1
|
Khaireh-Walieh A, Langevin D, Bennet P, Teytaud O, Moreau A, Wiecha PR. A newcomer's guide to deep learning for inverse design in nano-photonics. NANOPHOTONICS (BERLIN, GERMANY) 2023; 12:4387-4414. [PMID: 39634708 PMCID: PMC11501815 DOI: 10.1515/nanoph-2023-0527] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 08/17/2023] [Accepted: 11/18/2023] [Indexed: 12/07/2024]
Abstract
Nanophotonic devices manipulate light at sub-wavelength scales, enabling tasks such as light concentration, routing, and filtering. Designing these devices to achieve precise light-matter interactions using structural parameters and materials is a challenging task. Traditionally, solving this problem has relied on computationally expensive, iterative methods. In recent years, deep learning techniques have emerged as promising tools for tackling the inverse design of nanophotonic devices. While several review articles have provided an overview of the progress in this rapidly evolving field, there is a need for a comprehensive tutorial that specifically targets newcomers without prior experience in deep learning. Our goal is to address this gap and provide practical guidance for applying deep learning to individual scientific problems. We introduce the fundamental concepts of deep learning and critically discuss the potential benefits it offers for various inverse design problems in nanophotonics. We present a suggested workflow and detailed, practical design guidelines to help newcomers navigate the challenges they may encounter. By following our guide, newcomers can avoid frustrating roadblocks commonly experienced when venturing into deep learning for the first time. In a second part, we explore different iterative and direct deep learning-based techniques for inverse design, and evaluate their respective advantages and limitations. To enhance understanding and facilitate implementation, we supplement the manuscript with detailed Python notebook examples, illustrating each step of the discussed processes. While our tutorial primarily focuses on researchers in (nano-)photonics, it is also relevant for those working with deep learning in other research domains. We aim at providing a solid starting point to empower researchers to leverage the potential of deep learning in their scientific pursuits.
Collapse
Affiliation(s)
| | - Denis Langevin
- Université Clermont Auvergne, Clermont Auvergne INP, CNRS, Institut Pascal, F-63000Clermont-Ferrand, France
| | - Pauline Bennet
- Université Clermont Auvergne, Clermont Auvergne INP, CNRS, Institut Pascal, F-63000Clermont-Ferrand, France
| | | | - Antoine Moreau
- Université Clermont Auvergne, Clermont Auvergne INP, CNRS, Institut Pascal, F-63000Clermont-Ferrand, France
| | | |
Collapse
|
2
|
Giuste FO, Sequeira R, Keerthipati V, Lais P, Mirzazadeh A, Mohseni A, Zhu Y, Shi W, Marteau B, Zhong Y, Tong L, Das B, Shehata B, Deshpande S, Wang MD. Explainable synthetic image generation to improve risk assessment of rare pediatric heart transplant rejection. J Biomed Inform 2023; 139:104303. [PMID: 36736449 PMCID: PMC10031799 DOI: 10.1016/j.jbi.2023.104303] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/02/2022] [Revised: 12/23/2022] [Accepted: 01/29/2023] [Indexed: 02/05/2023]
Abstract
Expert microscopic analysis of cells obtained from frequent heart biopsies is vital for early detection of pediatric heart transplant rejection to prevent heart failure. Detection of this rare condition is prone to low levels of expert agreement due to the difficulty of identifying subtle rejection signs within biopsy samples. The rarity of pediatric heart transplant rejection also means that very few gold-standard images are available for developing machine learning models. To solve this urgent clinical challenge, we developed a deep learning model to automatically quantify rejection risk within digital images of biopsied tissue using an explainable synthetic data augmentation approach. We developed this explainable AI framework to illustrate how our progressive and inspirational generative adversarial network models distinguish between normal tissue images and those containing cellular rejection signs. To quantify biopsy-level rejection risk, we first detect local rejection features using a binary image classifier trained with expert-annotated and synthetic examples. We converted these local predictions into a biopsy-wide rejection score via an interpretable histogram-based approach. Our model significantly improves upon prior works with the same dataset with an area under the receiver operating curve (AUROC) of 98.84% for the local rejection detection task and 95.56% for the biopsy-rejection prediction task. A biopsy-level sensitivity of 83.33% makes our approach suitable for early screening of biopsies to prioritize expert analysis. Our framework provides a solution to rare medical imaging challenges currently limited by small datasets.
