Measor P, Kühn S, Lunt EJ, Phillips BS, Hawkins AR, Schmidt H. Hollow-core waveguide characterization by optically induced particle transport.
OPTICS LETTERS 2008;
33:672-4. [PMID:
18382513 PMCID:
PMC2864579 DOI:
10.1364/ol.33.000672]
[Citation(s) in RCA: 7] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/19/2023]
Abstract
We introduce a method for optical characterization of hollow-core optical waveguides. Radiation pressure exerted by the waveguide modes on dielectric microspheres is used to analyze salient properties such as propagation loss and waveguide mode profiles. These quantities were measured for quasi-single-mode and multimode propagation in on-chip liquid-filled hollow-core antiresonant reflecting optical waveguides. Excellent agreement with analytical and numerical models is found, demonstrating that optically induced particle transport provides a simple, inexpensive, and nondestructive alternative to other characterization methods.
Collapse