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Zhang SH, Yang J, Shao DF, Zhu JJ, Yang W, Chang K. Geometric Amplitude Accompanying Local Responses: Spinor Phase Information from the Amplitudes of Spin-Polarized STM Measurements. PHYSICAL REVIEW LETTERS 2024; 133:036204. [PMID: 39094154 DOI: 10.1103/physrevlett.133.036204] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/24/2023] [Revised: 01/30/2024] [Accepted: 06/11/2024] [Indexed: 08/04/2024]
Abstract
Solving the Hamiltonian of a system yields the energy dispersion and eigenstates. The geometric phase of the eigenstates generates many novel effects and potential applications. However, the geometric properties of the energy dispersion go unheeded. Here, we provide geometric insight into energy dispersion and introduce a geometric amplitude, namely, the geometric density of states (GDOS) determined by the Riemann curvature of the constant-energy contour. The geometric amplitude should accompany various local responses, which are generally formulated by the real-space Green's function. Under the stationary phase approximation, the GDOS simplifies the Green's function into its ultimate form. In particular, the amplitude factor embodies the spinor phase information of the eigenstates, favoring the extraction of the spin texture for topological surface states under an in-plane magnetic field through spin-polarized STM measurements. This work opens a new avenue for exploring the geometric properties of electronic structures and excavates the unexplored potential of spin-polarized STM measurements to probe the spinor phase information of eigenstates from their amplitudes.
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2
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Nishioka D, Shingaya Y, Tsuchiya T, Higuchi T, Terabe K. Few- and single-molecule reservoir computing experimentally demonstrated with surface-enhanced Raman scattering and ion gating. SCIENCE ADVANCES 2024; 10:eadk6438. [PMID: 38416821 PMCID: PMC10901377 DOI: 10.1126/sciadv.adk6438] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/02/2023] [Accepted: 01/23/2024] [Indexed: 03/01/2024]
Abstract
Molecule-based reservoir computing (RC) is promising for achieving low power consumption neuromorphic computing, although the information-processing capability of small numbers of molecules is not clear. Here, we report a few- and single-molecule RC that uses the molecular vibration dynamics in the para-mercaptobenzoic acid (pMBA) detected by surface-enhanced Raman scattering (SERS) with tungsten oxide nanorod/silver nanoparticles. The Raman signals of the pMBA molecules, adsorbed at the SERS active site of the nanorod, were reversibly perturbated by the application of voltage-induced local pH changes near the molecules, and then used to perform time-series analysis tasks. Despite the small number of molecules used, our system achieved good performance, including >95% accuracy in various nonlinear waveform transformations, 94.3% accuracy in solving a second-order nonlinear dynamic system, and a prediction error of 25.0 milligrams per deciliter in a 15-minute-ahead blood glucose level prediction. Our work provides a concept of few-molecular computing with practical computation capabilities.
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Affiliation(s)
- Daiki Nishioka
- Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
- Department of Applied Physics, Faculty of Science, Tokyo University of Science, 6-3-1 Niijuku, Katsushika, Tokyo 125-8585, Japan
| | - Yoshitaka Shingaya
- Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
| | - Takashi Tsuchiya
- Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
| | - Tohru Higuchi
- Department of Applied Physics, Faculty of Science, Tokyo University of Science, 6-3-1 Niijuku, Katsushika, Tokyo 125-8585, Japan
| | - Kazuya Terabe
- Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
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3
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Yamada Y, Ichii T, Utsunomiya T, Kimura K, Kobayashi K, Yamada H, Sugimura H. Fundamental and higher eigenmodes of qPlus sensors with a long probe for vertical-lateral bimodal atomic force microscopy. NANOSCALE ADVANCES 2023; 5:840-850. [PMID: 36756504 PMCID: PMC9890686 DOI: 10.1039/d2na00686c] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 10/07/2022] [Accepted: 12/26/2022] [Indexed: 06/18/2023]
Abstract
The detection of vertical and lateral forces at the nanoscale by atomic force microscopy (AFM) reveals various mechanical properties on surfaces. The qPlus sensor is a widely used force sensor, which is built from a quartz tuning fork (QTF) and a sharpened metal probe, capable of high-resolution imaging in viscous liquids such as lubricant oils. Although a simultaneous detection technique of vertical and lateral forces by using a qPlus sensor is required in the field of nanotribology, it has still been difficult because the torsional oscillations of QTFs cannot be detected. In this paper, we propose a method to simultaneously detect vertical and lateral force components by using a qPlus sensor with a long probe. The first three eigenmodes of the qPlus sensor with a long probe are theoretically studied by solving a set of equations of motion for the QTF prong and probe. The calculation results were in good agreement with the experimental results. It was found that the tip oscillates laterally in the second and third modes. Finally, we performed friction anisotropy measurements on a polymer film by using a bimodal AFM utilizing the qPlus sensor with a long probe to confirm the lateral force detection.
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Affiliation(s)
- Yuya Yamada
- Department of Materials Science and Engineering, Kyoto University Yoshida Honmachi, Sakyo Kyoto 606-8501 Japan
| | - Takashi Ichii
- Department of Materials Science and Engineering, Kyoto University Yoshida Honmachi, Sakyo Kyoto 606-8501 Japan
| | - Toru Utsunomiya
- Department of Materials Science and Engineering, Kyoto University Yoshida Honmachi, Sakyo Kyoto 606-8501 Japan
| | - Kuniko Kimura
- Department of Electronic Science and Engineering, Kyoto University Katsura, Nishikyo Kyoto 615-8510 Japan
| | - Kei Kobayashi
- Department of Electronic Science and Engineering, Kyoto University Katsura, Nishikyo Kyoto 615-8510 Japan
| | - Hirofumi Yamada
- Department of Electronic Science and Engineering, Kyoto University Katsura, Nishikyo Kyoto 615-8510 Japan
| | - Hiroyuki Sugimura
- Department of Materials Science and Engineering, Kyoto University Yoshida Honmachi, Sakyo Kyoto 606-8501 Japan
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4
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Shingaya Y, Takaki H, Kobayashi N, Aono M, Nakayama T. Single-molecule detection with enhanced Raman scattering of tungsten oxide nanostructure. NANOSCALE 2022; 14:14552-14557. [PMID: 36149385 DOI: 10.1039/d2nr03596k] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/16/2023]
Abstract
We have found that tungsten oxide nanorods have a very large enhancement effect on Raman scattering. The nanorods with adsorbed 12CO and 13CO at the ratio of 1 : 1 were dispersed on a Si substrate and Raman mapping was performed. The Raman images of 12CO and 13CO were completely different, indicating that a very small number of molecules at the single-molecule level were observed. We also confirmed the characteristic blinking phenomenon when single-molecule detection was performed. The very large enhancement effect of Raman scattering can be attributed to the {001}CS structure of the tungsten oxide nanorods. It was confirmed from the DFT calculation results that the {001}CS structure exhibits two-dimensional electrical conduction properties.
