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Liu B, Xiong J, Kan X, Liu S, Yang Z, Wang W, Zhao X, Yu Q, Zhu S, Wu J. External fields effectively switch the spin channels of transition metal-doped β-phase tellurene from first principles. Phys Chem Chem Phys 2024; 26:16883-16890. [PMID: 38833213 DOI: 10.1039/d4cp00482e] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 06/06/2024]
Abstract
Non-volatile magnetic random-access memories have proposed the need for spin channel switching. However, this presents a challenge as each spin channel reacts differently to the external field. Tellurene is a semiconductor with a tunable bandgap, excellent stability, and high carrier concentration, but its lack of magnetic properties has hindered its application in spintronics. In this work, the influence of an external field on transition metal (TM)-doped β-tellurene is systematically analysed from first principles. First, the active-learning moment-tensor-potential (MTP) is used to verify the thermal stability of the V-doped system with the MTP proving to be 900 times faster than the traditional method. Subsequently, under biaxial strain ranging from -2% to 10%, the V-doped system undergoes a gradual transition from a magnetic semiconductor to a spin-gapless semiconductor, and further to a half-metal and magnetic metal. The band structure can be maintained under an electric field. By examining the magnetic anisotropy energy, the lattice changes profoundly impact the electromagnetic properties, particularly with the TMs being sensitive to strain. Moreover, the band structure is reflected in the spin resolution current of the magnetic tunnel junction. This work investigates the response of doped β-Te to external fields, revealing its potential applications in spintronics.
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Affiliation(s)
- Bin Liu
- College of Advanced Interdisciplinary Studies, Nanhu Laser Laboratory, National University of Defense Technology, Changsha 410073, China.
- Hubei Province Key Laboratory of Systems Science in Metallurgical Process, The State Key Laboratory for Refractories and Metallurgy, Collaborative Innovation Center for Advanced Steels, International Research Institute for Steel Technology, Wuhan University of Science and Technology, Wuhan 430081, China.
| | - Jingxian Xiong
- College of Advanced Interdisciplinary Studies, Nanhu Laser Laboratory, National University of Defense Technology, Changsha 410073, China.
| | - Xuefen Kan
- School of Transportation Engineering, Jiangsu Shipping College, Nantong 226010, China
| | - Sheng Liu
- Hubei Province Key Laboratory of Systems Science in Metallurgical Process, The State Key Laboratory for Refractories and Metallurgy, Collaborative Innovation Center for Advanced Steels, International Research Institute for Steel Technology, Wuhan University of Science and Technology, Wuhan 430081, China.
| | - Zixin Yang
- College of Advanced Interdisciplinary Studies, Nanhu Laser Laboratory, National University of Defense Technology, Changsha 410073, China.
| | - Wenjing Wang
- Hubei Province Key Laboratory of Systems Science in Metallurgical Process, The State Key Laboratory for Refractories and Metallurgy, Collaborative Innovation Center for Advanced Steels, International Research Institute for Steel Technology, Wuhan University of Science and Technology, Wuhan 430081, China.
| | - Xinxin Zhao
- i-Lab & Key Laboratory of Nanodevices and Applications & Key Laboratory of Nanophotonic Materials and Devices, Suzhou Institute of Nano-Tech and NanoBionics, Chinese Academy of Sciences, Suzhou 215123, China
| | - Qiang Yu
- College of Advanced Interdisciplinary Studies, Nanhu Laser Laboratory, National University of Defense Technology, Changsha 410073, China.
- i-Lab & Key Laboratory of Nanodevices and Applications & Key Laboratory of Nanophotonic Materials and Devices, Suzhou Institute of Nano-Tech and NanoBionics, Chinese Academy of Sciences, Suzhou 215123, China
| | - Sicong Zhu
- Hubei Province Key Laboratory of Systems Science in Metallurgical Process, The State Key Laboratory for Refractories and Metallurgy, Collaborative Innovation Center for Advanced Steels, International Research Institute for Steel Technology, Wuhan University of Science and Technology, Wuhan 430081, China.
- Department of Mechanical Engineering, National University of Singapore, Singapore 117575, Singapore
| | - Jian Wu
- College of Advanced Interdisciplinary Studies, Nanhu Laser Laboratory, National University of Defense Technology, Changsha 410073, China.
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Li Q, Tan X, Yang Y, Xiong X, Zhang T, Weng Z. Sub-5 nm Gate-Length Monolayer Selenene Transistors. Molecules 2023; 28:5390. [PMID: 37513262 PMCID: PMC10385583 DOI: 10.3390/molecules28145390] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/01/2023] [Revised: 06/26/2023] [Accepted: 07/07/2023] [Indexed: 07/30/2023] Open
Abstract
Two-dimensional (2D) semiconductors are being considered as alternative channel materials as silicon-based field-effect transistors (FETs) have reached their scaling limits. Recently, air-stable 2D selenium nanosheet FETs with a gate length of 5 µm were experimentally produced. In this study, we used an ab initio quantum transport approach to simulate sub-5 nm gate-length double-gate monolayer (ML) selenene FETs. When considering negative-capacitance technology and underlap, we found that 3 nm gate-length p-type ML selenene FETs can meet the 2013 ITRS standards for high-performance applications along the armchair and zigzag directions in the 2028 horizon. Therefore, ML selenene has the potential to be a channel material that can scale Moore's law down to a gate length of 3 nm.
