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For: Zhao Y, Koike S, Nakama R, Ihara S, Mitsuhara M, Murayama M, Hata S, Saito H. Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering. Sci Rep 2021;11:20720. [PMID: 34702955 DOI: 10.1038/s41598-021-99914-5] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Academic Contribution Register] [Received: 06/18/2021] [Accepted: 09/30/2021] [Indexed: 11/22/2022]  Open
Number Cited by Other Article(s)
1
Hata S, Ihara S, Saito H, Murayama M. In-situ heating-and-electron tomography for materials research: from 3D (in-situ 2D) to 4D (in-situ 3D). Microscopy (Oxf) 2024;73:133-144. [PMID: 38462986 PMCID: PMC11000667 DOI: 10.1093/jmicro/dfae008] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Academic Contribution Register] [Received: 08/16/2023] [Revised: 12/06/2023] [Accepted: 02/07/2024] [Indexed: 03/12/2024]  Open
2
Ishida Y. Atomic-Scale Imaging of Clay Mineral Nanosheets and Their Supramolecular Complexes through Electron Microscopy: A Supramolecular Chemist's Perspective. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2024;40:6065-6076. [PMID: 38484331 DOI: 10.1021/acs.langmuir.3c03779] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Academic Contribution Register] [Indexed: 03/27/2024]
3
Botifoll M, Pinto-Huguet I, Arbiol J. Machine learning in electron microscopy for advanced nanocharacterization: current developments, available tools and future outlook. NANOSCALE HORIZONS 2022;7:1427-1477. [PMID: 36239693 DOI: 10.1039/d2nh00377e] [Citation(s) in RCA: 18] [Impact Index Per Article: 6.0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Academic Contribution Register] [Indexed: 06/16/2023]
4
Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy. Sci Rep 2022;12:13462. [PMID: 35931705 PMCID: PMC9356044 DOI: 10.1038/s41598-022-17360-3] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Academic Contribution Register] [Received: 03/23/2022] [Accepted: 07/25/2022] [Indexed: 11/09/2022]  Open
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