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For: Kitajima H, Hieda K, Suematsu Y. Thickness measurement of ultrathin films on metal substrates using ATR. Appl Opt 1980;19:3106-3109. [PMID: 20234570 DOI: 10.1364/ao.19.003106] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Number Cited by Other Article(s)
1
Next generation covered stents made from nanocomposite materials: A complete assessment of uniformity, integrity and biomechanical properties. NANOMEDICINE-NANOTECHNOLOGY BIOLOGY AND MEDICINE 2015;12:1-12. [PMID: 26238080 DOI: 10.1016/j.nano.2015.07.002] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/03/2015] [Revised: 06/23/2015] [Accepted: 07/05/2015] [Indexed: 11/20/2022]
2
Zhu BS, Owner-Petersen M, Licht T. Accelerometer design based on attenuated total reflection. APPLIED OPTICS 1988;27:2972-2975. [PMID: 20531871 DOI: 10.1364/ao.27.002972] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
3
Kitajima H, Fujita K, Cizmic H. Zero reflection from a dielectric film on metal substrate at oblique angles of incidence. APPLIED OPTICS 1984;23:1937. [PMID: 18212927 DOI: 10.1364/ao.23.001937] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
4
Kitajima H, Hieda K, Suematsu Y. Optimum conditions in the attenuated total reflection technique. APPLIED OPTICS 1981;20:1005-1010. [PMID: 20309249 DOI: 10.1364/ao.20.001005] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
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