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For: Rosenauer A, Gries K, Müller K, Pretorius A, Schowalter M, Avramescu A, Engl K, Lutgen S. Measurement of specimen thickness and composition in <mml:math altimg="si20.gif" overflow="scroll" xmlns:xocs="http://www.elsevier.com/xml/xocs/dtd" xmlns:xs="http://www.w3.org/2001/XMLSchema" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.elsevier.com/xml/ja/dtd" xmlns:ja="http://www.elsevier.com/xml/ja/dtd" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:tb="http://www.elsevier.com/xml/common/table/dtd" xmlns:sb="http://www.elsevier.com/xml/common/struct-bib/dtd" xmlns:ce="http://www.elsevier.com/xml/common/dtd" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:cals="http://www.elsevier.com/xml/common/cals/dtd"><mml:msub><mml:mrow><mml:mi>Al</mml:mi></mml:mrow><mml:mrow><mml:mi>x</mml:mi></mml:mrow></mml:msub><mml:msub><mml:mrow><mml:mi>Ga</mml:mi></mml:mrow><mml:mrow><mml:mn>1</mml:mn><mml:mo>-</mml:mo><mml:mi>x</mml:mi></mml:mrow></mml:msub><mml:mi mathvariant="normal">N</mml:mi><mml:mo>/</mml:mo><mml:mi>GaN</mml:mi></mml:math> using high-angle annular dark field images. Ultramicroscopy 2009;109:1171-82. [DOI: 10.1016/j.ultramic.2009.05.003] [Citation(s) in RCA: 147] [Impact Index Per Article: 9.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/28/2008] [Revised: 02/06/2009] [Accepted: 05/01/2009] [Indexed: 11/17/2022]
Number Cited by Other Article(s)
101
Blom DA. Multislice frozen phonon high angle annular dark-field image simulation study of Mo–V–Nb–Te–O complex oxidation catalyst “M1”. Ultramicroscopy 2012;112:69-75. [DOI: 10.1016/j.ultramic.2011.09.019] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/25/2011] [Revised: 09/22/2011] [Accepted: 09/24/2011] [Indexed: 11/29/2022]
102
Grillo V, Mueller K, Volz K, Glas F, Grieb T, Rosenauer A. Strain, composition and disorder in ADF imaging of semiconductors. ACTA ACUST UNITED AC 2011. [DOI: 10.1088/1742-6596/326/1/012006] [Citation(s) in RCA: 23] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
103
Grillo V. An advanced study of the response of ADF detector. ACTA ACUST UNITED AC 2011. [DOI: 10.1088/1742-6596/326/1/012036] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
104
Tan H, Turner S, Yücelen E, Verbeeck J, Van Tendeloo G. 2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy. PHYSICAL REVIEW LETTERS 2011;107:107602. [PMID: 21981530 DOI: 10.1103/physrevlett.107.107602] [Citation(s) in RCA: 33] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/15/2011] [Revised: 07/27/2011] [Indexed: 05/31/2023]
105
Composition mapping in InGaN by scanning transmission electron microscopy. Ultramicroscopy 2011;111:1316-27. [DOI: 10.1016/j.ultramic.2011.04.009] [Citation(s) in RCA: 146] [Impact Index Per Article: 11.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/17/2010] [Revised: 04/21/2011] [Accepted: 04/24/2011] [Indexed: 11/22/2022]
106
Findlay SD, Shibata N, Azuma S, Ikuhara Y. Prospects for 3D imaging of dopant atoms in ceramic interfaces. JOURNAL OF ELECTRON MICROSCOPY 2010;59 Suppl 1:S29-S38. [PMID: 20538626 DOI: 10.1093/jmicro/dfq029] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
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