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Affiliation(s)
- Yoshitaka Shingaya
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba 305-0044, Japan.
| | - Hirokazu Takaki
- Faculty of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
| | - Nobuhiko Kobayashi
- Faculty of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
| | - Masakazu Aono
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba 305-0044, Japan.
| | - Tomonobu Nakayama
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba 305-0044, Japan.
- Faculty of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
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5
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Bao L, Huang L, Guo H, Gao HJ. Construction and physical properties of low-dimensional structures for nanoscale electronic devices. Phys Chem Chem Phys 2022; 24:9082-9117. [PMID: 35383791 DOI: 10.1039/d1cp05981e] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Over the past decades, construction of nanoscale electronic devices with novel functionalities based on low-dimensional structures, such as single molecules and two-dimensional (2D) materials, has been rapidly developed. To investigate their intrinsic properties for versatile functionalities of nanoscale electronic devices, it is crucial to precisely control the structures and understand the physical properties of low-dimensional structures at the single atomic level. In this review, we provide a comprehensive overview of the construction of nanoelectronic devices based on single molecules and 2D materials and the investigation of their physical properties. For single molecules, we focus on the construction of single-molecule devices, such as molecular motors and molecular switches, by precisely controlling their self-assembled structures on metal substrates and charge transport properties. For 2D materials, we emphasize their spin-related electrical transport properties for spintronic device applications and the role that interfaces among 2D semiconductors, contact electrodes, and dielectric substrates play in the electrical performance of electronic, optoelectronic, and memory devices. Finally, we discuss the future research direction in this field, where we can expect a scientific breakthrough.
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Affiliation(s)
- Lihong Bao
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing, 100190, P. R. China. .,Songshan Lake Materials Laboratory, Dongguan, Guangdong, 523808, P. R. China
| | - Li Huang
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing, 100190, P. R. China.
| | - Hui Guo
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing, 100190, P. R. China.
| | - Hong-Jun Gao
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing, 100190, P. R. China. .,Songshan Lake Materials Laboratory, Dongguan, Guangdong, 523808, P. R. China
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Leis A, Cherepanov V, Voigtländer B, Tautz FS. Nanoscale tip positioning with a multi-tip scanning tunneling microscope using topography images. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2022; 93:013702. [PMID: 35104957 DOI: 10.1063/5.0073059] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/27/2021] [Accepted: 12/21/2021] [Indexed: 06/14/2023]
Abstract
Multi-tip scanning tunneling microscopy (STM) is a powerful method to perform charge transport measurements at the nanoscale. With four STM tips positioned on the surface of a sample, four-point resistance measurements can be performed in dedicated geometric configurations. Here, we present an alternative to the most often used scanning electron microscope imaging to infer the corresponding tip positions. After the initial coarse positioning is monitored by an optical microscope, STM scanning itself is used to determine the inter-tip distances. A large STM overview scan serves as a reference map. Recognition of the same topographic features in the reference map and in small scale images with the individual tips allows us to identify the tip positions with an accuracy of about 20 nm for a typical tip spacing of ∼1μm. In order to correct for effects such as the non-linearity of the deflection, creep, and hysteresis of the piezoelectric elements of the STM, a careful calibration has to be performed.
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Affiliation(s)
- Arthur Leis
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany
| | - Vasily Cherepanov
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany
| | - Bert Voigtländer
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany
| | - F Stefan Tautz
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany
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7
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Onoda J, Khademi A, Wolkow RA, Pitters J. Ohmic Contact to Two-Dimensional Nanofabricated Silicon Structures with a Two-Probe Scanning Tunneling Microscope. ACS NANO 2021; 15:19377-19386. [PMID: 34780687 DOI: 10.1021/acsnano.1c05777] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
We used multiprobe scanning tunneling microscope (STM) to fabricate and electrically characterize nanostructures on Si surfaces. We overcame resistive contacts by using field evaporation to clean tip apexes in order to create Ohmic contact with the Si surface states on a Si substrate. A two-probe (2P-) STM with Ohmic contact allowed for measurement at very low bias, limiting conduction through space-charge layer and bulk states. The Ohmic 2P-STM measurement clarified the surface conductivity of the Si(111)-(7 × 7) surface. We also confirmed that Ohmic 2P-STM can be replaced with more convenient Ohmic one-probe STM for the conductance measurements on the Si surface. We prepared nanostructures using STM lithography to define electronically isolated two-dimensional (2D) regions with various aspect ratios. Their surface conduction properties are described well by the conventional sheet model, proving the diffusive 2D conduction on the Si surface. Constrictions and breaks in 2D structures were also evaluated. Ohmic 2P-STM will be helpful for the investigation of exploratory atomic-scale circuitry or cutting-edge materials sciences.
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Affiliation(s)
- Jo Onoda
- Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada
| | - Ali Khademi
- Metrology Research Centre, National Research Council of Canada, 1200 Montreal Road, Ottawa, Ontario K1A 0R6, Canada
| | - Robert A Wolkow
- Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada
- Quantum Silicon, Inc., Edmonton Alberta T6G 2M9, Canada
| | - Jason Pitters
- Nanotechnology Research Centre, National Research Council Canada, Edmonton, Alberta T6G 2M9, Canada
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8
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Li P, Shao Y, Xu K, Qiu X. Development of a multi-functional multi-probe atomic force microscope system with optical beam deflection method. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2021; 92:123705. [PMID: 34972423 DOI: 10.1063/5.0069849] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/02/2021] [Accepted: 12/01/2021] [Indexed: 06/14/2023]
Abstract
We developed a multi-probe atomic force microscope (MP-AFM) system with up to four probes and realized various functions such as topography mapping, probing electrical property, and local temperature measurement. Each probe mounted on the corresponding probe scanner was controlled independently, and the system employed the optical beam deflection method to measure the deflection of each cantilever. A high-performance MP-AFM system with a compact optical design and rigid actuators was finally established. We demonstrated AFM high-resolution imaging in air and performed four-probe imaging in parallel and multi-functional characterization with the MP-AFM system.
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Affiliation(s)
- Peng Li
- Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing 100124, People's Republic of China
| | - Yongjian Shao
- School of Information and Control Engineering, Shenyang Jianzhu University, Shenyang 110168, People's Republic of China
| | - Ke Xu
- School of Information and Control Engineering, Shenyang Jianzhu University, Shenyang 110168, People's Republic of China
| | - Xiaohui Qiu
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, People's Republic of China
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9
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Yan J, Ma J, Wang A, Ma R, Wu L, Wu Z, Liu L, Bao L, Huan Q, Gao HJ. A time-shared switching scheme designed for multi-probe scanning tunneling microscope. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2021; 92:103702. [PMID: 34717434 DOI: 10.1063/5.0056634] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/12/2021] [Accepted: 09/11/2021] [Indexed: 06/13/2023]
Abstract
We report the design of a time-shared switching scheme, aiming to realize the manipulation and working modes (imaging mode and transport measurement mode) switching between multiple scanning tunneling microscope (STM) probes one by one with a shared STM control system (STM CS) and an electrical transport characterization system. This scheme comprises three types of switch units, switchable preamplifiers (SWPAs), high voltage amplifiers, and a main control unit. Together with the home-made software kit providing the graphical user interface, this scheme achieves a seamless switching process between different STM probes. Compared with the conventional scheme using multiple independent STM CSs, this scheme possesses more compatibility, flexibility, and expansibility for lower cost. The overall architecture and technique issues are discussed in detail. The performances of the system are demonstrated, including the millimeter scale moving range and atomic scale resolution of a single STM probe, safely approached multiple STM probes beyond the resolution of the optical microscope (1.1 µm), qualified STM imaging, and accurate electrical transport characterization. The combinational technique of imaging and transport characterization is also shown, which is supported by SWPA switches with ultra-high open circuit resistance (909 TΩ). These successful experiments prove the effectiveness and the usefulness of the scheme. In addition, the scheme can be easily upgraded with more different functions and numbers of probe arrays, thus opening a new way to build an extremely integrated and high throughput characterization platform.
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Affiliation(s)
- Jiahao Yan
- Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Jiajun Ma
- Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Aiwei Wang
- Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Ruisong Ma
- Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Liangmei Wu
- Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Zebin Wu
- Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Li Liu
- Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Lihong Bao
- Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Qing Huan
- Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Hong-Jun Gao
- Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
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10
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Diaz-Alvarez A, Higuchi R, Sanz-Leon P, Marcus I, Shingaya Y, Stieg AZ, Gimzewski JK, Kuncic Z, Nakayama T. Emergent dynamics of neuromorphic nanowire networks. Sci Rep 2019; 9:14920. [PMID: 31624325 PMCID: PMC6797708 DOI: 10.1038/s41598-019-51330-6] [Citation(s) in RCA: 36] [Impact Index Per Article: 7.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/03/2019] [Accepted: 09/25/2019] [Indexed: 12/31/2022] Open
Abstract
Neuromorphic networks are formed by random self-assembly of silver nanowires. Silver nanowires are coated with a polymer layer after synthesis in which junctions between two nanowires act as resistive switches, often compared with neurosynapses. We analyze the role of single junction switching in the dynamical properties of the neuromorphic network. Network transitions to a high-conductance state under the application of a voltage bias higher than a threshold value. The stability and permanence of this state is studied by shifting the voltage bias in order to activate or deactivate the network. A model of the electrical network with atomic switches reproduces the relation between individual nanowire junctions switching events with current pathway formation or destruction. This relation is further manifested in changes in 1/f power-law scaling of the spectral distribution of current. The current fluctuations involved in this scaling shift are considered to arise from an essential equilibrium between formation, stochastic-mediated breakdown of individual nanowire-nanowire junctions and the onset of different current pathways that optimize power dissipation. This emergent dynamics shown by polymer-coated Ag nanowire networks places this system in the class of optimal transport networks, from which new fundamental parallels with neural dynamics and natural computing problem-solving can be drawn.
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Affiliation(s)
- Adrian Diaz-Alvarez
- International Center for Material Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan.
| | - Rintaro Higuchi
- International Center for Material Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan
| | - Paula Sanz-Leon
- Sydney Nano Institute and School of Physics, University of Sydney, Sydney, NSW, 2006, Australia
| | - Ido Marcus
- Sydney Nano Institute and School of Physics, University of Sydney, Sydney, NSW, 2006, Australia
| | - Yoshitaka Shingaya
- International Center for Material Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan
| | - Adam Z Stieg
- International Center for Material Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan.,California NanoSystems Institute (CNSI), University of California Los Angeles, 570 Westwood Plaza, Los Angeles, California, 90095, USA
| | - James K Gimzewski
- International Center for Material Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan.,California NanoSystems Institute (CNSI), University of California Los Angeles, 570 Westwood Plaza, Los Angeles, California, 90095, USA.,Department of Chemistry and Biochemistry, University of California Los Angeles, 607 Charles E. Young Drive East, Los Angeles, California, 90095, USA
| | - Zdenka Kuncic
- International Center for Material Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan.,Sydney Nano Institute and School of Physics, University of Sydney, Sydney, NSW, 2006, Australia
| | - Tomonobu Nakayama
- International Center for Material Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan. .,Sydney Nano Institute and School of Physics, University of Sydney, Sydney, NSW, 2006, Australia. .,Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1 Namiki, Tsukuba, Ibaraki, 305-0055, Japan.
