Ellis JD, Haitjema H, Jiang X, Joo KN, Leach R. Advances in optical metrology and instrumentation: introduction.
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. A, OPTICS, IMAGE SCIENCE, AND VISION 2020;
37:OMI1-OMI2. [PMID:
32902440 DOI:
10.1364/josaa.405559]
[Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/14/2020] [Indexed: 06/11/2023]
Abstract
Optical measurement and characterization are two of the pillars of metrology. The ability to measure precisely with high dynamic range and accuracy betters our understanding of nature and the universe. In this feature issue, we present a collection of articles that delves into the fundamental techniques used to advance the field.
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