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Affiliation(s)
- Qiang Li
- College of Intelligent Systems Science and Engineering, Hubei Minzu University, Enshi 445000, China
| | - Xingyi Tan
- Department of Physics, Chongqing Three Gorges University, Chongqing 404100, China
| | - Yongming Yang
- College of Intelligent Systems Science and Engineering, Hubei Minzu University, Enshi 445000, China
| | - Xiaoyong Xiong
- College of Intelligent Systems Science and Engineering, Hubei Minzu University, Enshi 445000, China
| | - Teng Zhang
- College of Intelligent Systems Science and Engineering, Hubei Minzu University, Enshi 445000, China
| | - Zhulin Weng
- College of Intelligent Systems Science and Engineering, Hubei Minzu University, Enshi 445000, China
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Hu Y, Song X, Jia D, Su W, Lv X, Li L, Li X, Yan Y, Jiang Y, Xia C. Strong interlayer coupling in p-Te/n-CdSe van der Waals heterojunction for self-powered photodetectors with fast speed and high responsivity. OPTICS EXPRESS 2023; 31:19804-19817. [PMID: 37381388 DOI: 10.1364/oe.489029] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/20/2023] [Accepted: 05/09/2023] [Indexed: 06/30/2023]
Abstract
Self-driven photodetectors, which can detect optical signals without external voltage bias, are highly attractive in the field of low-power wearable electronics and internet of things. However, currently reported self-driven photodetectors based on van der Waals heterojunctions (vdWHs) are generally limited by low responsivity due to poor light absorption and insufficient photogain. Here, we report p-Te/n-CdSe vdWHs utilizing non-layered CdSe nanobelts as efficient light absorption layer and high mobility Te as ultrafast hole transporting layer. Benefiting from strong interlayer coupling, the Te/CdSe vdWHs exhibit stable and excellent self-powered characteristics, including ultrahigh responsivity of 0.94 A W-1, remarkable detectivity of 8.36 × 1012 Jones at optical power density of 1.18 mW cm-2 under illumination of 405 nm laser, fast response speed of 24 µs, large light on/off ratio exceeding 105, as well as broadband photoresponse (405-1064 nm), which surpass most of the reported vdWHs photodetectors. In addition, the devices display superior photovoltaic characteristics under 532 nm illumination, such as large Voc of 0.55 V, and ultrahigh Isc of 2.73 µA. These results demonstrate the construction of 2D/non-layered semiconductor vdWHs with strong interlayer coupling is a promising strategy for high-performance and low-power consumption devices.
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He H, Zhao J, Huang P, Sheng R, Yu Q, He Y, Cheng N. Performance improvement in monolayered SnS 2 double-gate field-effect transistors via point defect engineering. Phys Chem Chem Phys 2022; 24:21094-21104. [PMID: 36018265 DOI: 10.1039/d2cp03427a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Owing to the relatively high carrier mobility and on/off current ratio, monolayered SnS2 has the advantage of suppressing drain-to-source tunneling for short channels, rendering it a promising candidate in field-effect transistor (FET) applications. To extend the scaling limit of the channel length, we propose to rationally modulate the electronic properties of monolayered SnS2 through the customized design of point defects and simulate its performance limit in sub-5 nm double-gate FETs (DGFETs), using density functional theory combined with nonequilibrium Green's function formalism. Among all types of point defects, the Se atom as a substitutional dopant (SeS) can nondegenerately inject electrons into each monolayered (ML) SnS2 2 × 4 × 1 supercell, whereas the Sn vacancy (VSn) defect exhibits an opposite doping effect. By adjusting the lateral Schottky barrier height between electrodes and the channel region, the on-state current (Ion), on/off ratio, delay time, and power-delay product in the formed n-type SeS-doped SnS2 and p-type VSn-doped SnS2 DGFETs with a channel length of 4.5 nm have been remarkably improved, fulfilling the requirements of the International Technology Roadmap for Semiconductors (ITRS) for high-performance applications in the 2028 horizon. Our work unveils the great significance of point defect engineering for applications in ultimately scaled electronics.
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Affiliation(s)
- Haibo He
- College of Material and Textile Engineering, Key Laboratory of Yarn Materials Forming and Composite Processing Technology, Jiaxing University, Jiaxing 314001, Zhejiang, P. R. China.
| | - Jianwei Zhao
- College of Material and Textile Engineering, Key Laboratory of Yarn Materials Forming and Composite Processing Technology, Jiaxing University, Jiaxing 314001, Zhejiang, P. R. China.
| | - Pengru Huang
- School of Material Science & Engineering, Guangxi Key Laboratory of Information Materials and Guangxi Collaborative Innovation Center of Structure and Property for New Energy and Materials, Guilin University of Electronic Technology, Guilin 541004, P. R. China
| | - Rongfei Sheng
- College of Material and Textile Engineering, Key Laboratory of Yarn Materials Forming and Composite Processing Technology, Jiaxing University, Jiaxing 314001, Zhejiang, P. R. China.
| | - Qiaozhen Yu
- College of Material and Textile Engineering, Key Laboratory of Yarn Materials Forming and Composite Processing Technology, Jiaxing University, Jiaxing 314001, Zhejiang, P. R. China.
| | - Yuanyuan He
- College of Material and Textile Engineering, Key Laboratory of Yarn Materials Forming and Composite Processing Technology, Jiaxing University, Jiaxing 314001, Zhejiang, P. R. China.
| | - Na Cheng
- College of Material and Textile Engineering, Key Laboratory of Yarn Materials Forming and Composite Processing Technology, Jiaxing University, Jiaxing 314001, