13:E752. [PMID: 32041363 PMCID: PMC7040635 DOI: 10.3390/ma13030752] [Citation(s) in RCA: 30] [Impact Index Per Article: 7.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/14/2019] [Revised: 01/29/2020] [Accepted: 01/31/2020] [Indexed: 12/17/2022]
Abstract
This article aims to provide an overview of broad range of applications of synchrotron scattering methods in the investigation of nanoscale materials. These scattering techniques allow the elucidation of the structure and dynamics of nanomaterials from sub-nm to micron size scales and down to sub-millisecond time ranges both in bulk and at interfaces. A major advantage of scattering methods is that they provide the ensemble averaged information under in situ and operando conditions. As a result, they are complementary to various imaging techniques which reveal more local information. Scattering methods are particularly suitable for probing buried structures that are difficult to image. Although, many qualitative features can be directly extracted from scattering data, derivation of detailed structural and dynamical information requires quantitative modeling. The fourth-generation synchrotron sources open new possibilities for investigating these complex systems by exploiting the enhanced brightness and coherence properties of X-rays.
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Alvarez-Fernandez A, Reid B, Fornerod MJ, Taylor A, Divitini G, Guldin S. Structural Characterization of Mesoporous Thin Film Architectures: A Tutorial Overview. ACS APPLIED MATERIALS & INTERFACES 2020; 12:5195-5208. [PMID: 31961128 DOI: 10.1021/acsami.9b17899] [Citation(s) in RCA: 18] [Impact Index Per Article: 4.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/04/2023]
Abstract
Mesoporous thin film architectures are an important class of materials that exhibit unique properties, which include high surface area, versatile surface functionalization, and bicontinuous percolation paths through a broad library of pore arrangements on the 10 nm length scale. Although porosimetry of bulk materials via sorption techniques is common practice, the characterization of thin mesoporous films with small sample volumes remains a challenge. A range of techniques are geared toward providing information over pore morphology, pore size distribution, surface area and overall porosity, but none of them offers a holistic evaluation and results are at times inconsistent. In this work, we present a tutorial overview for the reliable structural characterization of mesoporous films. Three model samples with variable pore size and porosity prepared by block copolymer (BCP) coassembly serve for a rational comparison. Various techniques are assessed side-by-side, including scanning electron microscopy (SEM), atomic force microscopy (AFM), grazing incidence small-angle X-ray scattering (GISAXS), and ellipsometric porosimetry (EP). We critically discuss advantages and limitations of each technique and provide guidelines for reliable implementation.
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Affiliation(s)
- Alberto Alvarez-Fernandez
- Department of Chemical Engineering , University College London , Torrington Place , London WC1E 7JE , United Kingdom
| | - Barry Reid
- Department of Chemical Engineering , University College London , Torrington Place , London WC1E 7JE , United Kingdom
| | - Maximiliano J Fornerod
- Department of Chemical Engineering , University College London , Torrington Place , London WC1E 7JE , United Kingdom
| | - Alaric Taylor
- Department of Chemical Engineering , University College London , Torrington Place , London WC1E 7JE , United Kingdom
| | - Giorgio Divitini
- Department of Materials Science and Metallurgy , University of Cambridge , 27 Charles Babbage Road , Cambridge CB3 0FS , United Kingdom
| | - Stefan Guldin
- Department of Chemical Engineering , University College London , Torrington Place , London WC1E 7JE , United Kingdom
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Pyanzina ES, Sánchez PA, Cerdà JJ, Sintes T, Kantorovich SS. Scattering properties and internal structure of magnetic filament brushes. SOFT MATTER 2017; 13:2590-2602. [PMID: 28327731 PMCID: PMC5436091 DOI: 10.1039/c6sm02606k] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 11/18/2016] [Accepted: 03/12/2017] [Indexed: 06/06/2023]
Abstract
Practical applications of polymer brush-like systems rely on a clear understanding of their internal structure. In the case of magnetic nanoparticle filament brushes, the competition between bonding and nonbonding interactions-including long range magnetic dipole-dipole interactions-makes the microstructure of these polymer brush-like systems rather complex. On the other hand, the same interactions open up the possibility to manipulate the meso- and macroscopic responses of these systems by applying external magnetic fields or by changing the background temperature. In this study, we put forward an approach to extract information about the internal structure of a magnetic filament brush from scattering experiments. Our method is based on the mapping of the scattering profiles to the information about the internal equilibrium configurations of the brushes obtained from computer simulations. We show that the structure of the magnetic filament brush is strongly anisotropic in the direction perpendicular to the grafting surface, especially at low temperatures and external fields. This makes slice-by-slice scattering measurements a technique very useful for the study of such systems.
