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Agnese R, Ahmed Z, Anderson AJ, Arrenberg S, Balakishiyeva D, Basu Thakur R, Bauer DA, Billard J, Borgland A, Brandt D, Brink PL, Bruch T, Bunker R, Cabrera B, Caldwell DO, Cerdeno DG, Chagani H, Cooley J, Cornell B, Crewdson CH, Cushman P, Daal M, Dejongh F, do Couto e Silva E, Doughty T, Esteban L, Fallows S, Figueroa-Feliciano E, Filippini J, Fox J, Fritts M, Godfrey GL, Golwala SR, Hall J, Harris RH, Hertel SA, Hofer T, Holmgren D, Hsu L, Huber ME, Jastram A, Kamaev O, Kara B, Kelsey MH, Kennedy A, Kim P, Kiveni M, Koch K, Kos M, Leman SW, Loer B, Lopez Asamar E, Mahapatra R, Mandic V, Martinez C, McCarthy KA, Mirabolfathi N, Moffatt RA, Moore DC, Nadeau P, Nelson RH, Page K, Partridge R, Pepin M, Phipps A, Prasad K, Pyle M, Qiu H, Rau W, Redl P, Reisetter A, Ricci Y, Saab T, Sadoulet B, Sander J, Schneck K, Schnee RW, Scorza S, Serfass B, Shank B, Speller D, Sundqvist KM, Villano AN, Welliver B, Wright DH, Yellin S, Yen JJ, Yoo J, Young BA, Zhang J. Silicon detector dark matter results from the final exposure of CDMS II. Phys Rev Lett 2013;111:251301. [PMID: 24483735 DOI: 10.1103/physrevlett.111.251301] [Citation(s) in RCA: 34] [Impact Index Per Article: 3.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/04/2013] [Revised: 07/27/2013] [Indexed: 06/03/2023] |