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11
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Noninvasive Subcellular Imaging Using Atomic Force Acoustic Microscopy (AFAM). Cells 2019; 8:cells8040314. [PMID: 30959776 PMCID: PMC6523517 DOI: 10.3390/cells8040314] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/05/2019] [Revised: 03/25/2019] [Accepted: 03/27/2019] [Indexed: 12/16/2022] Open
Abstract
We report an imaging approach applying the atomic force acoustic microscopy (AFAM), which has unique potential for nondestructive imaging of cell internal structures. To obtain high spatial resolution images, we optimized the significant imaging parameters, including scanning speeds, feedback configurations and acoustic frequencies of an AFAM system, to increase the amplitude of the acoustic signal and to stabilize the morphological signals. We also combined the acoustic amplitude and phase signals, and generated pseudo-color figures for better illustration of subcellular features such as pseudopodia, membranes and nucleus-like. The subcellular structural image atlas can describe nanoscale details of multiple samples and provide clearer images of the subcellular features compared to other conventional techniques. This study builds a strong basis of transmission AFAM for cell imaging, which can help researchers to clarify the cell structures in diverse biological fields and push the understanding of biology evolution to a new stage.
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12
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Electronic transport in planar atomic-scale structures measured by two-probe scanning tunneling spectroscopy. Nat Commun 2019; 10:1573. [PMID: 30952953 PMCID: PMC6450957 DOI: 10.1038/s41467-019-09315-6] [Citation(s) in RCA: 15] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/20/2018] [Accepted: 02/27/2019] [Indexed: 11/09/2022] Open
Abstract
Miniaturization of electronic circuits into the single-atom level requires novel approaches to characterize transport properties. Due to its unrivaled precision, scanning probe microscopy is regarded as the method of choice for local characterization of atoms and single molecules supported on surfaces. Here we investigate electronic transport along the anisotropic germanium (001) surface with the use of two-probe scanning tunneling spectroscopy and first-principles transport calculations. We introduce a method for the determination of the transconductance in our two-probe experimental setup and demonstrate how it captures energy-resolved information about electronic transport through the unoccupied surface states. The sequential opening of two transport channels within the quasi-one-dimensional Ge dimer rows in the surface gives rise to two distinct resonances in the transconductance spectroscopic signal, consistent with phase-coherence lengths of up to 50 nm and anisotropic electron propagation. Our work paves the way for the electronic transport characterization of quantum circuits engineered on surfaces. Measuring electronic transport at the atomic scale requires atom precise contacts. Here, the authors demonstrate quasi-one-dimensional electronic transport along a single dimer row on a germanium surface using a two probe scanning tunneling microscopy protocol.
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13
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Wang ZH, Yoon CH, Yoshida S, Arashida Y, Takeuchi O, Ohno Y, Shigekawa H. Surface-mediated spin dynamics probed by optical-pump–probe scanning tunneling microscopy. Phys Chem Chem Phys 2019; 21:7256-7260. [DOI: 10.1039/c8cp07786j] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
In current materials science and technologies, surface effects on carrier and spin dynamics in functional materials and devices are of great importance.
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Affiliation(s)
- Zi-Han Wang
- Faculty of Pure and Applied Sciences
- University of Tsukuba
- Tsukuba
- Japan
| | - Cheul-Hyun Yoon
- Faculty of Pure and Applied Sciences
- University of Tsukuba
- Tsukuba
- Japan
| | - Shoji Yoshida
- Faculty of Pure and Applied Sciences
- University of Tsukuba
- Tsukuba
- Japan
| | - Yusuke Arashida
- Faculty of Pure and Applied Sciences
- University of Tsukuba
- Tsukuba
- Japan
| | - Osamu Takeuchi
- Faculty of Pure and Applied Sciences
- University of Tsukuba
- Tsukuba
- Japan
| | - Yuzo Ohno
- Faculty of Pure and Applied Sciences
- University of Tsukuba
- Tsukuba
- Japan
| | - Hidemi Shigekawa
- Faculty of Pure and Applied Sciences
- University of Tsukuba
- Tsukuba
- Japan
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14
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Voigtländer B, Cherepanov V, Korte S, Leis A, Cuma D, Just S, Lüpke F. Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2018; 89:101101. [PMID: 30399776 DOI: 10.1063/1.5042346] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/31/2018] [Accepted: 08/25/2018] [Indexed: 06/08/2023]
Abstract
In scanning tunneling microscopy, we witness in recent years a paradigm shift from "just imaging" to detailed spectroscopic measurements at the nanoscale and multi-tip scanning tunneling microscope (STM) is a technique following this trend. It is capable of performing nanoscale charge transport measurements like a "multimeter at the nanoscale." Distance-dependent four-point measurements, the acquisition of nanoscale potential maps at current carrying nanostructures and surfaces, as well as the acquisition of I - V curves of nanoelectronic devices are examples of the capabilities of the multi-tip STM technique. In this review, we focus on two aspects: How to perform the multi-tip STM measurements and how to analyze the acquired data in order to gain insight into nanoscale charge transport processes for a variety of samples. We further discuss specifics of the electronics for multi-tip STM and the properties of tips for multi-tip STM, and present methods for a tip approach to nanostructures on insulating substrates. We introduce methods on how to extract the conductivity/resistivity for mixed 2D/3D systems from four-point measurements, how to measure the conductivity of 2D sheets, and how to introduce scanning tunneling potentiometry measurements with a multi-tip setup. For the example of multi-tip measurements at freestanding vapor liquid solid grown nanowires, we discuss contact resistances as well as the influence of the presence of the probing tips on the four point measurements.