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Affiliation(s)
- Elena S Pyanzina
- Ural Federal University, Lenin av. 51, 620000 Ekaterinburg, Russia.
| | | | - Joan J Cerdà
- Instituto de Física Interdisciplinar y Sistemas Complejos (CSIC-UIB), E-07122 Palma de Mallorca, Spain
| | - Tomàs Sintes
- Instituto de Física Interdisciplinar y Sistemas Complejos (CSIC-UIB), E-07122 Palma de Mallorca, Spain
| | - Sofia S Kantorovich
- Ural Federal University, Lenin av. 51, 620000 Ekaterinburg, Russia. and University of Vienna, Sensengasse 8, 1090 Vienna, Austria
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Bhattacharyya A, Sanyal MK, Mogera U, George SJ, Mukhopadhyay MK, Maiti S, Kulkarni GU. In-Situ GISAXS Study of Supramolecular Nanofibers having Ultrafast Humidity Sensitivity. Sci Rep 2017; 7:246. [PMID: 28325936 PMCID: PMC5428228 DOI: 10.1038/s41598-017-00309-2] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/04/2016] [Accepted: 02/20/2017] [Indexed: 11/09/2022] Open
Abstract
Self assembled nanofibers derived from donor-acceptor (D-A) pair of dodecyl methyl viologen (DMV) and potassium salt of coronene tetracarboxylate (CS) is an excellent material for the development of organic electronic devices particularly for ultrafast response to relative humidity (RH). Here we have presented the results of in-situ grazing incidence small angle x-ray scattering (GISAXS) measurements to understand aridity dependent self reorganization of the nanofibers. The instantaneous changes in the organization of the nanofibers was monitored with different equilibrium RH conditions. Additionally formation of nanofibers during drying was studied by GISAXS technique - the results show two distinct stages of structural arrangements, first the formation of a lamellar mesophase and then, the evolution of a distorted hexagonal lattice. The RH dependent GISAXS results revealed a high degree of swelling in the lattice of the micelles and reduction in the distortion of the hexagonal structure with increase in RH. In high RH condition, the nanofibers show elliptical distortion but could not break into lamellar phase as observed during formation through drying. This observed structural deformation gives insight into nanoscopic structural changes of the micelles with change in RH around it and in turn explains ultrafast sensitivity in its conductivity for RH variation.
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Affiliation(s)
- Arpan Bhattacharyya
- Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Kolkata, 700 064, India
| | - Milan K Sanyal
- Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Kolkata, 700 064, India. .,Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bangalore, 560064, India.
| | - Umesha Mogera
- Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bangalore, 560064, India
| | - Subi J George
- Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bangalore, 560064, India
| | | | - Santanu Maiti
- Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Kolkata, 700 064, India
| | - Giridhar U Kulkarni
- Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bangalore, 560064, India.,Centre for Nano and Soft Matter Sciences, Jalahalli P.O., Bangalore, 560013, India
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Narayanan T, Wacklin H, Konovalov O, Lund R. Recent applications of synchrotron radiation and neutrons in the study of soft matter. CRYSTALLOGR REV 2017. [DOI: 10.1080/0889311x.2016.1277212] [Citation(s) in RCA: 45] [Impact Index Per Article: 6.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/28/2023]
Affiliation(s)
| | - Hanna Wacklin
- European Spallation Source ERIC, Lund, Sweden
- Physical Chemistry, Lund University, Lund, Sweden
| | | | - Reidar Lund
- Department of Chemistry, University of Oslo, Blindern, Oslo, Norway
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Chavez Panduro EA, Assaker K, Beuvier T, Blin JL, Stébé MJ, Konovalov O, Gibaud A. Nonionic Fluorinated Surfactant Removal from Mesoporous Film Using sc-CO 2. ACS APPLIED MATERIALS & INTERFACES 2017; 9:3093-3101. [PMID: 28030765 DOI: 10.1021/acsami.6b12936] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
Surfactant templated silica thin films were self-assembled on solid substrates by dip-coating using a partially fluorinated surfactant R8F(EO)9 as the liquid crystal template. The aim was 2-fold: first we checked which composition in the phase diagram was corresponding to a 2D rectangular highly ordered crystalline phase and second we exposed the films to sc-CO2 to foster the removal of the surfactant. The films were characterized by in situ X-ray reflectivity (XRR) and grazing incidence small angle X-ray scattering (GISAXS) under CO2 pressure from 0 to 100 bar at 34 °C. GISAXS patterns reveal the formation of a 2-D rectangular structure at a molar ratio R8F(EO)9/Si equal to 0.1. R8F(EO)9 micelles have a cylindrical shape, which have a core/shell structure ordered in a hexagonal system. The core contains the R8F part and the shell is a mixture of (EO)9 embedded in the silica matrix. We further evidence that the extraction of the template using supercritical carbon dioxide can be successfully achieved. This can be attributed to both the low solubility parameter of the surfactants and the fluorine and ethylene oxide CO2-philic groups. The initial 2D rectangular structure was well preserved after depressurization of the cell and removal of the surfactant. We attribute the very high stability of the rinsed film to the large value of the wall thickness relatively to the small pore size.