Collapse
Affiliation(s)
- Felipe O Giuste
- Wallace H. Coulter Department of Biomedical Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA.
| | - Ryan Sequeira
- Wallace H. Coulter Department of Biomedical Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA
| | - Vikranth Keerthipati
- Wallace H. Coulter Department of Biomedical Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA
| | - Peter Lais
- Wallace H. Coulter Department of Biomedical Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA
| | - Ali Mirzazadeh
- School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA
| | - Arshawn Mohseni
- Wallace H. Coulter Department of Biomedical Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA
| | - Yuanda Zhu
- School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA
| | - Wenqi Shi
- School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA
| | - Benoit Marteau
- School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA
| | - Yishan Zhong
- School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA
| | - Li Tong
- Wallace H. Coulter Department of Biomedical Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA
| | - Bibhuti Das
- Department of Pediatric Cardiology, University of Mississippi Medical Center, Jackson, 39216, MS, USA
| | - Bahig Shehata
- Department of Pathology, Wayne State University School of Medicine, Detroit, 48201, MI, USA
| | - Shriprasad Deshpande
- Department of Pediatric Cardiology, Children's National Health System, Washington, 20010, DC, USA
| | - May D Wang
- Wallace H. Coulter Department of Biomedical Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA; School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, 30332, GA, USA.
| |
Collapse
|
3
|
Ghodhbani H, Neji M, Razzak I, Alimi AM. You can try without visiting: a comprehensive survey on virtually try-on outfits. MULTIMEDIA TOOLS AND APPLICATIONS 2022; 81:19967-19998. [PMID: 35291716 PMCID: PMC8908950 DOI: 10.1007/s11042-022-12802-6] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 08/08/2021] [Revised: 12/25/2021] [Accepted: 03/01/2022] [Indexed: 06/14/2023]
Abstract
Since the last years and until now, technology has made fast progress for many industries, in particularly, garment industry which aims to follow consumer desires and demands. One of these demands is to fit clothes before purchasing them on-line. Therefore, many research works have been focused on how to develop an intelligent apparel industry to ensure the online shopping experience. Image-based virtual try-on is among the most potential approach of virtual fitting that tries on target clothes into customer's image, therefore, it has received considerable research efforts in the recent years. However, there are several challenges involved in development of virtual try-on that make it difficult to achieve naturally looking virtual outfit such as shape, pose, occlusion, illumination cloth texture, logo and text etc. The aim of this study is to provide a comprehensive and structured overview of extensive research on the advancement of virtual try-on. This review first introduces virtual try-on and its challenges followed by its demand in fashion industry. We summarize state-of-the-art image based virtual try-on for both fashion detection and fashion synthesis as well as their respective advantages, drawbacks, and guidelines for selection of specific try-on model followed by its recent development and successful application. Finally, we conclude the paper with promising directions for future research.
Collapse
Affiliation(s)
- Hajer Ghodhbani
- REsearch Groups in Intelligent Machines (REGIM Lab), University of Sfax, National Engineering School of Sfax (ENIS), BP 1173, 3038 Sfax, Tunisia
| | - Mohamed Neji
- REsearch Groups in Intelligent Machines (REGIM Lab), University of Sfax, National Engineering School of Sfax (ENIS), BP 1173, 3038 Sfax, Tunisia
- National School of Electronics and Telecommunications of Sfax Technopark, BP 1163, CP 3018 Sfax, Tunisia
| | - Imran Razzak
- Advanced Analytics Institute, University of Technology, Sydney, Australia
| | - Adel M. Alimi
- REsearch Groups in Intelligent Machines (REGIM Lab), University of Sfax, National Engineering School of Sfax (ENIS), BP 1173, 3038 Sfax, Tunisia
- Department of Electrical and Electronic Engineering Science, Faculty of Engineering and the Built Environment, University of Johannesburg, Johannesburg, South Africa
| |
Collapse
|