Resonant formation of DNA strand breaks by low-energy (3 to 20 eV) electrons

Most of the energy deposited in cells by ionizing radiation is channeled into the production of abundant free secondary electrons with ballistic energies between 1 and 20 electron volts. Here it is shown that reactions of such electrons, even at energies well below ionization thresholds, induce substantial yields of single- and double-strand breaks in DNA, which are caused by rapid decays of transient molecular resonances localized on the DNA's basic components. This finding presents a fundamental challenge to the traditional notion that genotoxic damage by secondary electrons can only occur at energies above the onset of ionization, or upon solvation when they become a slowly reacting chemical species.

Damage induced by 1-30 eV electrons on thymine- and bromouracil-substituted oligonucleotides

The impact of low-energy (1-30 eV) electrons on self-assembled monolayers of heterogeneous oligonucleotides chemisorbed on a gold surface has been investigated by mass spectrometry of desorbed neutral species in an attempt to understand the consequences of secondary electron damage in a short sequence of a DNA single strand. We demonstrate that the most intense observable neutral species (CN, OCN and/or H(2)NCN) desorbed from Cy(6)-Th(3) and Cy(6)-(BrdU)(3) oligos are related to primary fragmentation of the bases induced by electron impact. The dependence of the neutral species desorption on electron energy shows typical signatures of dissociative electron attachment initiated by the formation of shape- and core-excited resonances (i.e. single-electron and two-electron- one-hole transitory anions, respectively). Substitution of dTh by BrdU increases the production of neutral fragments by as much as a factor of about 3 for the entire electron energy range. When the distribution of secondary electrons along radiation tracks in H(2)O is taken into account, we show that the probability for electron damage to heterogeneous oligonucleotides is enhanced by a factor of 2.5-3 for electron energies below 20 eV for both sensitized and unsensitized strands.

Low-energy (5-25 eV) electron damage to homo-oligonucleotides

Radiation-induced damage to homo-oligonucleotides is investigated by electron-stimulated desorption of neutral fragments from chemisorbed organic films. Six and 12 mers of cytidine phosphate (poly dCs) and thymidine phosphate (poly dTs) are chemisorbed from various solutions onto a crystalline gold substrate by a thiol modification at the 3' end and are irradiated under ultra-high vacuum conditions with 5-25 eV electrons. The mass selected neutral desorption yields consist mainly of fragments of the DNA bases, i.e. CN and OCN (and/or H2NCN for poly dCs) from both poly dCs and poly dTs, indicating that the electrons interact specifically via fragmentation of the aromatic ring of either of the bases. Other heavier fragments are also detected such as H3CC-CO from poly dTs. The yields generally possess a threshold near 5 eV and a broad maximum around 12-13 eV incident electron energy. Dissociative electron attachment as well as electronically excited neutral or cation states are believed to be responsible for the various desorption yields. The latter yields are consistently larger for oligos chemisorbed from water and acetone solutions, compared to methanol solution. The invariance of the fragment yield intensities with oligo length suggests that the molecules are likely to adsorb almost parallel to the surface.

Halogen anion formation in 5-halouracil films: X rays compared to subionization electrons

The radiosensitization properties of 5-halouracils (5-FU, 5-BrU and 5-IU), i.e. the enhanced sensitivity of biological media containing these compounds to ionizing radiation, have been studied using surface science methods. We show that soft X rays and near 0 eV electrons both induce dissociation of 5-halouracils into a halogen anion and a uracilyl radical. The yield of anions from 5-FU is much smaller than that from the bromo- and iodo-analogs. We explain the high anion yields in 5-BrU and 5-IU with dissociative electron attachment (DEA) of near 0 eV electrons. The thermodynamic threshold for DEA to 5-FU is near 2 eV and therefore prohibits dissociation by near 0 eV electrons.

Absolute and effective cross-sections for low-energy electron-scattering processes within condensed matter

Within the last two decades, a number of experimental techniques have been developed to measure mean free paths and absolute and effective cross-sections for various processes related to the interaction of low-energy electrons with condensed matter. In all of the experiments, a monochromatic electron beam impinges on a thin multilayer film composed of atoms and/or molecules condensed on a metal or semiconductor substrate held at cryogenic temperatures in an ultra-high-vacuum system. Depending on the apparatus, cross-sections are obtained from low-energy electron transmission (LEET), high-resolution electron energy loss (HREEL), x-ray photoelectron (XPS) spectroscopy, electron-stimulated desorption (ESD) of neutral and ions, or a combination of these techniques. Quasi-elastic and inelastic mean free paths have been extracted from LEET data. This method has also served to generate absolute cross-sections for electron trapping and fragment production from the dissociation of transient molecular anions. In amorphous ice, a complete set of absolute cross-sections for all inelastic losses by 1-20 eV electrons has been obtained from HREEL data. Effective cross-sections for neutral and ionic radical formation were generated by desorption and XPS experiments. These various methods are briefly described in this article, and the corresponding cross-sections in the range 0-20 eV summarized.