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Affiliation(s)
- Bert Voigtländer
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich and JARA-Fundamentals of Future Information Technology, 52425 Jülich, Germany
| | - Vasily Cherepanov
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich and JARA-Fundamentals of Future Information Technology, 52425 Jülich, Germany
| | - Stefan Korte
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich and JARA-Fundamentals of Future Information Technology, 52425 Jülich, Germany
| | - Arthur Leis
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich and JARA-Fundamentals of Future Information Technology, 52425 Jülich, Germany
| | - David Cuma
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich and JARA-Fundamentals of Future Information Technology, 52425 Jülich, Germany
| | - Sven Just
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich and JARA-Fundamentals of Future Information Technology, 52425 Jülich, Germany
| | - Felix Lüpke
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich and JARA-Fundamentals of Future Information Technology, 52425 Jülich, Germany
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Ge Y, Xu L, Lu X, Xu J, Liang J, Zhao Y. One Second Formation of Large Area Graphene on a Conical Tip Surface via Direct Transformation of Surface Carbide. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2018; 14:e1801288. [PMID: 29939476 DOI: 10.1002/smll.201801288] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/04/2018] [Revised: 04/28/2018] [Indexed: 06/08/2023]
Abstract
Graphene functionalized nanotips are expected to possess promising potential for various applications based on the outstanding electrical and mechanical properties of graphene. However, current methods, usually requiring a high growth temperature and identical crystal surface to match graphene lattice, are suitable for graphene formation on a flat surface. It remains a big challenge to grow graphene on a nanosized convex surface and fabricate functionalized nanotips with high quality graphene at the apex. In this work, a novel ultrafast annealing method is developed for growing large area graphene on Ni nanotips within 1-2 s. Few layered or multiple layered graphene is presented on the apex or sidewall of the conical tip surface. Direct experimental evidences support that thus-produced graphene is formed via the direct conversion of nickel carbide at the outer surface under the instantaneous high temperature, which is different from the conventional segregation mechanism. This newly developed ultrafast method provides a new route to produce graphene efficiently and economically, promising for both convex surfaces and flat substrates. Moreover, the graphene functionalized nanotips exhibit a great potential for nanoelectrical measurements and conductive scanning probe microscopy (SPM) applications.
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Affiliation(s)
- Yifei Ge
- Department of Chemistry, Capital Normal University, NO.105, North Road, West 3th Ring Road, Beijing, 100048, China
- Chinese Academy of Science Key Laboratory for Biomedical Effects of Nanomaterials and Nanosafety, National Center for Nanoscience and Technology of China, NO.11, Bei yi tiao, Zhong guan cun, Beijing, 100190, China
| | - Lele Xu
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Material Science and Engineering, Huazhong University of Science and Technology (HUST), Wuhan, 430074, China
| | - Xing Lu
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Material Science and Engineering, Huazhong University of Science and Technology (HUST), Wuhan, 430074, China
| | - Jianxun Xu
- Chinese Academy of Science Key Laboratory for Biomedical Effects of Nanomaterials and Nanosafety, National Center for Nanoscience and Technology of China, NO.11, Bei yi tiao, Zhong guan cun, Beijing, 100190, China
| | - Jianbo Liang
- Department of Chemistry, Capital Normal University, NO.105, North Road, West 3th Ring Road, Beijing, 100048, China
| | - Yuliang Zhao
- Chinese Academy of Science Key Laboratory for Biomedical Effects of Nanomaterials and Nanosafety, National Center for Nanoscience and Technology of China, NO.11, Bei yi tiao, Zhong guan cun, Beijing, 100190, China
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16
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Bi Z, Cai W, Wang Y, Shang G. Direct manipulation of metallic nanosheets by shear force microscopy. J Microsc 2018; 271:222-229. [PMID: 29762874 DOI: 10.1111/jmi.12710] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/27/2017] [Revised: 03/28/2018] [Accepted: 04/26/2018] [Indexed: 11/28/2022]
Abstract
Micro/nanomanipulation is a rapidly growing technology and holds promising applications in various fields, including photonic/electronic devices, chemical/biosensors etc. In this work, we present that shear force microscopy (ShFM) can be exploited to manipulate metallic nanosheets besides imaging. The manipulation is realized via controlling the shear force sensor probe position and shear force magnitude based on our homemade ShFM system under an optical microscopy for in situ observation. The main feature of the ShFM system is usage of a piezoelectric bimorph sensor, which has the ability of self-excitation and detection. Moreover, the shear force magnitude as a function of the spring constant of the sensor and setpoint is obtained, which indicates that operation modes can be switched between imaging and manipulation through designing the spring constant before experiment and changing the setpoint during manipulation process, respectively. We believe that this alternative manipulation technique could be used to assemble other nanostructures with different shapes, sizes and compositions for new properties and wider applications.
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Affiliation(s)
- Z Bi
- Department of Applied Physics, Key Laboratory of Micro-Nano Measurement-Manipulation and Physics (Ministry of Education), Beihang University, Beijing, People's Republic of China
| | - W Cai
- Department of Applied Physics, Key Laboratory of Micro-Nano Measurement-Manipulation and Physics (Ministry of Education), Beihang University, Beijing, People's Republic of China
| | - Y Wang
- Department of Applied Physics, Key Laboratory of Micro-Nano Measurement-Manipulation and Physics (Ministry of Education), Beihang University, Beijing, People's Republic of China
| | - G Shang
- Department of Applied Physics, Key Laboratory of Micro-Nano Measurement-Manipulation and Physics (Ministry of Education), Beihang University, Beijing, People's Republic of China
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17
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Li K, Zhang C, Wu Y, Lin W, Zheng X, Zhou Y, Lu S, Kang J. In-plane Anisotropy of Quantum Transport in Artificial Two-dimensional Au Lattices. NANO LETTERS 2018; 18:1724-1732. [PMID: 29433320 DOI: 10.1021/acs.nanolett.7b04783] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
We report an experimental observation and direct control of quantum transport in artificial two-dimensional Au lattices. Combining the advanced techniques of low-temperature deposition and newly developed double-probe scanning tunneling spectroscopy, we display a two-dimensional carrier transport and demonstrate a strong in-plane transport modulation in the two-dimensional Au lattices. In well-ordered Au lattices, we observe the carrier transport behavior manifesting as a band-like feature with an energy gap. Furthermore, controlled structural modification performed by constructing coupled "stadiums" enables a transition of system dynamics in the lattices, which in turn establishes tunable resonant transport throughout a wide energy range. Our findings open the possibility of the construction and transport engineering of artificial lattices by the geometrical arrangement of scatterers and quantum chaotic dynamics.
