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Citation(s) in RCA

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For: Takeda S. Structure analysis of defects in nanometer space inside a crystal: creation and agglomeration of point defects in Si and Ge revealed by high-resolution electron microscopy. Microsc Res Tech 1998;40:313-35. [PMID: 9523763 DOI: 10.1002/(sici)1097-0029(19980215)40:4<313::aid-jemt6>3.0.co;2-s] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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1
Tatek Y, Stoll S, Pefferkorn E. Internal cohesion of agglomerates. POWDER TECHNOL 2001. [DOI: 10.1016/s0032-5910(00)00345-4] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
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