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Affiliation(s)
- Elvia A Chavez Panduro
- Deparment of Physics, Norwegian University of Science and Technology ,Høgskoleringen 5, 7491 Trondheim, Norway
- IMMM, UMR CNRS 6087, Université du Maine , Le Mans 72085 cedex 09, France
- ESRF , 6 Jules Horowitz, Grenoble 38000 cedex, France
| | - Karine Assaker
- Université de Lorraine/CNRS, SRSMC, UMR7565 , Vandoeuvre-lès-Nancy F-54506 cedex, France
| | - Thomas Beuvier
- IMMM, UMR CNRS 6087, Université du Maine , Le Mans 72085 cedex 09, France
| | - Jean-Luc Blin
- Université de Lorraine/CNRS, SRSMC, UMR7565 , Vandoeuvre-lès-Nancy F-54506 cedex, France
| | - Marie-José Stébé
- Université de Lorraine/CNRS, SRSMC, UMR7565 , Vandoeuvre-lès-Nancy F-54506 cedex, France
| | | | - Alain Gibaud
- IMMM, UMR CNRS 6087, Université du Maine , Le Mans 72085 cedex 09, France
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Fritz-Popovski G, Morak R, Sharifi P, Amenitsch H, Paris O. Pore shape and sorption behaviour in mesoporous ordered silica films. J Appl Crystallogr 2016; 49:1713-1720. [PMID: 27738418 PMCID: PMC5045732 DOI: 10.1107/s1600576716013698] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/23/2016] [Accepted: 08/25/2016] [Indexed: 11/25/2022] Open
Abstract
The shape and sorption behaviour of pores in mesoporous ordered silica films are determined from grazing-incidence small-angle X-ray scattering data. Mesoporous silica films templated by pluronic P123 were prepared using spin and dip coating. The ordered cylindrical structure within the films deforms due to shrinkage during calcination. Grazing-incidence small-angle X-ray scattering (GISAXS) measurements reveal that both the unit cell and the cross section of the pores decrease in size, mainly normal to the surface of the substrate, leading to elliptical cross sections of the pores with axis ratios of about 1:2. Water take-up by the pores upon changing the relative humidity can be monitored quantitatively by the shift in the critical angle of X-ray reflection as seen by the Yoneda peak.