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Affiliation(s)
- Kongyi Li
- Department of Physics, OSED, Fujian Provincial Key Laboratory of Semiconductors Materials and Applications , Xiamen University , Xiamen 361005 , China
- Department of Applied Physics , Eindhoven University of Technology , P.O. Box 513, 5600 MB Eindhoven , The Netherlands
| | - Chunmiao Zhang
- Department of Physics, OSED, Fujian Provincial Key Laboratory of Semiconductors Materials and Applications , Xiamen University , Xiamen 361005 , China
| | - Yaping Wu
- Department of Physics, OSED, Fujian Provincial Key Laboratory of Semiconductors Materials and Applications , Xiamen University , Xiamen 361005 , China
| | - Wenzhi Lin
- Department of Physics, OSED, Fujian Provincial Key Laboratory of Semiconductors Materials and Applications , Xiamen University , Xiamen 361005 , China
| | - Xuanli Zheng
- Department of Physics, OSED, Fujian Provincial Key Laboratory of Semiconductors Materials and Applications , Xiamen University , Xiamen 361005 , China
| | - Yinghui Zhou
- Department of Physics, OSED, Fujian Provincial Key Laboratory of Semiconductors Materials and Applications , Xiamen University , Xiamen 361005 , China
| | - Shiqiang Lu
- Department of Physics, OSED, Fujian Provincial Key Laboratory of Semiconductors Materials and Applications , Xiamen University , Xiamen 361005 , China
| | - Junyong Kang
- Department of Physics, OSED, Fujian Provincial Key Laboratory of Semiconductors Materials and Applications , Xiamen University , Xiamen 361005 , China
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18
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Kolmer M, Olszowski P, Zuzak R, Godlewski S, Joachim C, Szymonski M. Two-probe STM experiments at the atomic level. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2017; 29:444004. [PMID: 28869213 DOI: 10.1088/1361-648x/aa8a05] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/14/2023]
Abstract
Direct characterization of planar atomic or molecular scale devices and circuits on a supporting surface by multi-probe measurements requires unprecedented stability of single atom contacts and manipulation of scanning probes over large, nanometer scale area with atomic precision. In this work, we describe the full methodology behind atomically defined two-probe scanning tunneling microscopy (STM) experiments performed on a model system: dangling bond dimer wire supported on a hydrogenated germanium (0 0 1) surface. We show that 70 nm long atomic wire can be simultaneously approached by two independent STM scanners with exact probe to probe distance reaching down to 30 nm. This allows direct wire characterization by two-probe I-V characteristics at distances below 50 nm. Our technical results presented in this work open a new area for multi-probe research, which can be now performed with precision so far accessible only by single-probe scanning probe microscopy (SPM) experiments.
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Affiliation(s)
- Marek Kolmer
- Faculty of Physics, Astronomy and Applied Computer Science, Centre for Nanometer-Scale Science and Advanced Materials, NANOSAM, Jagiellonian University, Lojasiewicza 11, 30-348 Krakow, Poland
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19
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Ma R, Huan Q, Wu L, Yan J, Guo W, Zhang YY, Wang S, Bao L, Liu Y, Du S, Pantelides ST, Gao HJ. Direct Four-Probe Measurement of Grain-Boundary Resistivity and Mobility in Millimeter-Sized Graphene. NANO LETTERS 2017; 17:5291-5296. [PMID: 28786680 DOI: 10.1021/acs.nanolett.7b01624] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Grain boundaries (GBs) in polycrystalline graphene scatter charge carriers, which reduces carrier mobility and limits graphene applications in high-speed electronics. Here we report the extraction of the resistivity of GBs and the effect of GBs on carrier mobility by direct four-probe measurements on millimeter-sized graphene bicrystals grown by chemical vapor deposition (CVD). To extract the GB resistivity and carrier mobility from direct four-probe intragrain and intergrain measurements, an electronically equivalent extended 2D GB region is defined based on Ohm's law. Measurements on seven representative GBs find that the maximum resistivities are in the range of several kΩ·μm to more than 100 kΩ·μm. Furthermore, the mobility in these defective regions is reduced to 0.4-5.9‰ of the mobility of single-crystal, pristine graphene. Similarly, the effect of wrinkles on carrier transport can also be derived. The present approach provides a reliable way to directly probe charge-carrier scattering at GBs and can be further applied to evaluate the GB effect of other two-dimensional polycrystalline materials, such as transition-metal dichalcogenides (TMDCs).
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Affiliation(s)
- Ruisong Ma
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences , P.O. Box 603, Beijing 100190, People's Republic of China
- Beijing Key Laboratory for Nanomaterials and Nanodevices , Beijing 100190, People's Republic of China
| | - Qing Huan
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences , P.O. Box 603, Beijing 100190, People's Republic of China
| | - Liangmei Wu
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences , P.O. Box 603, Beijing 100190, People's Republic of China
- Beijing Key Laboratory for Nanomaterials and Nanodevices , Beijing 100190, People's Republic of China
| | - Jiahao Yan
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences , P.O. Box 603, Beijing 100190, People's Republic of China
- Beijing Key Laboratory for Nanomaterials and Nanodevices , Beijing 100190, People's Republic of China
| | - Wei Guo
- School of Chemistry and Chemical Engineering, Huazhong University of Science and Technology , Wuhan 430074, People's Republic of China
| | - Yu-Yang Zhang
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences , P.O. Box 603, Beijing 100190, People's Republic of China
| | - Shuai Wang
- School of Chemistry and Chemical Engineering, Huazhong University of Science and Technology , Wuhan 430074, People's Republic of China
| | - Lihong Bao
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences , P.O. Box 603, Beijing 100190, People's Republic of China
- Beijing Key Laboratory for Nanomaterials and Nanodevices , Beijing 100190, People's Republic of China
| | - Yunqi Liu
- Beijing National Laboratory for Molecular Sciences, Key Laboratory of Organic Solids, Institute of Chemistry, Chinese Academy of Science , Beijing 100190, People's Republic of China
| | - Shixuan Du
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences , P.O. Box 603, Beijing 100190, People's Republic of China
- Beijing Key Laboratory for Nanomaterials and Nanodevices , Beijing 100190, People's Republic of China
| | - Sokrates T Pantelides
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences , P.O. Box 603, Beijing 100190, People's Republic of China
- Department of Physics and Astronomy and Department of Electrical Engineering and Computer Science, Vanderbilt University , Nashville, Tennessee 37235, United States
| | - Hong-Jun Gao
- Institute of Physics & University of Chinese Academy of Sciences, Chinese Academy of Sciences , P.O. Box 603, Beijing 100190, People's Republic of China
- Beijing Key Laboratory for Nanomaterials and Nanodevices , Beijing 100190, People's Republic of China
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20
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Ma R, Huan Q, Wu L, Yan J, Zou Q, Wang A, Bobisch CA, Bao L, Gao HJ. Upgrade of a commercial four-probe scanning tunneling microscopy system. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2017; 88:063704. [PMID: 28668010 DOI: 10.1063/1.4986466] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Upgrade of a commercial ultra-high vacuum four-probe scanning tunneling microscopy system for atomic resolution capability and thermal stability is reported. To improve the mechanical and thermal performance of the system, we introduced extra vibration isolation, magnetic damping, and double thermal shielding, and we redesigned the scanning structure and thermal links. The success of the upgrade is characterized by its atomically resolved imaging, steady cooling down cycles with high efficiency, and standard transport measurement capability. Our design may provide a feasible way for the upgrade of similar commercial systems.
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Affiliation(s)
- Ruisong Ma
- Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Qing Huan
- Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Liangmei Wu
- Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Jiahao Yan
- Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Qiang Zou
- Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Aiwei Wang
- Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | | | - Lihong Bao
- Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
| | - Hong-Jun Gao
- Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
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21
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Klein AE, Janunts N, Schmidt S, Bin Hasan S, Etrich C, Fasold S, Kaiser T, Rockstuhl C, Pertsch T. Dual-SNOM investigations of multimode interference in plasmonic strip waveguides. NANOSCALE 2017; 9:6695-6702. [PMID: 28485426 DOI: 10.1039/c6nr06561a] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
The ability of squeezing and guiding light in nanoscale plasmonic waveguides makes them especially interesting for photonic circuits. In spite of reported realizations of plasmonic waveguides, experimental studies on the content of plasmonic modes and mode-selective excitation methods are rare. We apply here a Dual-SNOM technique, incorporating two aperture scanning near-field optical microscopes, for simultaneous near-field excitation and detection of plasmonic modes in gold strip waveguides. Depending on the waveguide width, either a single waveguide mode or a beating pattern of several modes is observed. The relative excitation strengths of the individual modes in multi-mode waveguides are shown to be controllable by the lateral position of the excitation tip. The excitation coefficients are described by an analytical model and the results are fully corroborated by analytical calculations and full-wave numerical simulations. The Dual-SNOM technique provides a "non-invasive" method of local excitation and detection of photonic modes thus making it a valuable tool for in situ characterization of complex photonic micro- and nanostructures.
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Affiliation(s)
- Angela E Klein
- Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-Universität Jena, Albert-Einstein-Strasse 15, 07745 Jena, Germany.
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22
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Lüpke F, Korte S, Cherepanov V, Voigtländer B. Scanning tunneling potentiometry implemented into a multi-tip setup by software. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2015; 86:123701. [PMID: 26724036 DOI: 10.1063/1.4936079] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
We present a multi-tip scanning tunneling potentiometry technique that can be implemented into existing multi-tip scanning tunneling microscopes without installation of additional hardware. The resulting setup allows flexible in situ contacting of samples under UHV conditions and subsequent measurement of the sample topography and local electric potential with resolution down to Å and μV, respectively. The performance of the potentiometry feedback is demonstrated by thermovoltage measurements on the Ag/Si(111)-(√3×√3)R30° surface by resolving a standing wave pattern. Subsequently, the ability to map the local transport field as a result of a lateral current through the sample surface is shown on Ag/Si(111)-(√3×√3)R30° and Si(111) - (7 × 7) surfaces.
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Affiliation(s)
- F Lüpke
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, D-52425 Jülich, Germany
| | - S Korte
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, D-52425 Jülich, Germany
| | - V Cherepanov
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, D-52425 Jülich, Germany
| | - B Voigtländer
- Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, D-52425 Jülich, Germany
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23
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Nanayakkara SU, van de Lagemaat J, Luther JM. Scanning Probe Characterization of Heterostructured Colloidal Nanomaterials. Chem Rev 2015. [PMID: 26196958 DOI: 10.1021/cr500280t] [Citation(s) in RCA: 27] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/16/2023]
Affiliation(s)
- Sanjini U. Nanayakkara
- National Renewable Energy Laboratory, 15013 Denver
West Parkway, Golden, Colorado 80401, United States
| | - Jao van de Lagemaat
- National Renewable Energy Laboratory, 15013 Denver
West Parkway, Golden, Colorado 80401, United States
| | - Joseph M. Luther
- National Renewable Energy Laboratory, 15013 Denver
West Parkway, Golden, Colorado 80401, United States
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24
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Melcher J, Stirling J, Shaw GA. A simple method for the determination of qPlus sensor spring constants. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2015; 6:1733-42. [PMID: 26425425 PMCID: PMC4578344 DOI: 10.3762/bjnano.6.177] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/06/2015] [Accepted: 07/20/2015] [Indexed: 05/05/2023]
Abstract
qPlus sensors are widely used to measure forces at the atomic scale, however, confidence in these measurements is limited by inconsistent reports of the spring constant of the sensor and complications from finite tip heights. Here we combine a numerical investigation of the force reconstruction with an experimental characterization of the flexural mechanics of the qPlus sensor. Numerical studies reveal significant errors in reconstructed force for tip heights exceeding 400 μm or one sixth of the cantilever length. Experimental results with a calibrated nanoindenter reveal excellent agreement with an Euler-Bernoulli beam model for the sensor. Prior to the attachment of a tip, measured spring constants of 1902 ± 29 N/m are found to be in agreement with theoretical predictions for the geometry and material properties of the sensor once a peaked ridge in the beam cross section is included. We further develop a correction necessary to adjust the spring constant for the size and placement of the tip.
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Affiliation(s)
- John Melcher
- National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
| | - Julian Stirling
- National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
| | - Gordon A Shaw
- National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
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25
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Settnes M, Power SR, Petersen DH, Jauho AP. Theoretical analysis of a dual-probe scanning tunneling microscope setup on graphene. PHYSICAL REVIEW LETTERS 2014; 112:096801. [PMID: 24655267 DOI: 10.1103/physrevlett.112.096801] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/16/2013] [Indexed: 05/14/2023]
Abstract
Experimental advances allow for the inclusion of multiple probes to measure the transport properties of a sample surface. We develop a theory of dual-probe scanning tunneling microscopy using a Green's function formalism, and apply it to graphene. Sampling the local conduction properties at finite length scales yields real space conductance maps which show anisotropy for pristine graphene systems and quantum interference effects in the presence of isolated impurities. Spectral signatures in the Fourier transforms of real space conductance maps include characteristics that can be related to different scattering processes. We compute the conductance maps of graphene systems with different edge geometries or height fluctuations to determine the effects of nonideal graphene samples on dual-probe measurements.
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Affiliation(s)
- Mikkel Settnes
- Center for Nanostructured Graphene (CNG), Department of Micro- and Nanotechnology Engineering, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
| | - Stephen R Power
- Center for Nanostructured Graphene (CNG), Department of Micro- and Nanotechnology Engineering, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
| | - Dirch H Petersen
- Center for Nanostructured Graphene (CNG), Department of Micro- and Nanotechnology Engineering, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
| | - Antti-Pekka Jauho
- Center for Nanostructured Graphene (CNG), Department of Micro- and Nanotechnology Engineering, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
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26
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Fuchiwaki O, Yatsurugi M, Sato T. The basic performance of a miniature omnidirectional 6-legged inchworm robot from cm- to μm-scale precise positioning. ACTA ACUST UNITED AC 2014. [DOI: 10.14723/tmrsj.39.211] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
Affiliation(s)
- Ohmi Fuchiwaki
- Dept. of Mechanical Engineering, Yokohama National University
| | | | - Takashi Sato
- Dept. of Mechanical Engineering, Yokohama National University
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27
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Ariga K, Yamauchi Y, Mori T, Hill JP. 25th anniversary article: what can be done with the Langmuir-Blodgett method? Recent developments and its critical role in materials science. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2013; 25:6477-512. [PMID: 24302266 DOI: 10.1002/adma.201302283] [Citation(s) in RCA: 270] [Impact Index Per Article: 24.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/20/2013] [Indexed: 05/18/2023]
Abstract
The Langmuir-Blodgett (LB) technique is known as an elegant method for fabrication of well-defined layered structures with molecular level precision. Since its discovery the LB method has made an indispensable contribution to surface science, physical chemistry, materials chemistry and nanotechnology. However, recent trends in research might suggest the decline of the LB method as alternate methods for film fabrication such as layer-by-layer (LbL) assembly have emerged. Is LB film technology obsolete? This review is presented in order to challenge this preposterous question. In this review, we summarize recent research on LB and related methods including (i) advanced design for LB films, (ii) LB film as a medium for supramolecular chemistry, (iii) LB technique for nanofabrication and (iv) LB involving advanced nanomaterials. Finally, a comparison between LB and LbL techniques is made. The latter reveals the crucial role played by LB techniques in basic surface science, current advanced material sciences and nanotechnologies.
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Affiliation(s)
- Katsuhiko Ariga
- World Premier International (WPI) Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS) PRESTO & CREST, JST, 1-1 Namiki, Tsukuba, 305-0044, Japan
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28
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Eder F, Kotakoski J, Holzweber K, Mangler C, Skakalova V, Meyer JC. Probing from both sides: reshaping the graphene landscape via face-to-face dual-probe microscopy. NANO LETTERS 2013; 13:1934-1940. [PMID: 23547751 PMCID: PMC3652282 DOI: 10.1021/nl3042799] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/20/2012] [Revised: 03/15/2013] [Indexed: 05/27/2023]
Abstract
In two-dimensional samples, all atoms are at the surface and thereby exposed for probing and manipulation by physical or chemical means from both sides. Here, we show that we can access the same point on both surfaces of a few-layer graphene membrane simultaneously, using a dual-probe scanning tunneling microscopy (STM) setup. At the closest point, the two probes are separated only by the thickness of the graphene membrane. This allows us for the first time to directly measure the deformations induced by one STM probe on a free-standing membrane with an independent second probe. We reveal different regimes of stability of few-layer graphene and show how the STM probes can be used as tools to shape the membrane in a controlled manner. Our work opens new avenues for the study of mechanical and electronic properties of two-dimensional materials.
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