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For: Németh K, Harkay KC, van Veenendaal M, Spentzouris L, White M, Attenkofer K, Srajer G. High-brightness photocathodes through ultrathin surface layers on metals. Phys Rev Lett 2010;104:046801. [PMID: 20366726 DOI: 10.1103/physrevlett.104.046801] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/22/2009] [Indexed: 05/29/2023]
Number Cited by Other Article(s)
1
Qi Y, Pei M, Qi D, Yang Y, Jia T, Zhang S, Sun Z. Realizing Ultrafast Electron Pulse Self-Compression by Femtosecond Pulse Shaping Technique. J Phys Chem Lett 2015;6:3867-72. [PMID: 26722884 DOI: 10.1021/acs.jpclett.5b01305] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 05/14/2023]
2
Kong L, Joly AG, Droubay TC, Hess WP. Quantum efficiency enhancement in CsI/metal photocathodes. Chem Phys Lett 2015. [DOI: 10.1016/j.cplett.2015.01.010] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/24/2022]
3
Karkare S, Boulet L, Cultrera L, Dunham B, Liu X, Schaff W, Bazarov I. Ultrabright and ultrafast III-V semiconductor photocathodes. PHYSICAL REVIEW LETTERS 2014;112:097601. [PMID: 24655275 DOI: 10.1103/physrevlett.112.097601] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/18/2013] [Indexed: 06/03/2023]
4
Droubay TC, Chambers SA, Joly AG, Hess WP, Németh K, Harkay KC, Spentzouris L. Metal-insulator photocathode heterojunction for directed electron emission. PHYSICAL REVIEW LETTERS 2014;112:067601. [PMID: 24580707 DOI: 10.1103/physrevlett.112.067601] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/04/2013] [Indexed: 06/03/2023]
5
Ling S, Watkins MB, Shluger AL. Effects of atomic scale roughness at metal/insulator interfaces on metal work function. Phys Chem Chem Phys 2013;15:19615-24. [DOI: 10.1039/c3cp53590h] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
6
Lichtenstein L, Heyde M, Ulrich S, Nilius N, Freund HJ. Probing the properties of metal-oxide interfaces: silica films on Mo and Ru supports. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2012;24:354010. [PMID: 22899226 DOI: 10.1088/0953-8984/24/35/354010] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
7
Pacchioni G. Two-Dimensional Oxides: Multifunctional Materials for Advanced Technologies. Chemistry 2012;18:10144-58. [DOI: 10.1002/chem.201201117] [Citation(s) in RCA: 77] [Impact Index Per Article: 6.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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