Reference Citation Analysis: Find an Article, Find a Category, Find a Journal, Find a Scholar

For: Frabboni S, Matteucci G, Pozzi G, Vanzi M. Electron holographic observations of the electrostatic field associated with thin reverse-biased p-n junctions. Phys Rev Lett 1985;55:2196-2199. [PMID: 10032073 DOI: 10.1103/physrevlett.55.2196] [Citation(s) in RCA: 41] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]

For:	Frabboni S, Matteucci G, Pozzi G, Vanzi M. Electron holographic observations of the electrostatic field associated with thin reverse-biased p-n junctions. Phys Rev Lett 1985;55:2196-2199. [PMID: 10032073 DOI: 10.1103/physrevlett.55.2196] [Citation(s) in RCA: 41] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]

Number	Cited by Other Article(s)
51	Matteucci G, Missiroli G, Pozzi G. Electron interferometry and holography of electrostatic fields: Fundamental and applicative aspects. ACTA ACUST UNITED AC 1988. [DOI: 10.1016/0378-4363(88)90170-2] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/15/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
52	Frabboni S, Matteucci G, Pozzi G. Observation of electrostatic fields by electron holography: The case of reverse-biased p-n junctions. Ultramicroscopy 1987. [DOI: 10.1016/0304-3991(87)90224-5] [Citation(s) in RCA: 70] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/27/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse