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Xu T, Deng B, Zheng K, Li H, Wang Z, Zhong Y, Zhang C, Lévêque G, Grandidier B, Bachelot R, Treguer-Delapierre M, Qi Y, Wang S. Boosting the Performances of Semitransparent Organic Photovoltaics via Synergetic Near-Infrared Light Management. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2024; 36:e2311305. [PMID: 38270280 DOI: 10.1002/adma.202311305] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/27/2023] [Revised: 12/18/2023] [Indexed: 01/26/2024]
Abstract
Semitransparent organic photovoltaics (ST-OPVs) offer promising prospects for application in building-integrated photovoltaic systems and greenhouses, but further improvement of their performance faces a delicate trade-off between the two competing indexes of power conversion efficiency (PCE) and average visible transmittance (AVT). Herein, the authors take advantage of coupling plasmonics with the optical design of ST-OPVs to enhance near-infrared absorption and hence simultaneously improve efficiency and visible transparency to the maximum extent. By integrating core-bishell PdCu@Au@SiO2 nanotripods that act as optically isotropic Lambertian sources with near-infrared-customized localized surface plasmon resonance in an optimal ternary PM6:BTP-eC9:L8-BO-based ST-OPV, it is shown that their interplay with a multilayer optical coupling layer, consisting of ZnS(130 nm)/Na3AlF6(60 nm)/WO3(100 nm)/LaF3(50 nm) identified from high-throughput optical screening, leads to a record-high PCE of 16.14% (certified as 15.90%) along with an excellent AVT of 33.02%. The strong enhancement of the light utilization efficiency by ≈50% as compared to the counterpart device without optical engineering provides an encouraging and universal pathway for promoting breakthroughs in ST-OPVs from meticulous optical design.
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Affiliation(s)
- Tao Xu
- School of Microelectronics and Materials Genome Institute, Shanghai University, Shanghai, 200444, China
| | - Baozhong Deng
- School of Microelectronics and Materials Genome Institute, Shanghai University, Shanghai, 200444, China
| | - Kaiwen Zheng
- School of Microelectronics and Materials Genome Institute, Shanghai University, Shanghai, 200444, China
| | - Hongyu Li
- School of Microelectronics and Materials Genome Institute, Shanghai University, Shanghai, 200444, China
| | - Zihan Wang
- School of Microelectronics and Materials Genome Institute, Shanghai University, Shanghai, 200444, China
| | - Yunbo Zhong
- School of Materials Science and Engineering, Shanghai University, Shanghai, 200444, China
| | - Chengxi Zhang
- School of Science, Jiangsu University of Science and Technology, Zhenjiang, 212100, China
| | - Gaëtan Lévêque
- Univ. Lille, CNRS, Centrale Lille, Univ. Polytechnique Hauts-de-France, Junia-ISEN, UMR 8520 - IEMN, Lille, 59000, France
| | - Bruno Grandidier
- Univ. Lille, CNRS, Centrale Lille, Univ. Polytechnique Hauts-de-France, Junia-ISEN, UMR 8520 - IEMN, Lille, 59000, France
| | - Renaud Bachelot
- Light, nanomaterials, nanotechnologies (L2n), CNRS ERL 7004, University of Technology of Troyes, Troyes, F-10004, France
- EEE School, Nanyang Technological University, CNRS IRL, CINTRA, 3288, Singapore
| | | | - Yabing Qi
- Energy Materials and Surface Sciences Unit (EMSSU), Okinawa Institute of Science and Technology Graduate University (OIST), 1919-1 Tancha, Onna-son, Okinawa, 904-0495, Japan
| | - Shenghao Wang
- School of Microelectronics and Materials Genome Institute, Shanghai University, Shanghai, 200444, China
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Lindner B, Foschum F, Kienle A. Spatially resolved reflectance from turbid media having a rough surface. Part I: simulations. APPLIED OPTICS 2022; 61:8361-8370. [PMID: 36256149 DOI: 10.1364/ao.469985] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/07/2022] [Accepted: 09/01/2022] [Indexed: 06/16/2023]
Abstract
Determining the optical properties of turbid media with spatially resolved reflectance measurements is a well-known method in optical metrology. Typically, the surfaces of the investigated materials are assumed to be perfectly smooth. In most realistic cases, though, the surface has a rough topography and scatters light. In this study, we investigated the influence of the Cook-Torrance surface scattering model and the generalized Harvey-Shack surface scattering model on the spatially resolved reflectance based on Monte Carlo simulations. Besides analyzing the spatially resolved reflectance signal, we focused on the influence of surface scattering on the determination of the reduced scattering coefficients and absorption coefficients of turbid media. Both models led to significant errors in the determination of optical properties when roughness was not accounted for.
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Lindner B, Foschum F, Kienle A. Spatially resolved reflectance from turbid media having a rough surface. Part II: experiments. APPLIED OPTICS 2022; 61:8123-8132. [PMID: 36255935 DOI: 10.1364/ao.469988] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/07/2022] [Accepted: 09/01/2022] [Indexed: 06/16/2023]
Abstract
Spatially resolved reflectance measurements are a standard tool for determining the absorption and scattering properties of turbid media such as biological tissue. However, in literature, it was shown that these measurements are subject to errors when a possible rough surface between the turbid medium and the surrounding is not accounted for. We evaluated these errors by comparing the spatially resolved reflectance measured on rough epoxy-based samples with Monte Carlo simulations using Lambertian surface scattering, the Cook-Torrance model, and the generalized Harvey-Shack model as surface scattering models. To this aim, goniometric measurements on the epoxy-based samples were compared to the angularly resolved reflectance of the three surface models to estimate the corresponding model parameters. Finally, the optical properties of the phantoms were determined using a Monte Carlo model with a smooth surface.
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