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Affiliation(s)
- Gerhard Fritz-Popovski
- Institute of Physics, Montanuniversität Leoben, Franz-Josef-Strasse 18, 8700 Leoben, Austria
| | - Roland Morak
- Institute of Physics, Montanuniversität Leoben, Franz-Josef-Strasse 18, 8700 Leoben, Austria
| | - Parvin Sharifi
- Institute of Physics, Montanuniversität Leoben, Franz-Josef-Strasse 18, 8700 Leoben, Austria; Max-Planck-Institut für Kohlenforschung, Kaiser-Wilhelm-Platz 1, 45470 Mülheim an der Ruhr, Germany
| | - Heinz Amenitsch
- Institute for Inorganic Chemistry, Graz University of Technology, Stremayrgasse 9/V, A-8010 Graz, Austria
| | - Oskar Paris
- Institute of Physics, Montanuniversität Leoben, Franz-Josef-Strasse 18, 8700 Leoben, Austria
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Abstract
X-ray scattering is a structural characterization tool that has impacted diverse fields of study. It is unique in its ability to examine materials in real time and under realistic sample environments, enabling researchers to understand morphology at nanometer and angstrom length scales using complementary small and wide angle X-ray scattering (SAXS, WAXS), respectively. Herein, we focus on the use of SAXS to examine nanoscale particulate systems. We provide a theoretical foundation for X-ray scattering, considering both form factor and structure factor, as well as the use of correlation functions, which may be used to determine a particle's size, size distribution, shape, and organization into hierarchical structures. The theory is expanded upon with contemporary use cases. Both transmission and reflection (grazing incidence) geometries are addressed, as well as the combination of SAXS with other X-ray and non-X-ray characterization tools. We conclude with an examination of several key areas of research where X-ray scattering has played a pivotal role, including in situ nanoparticle synthesis, nanoparticle assembly, and operando studies of catalysts and energy storage materials. Throughout this review we highlight the unique capabilities of X-ray scattering for structural characterization of materials in their native environment.
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Affiliation(s)
- Tao Li
- X-ray Science Division, Argonne National Laboratory , 9700 South Cass Avenue, Lemont, Illinois 60439, United States
| | - Andrew J Senesi
- X-ray Science Division, Argonne National Laboratory , 9700 South Cass Avenue, Lemont, Illinois 60439, United States
| | - Byeongdu Lee
- X-ray Science Division, Argonne National Laboratory , 9700 South Cass Avenue, Lemont, Illinois 60439, United States
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Dendooven J, Devloo-Casier K, Ide M, Grandfield K, Kurttepeli M, Ludwig KF, Bals S, Van Der Voort P, Detavernier C. Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle X-ray scattering. NANOSCALE 2014; 6:14991-14998. [PMID: 25363826 DOI: 10.1039/c4nr05049e] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Atomic layer deposition (ALD) enables the conformal coating of porous materials, making the technique suitable for pore size tuning at the atomic level, e.g., for applications in catalysis, gas separation and sensing. It is, however, not straightforward to obtain information about the conformality of ALD coatings deposited in pores with diameters in the low mesoporous regime (<10 nm). In this work, it is demonstrated that in situ synchrotron based grazing incidence small angle X-ray scattering (GISAXS) can provide valuable information on the change in density and internal surface area during ALD of TiO(2) in a porous titania film with small mesopores (3-8 nm). The results are shown to be in good agreement with in situ X-ray fluorescence data representing the evolution of the amount of Ti atoms deposited in the porous film. Analysis of both datasets indicates that the minimum pore diameter that can be achieved by ALD is determined by the size of the Ti-precursor molecule.
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Affiliation(s)
- Jolien Dendooven
- Department of Solid State Sciences, COCOON, Ghent University, Krijgslaan 281/S1, B-9000 Ghent, Belgium.
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Wernecke J, Krumrey M, Hoell A, Kline RJ, Liu HK, Wu WL. Traceable GISAXS measurements for pitch determination of a 25 nm self-assembled polymer grating. J Appl Crystallogr 2014. [DOI: 10.1107/s1600576714021050] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Open
Abstract
The feature sizes of only a few nanometres in modern nanotechnology and next-generation microelectronics continually increase the demand for suitable nanometrology tools. Grazing-incidence small-angle X-ray scattering (GISAXS) is a versatile technique to measure lateral and vertical sizes in the nanometre range, but the traceability of the obtained parameters, which is a prerequisite for any metrological measurement, has not been demonstrated so far. In this work, the first traceable GISAXS measurements, demonstrated with a self-assembled block copolymer grating structure with a nominal pitch of 25 nm, are reported. The different uncertainty contributions to the obtained pitch value of 24.83 (9) nm are discussed individually. The main uncertainty contribution results from the sample–detector distance and the pixel size measurement, whereas the intrinsic asymmetry of the scattering features is of minor relevance for the investigated grating structure. The uncertainty analysis provides a basis for the evaluation of the uncertainty of GISAXS data in a more general context, for example in numerical data modeling.
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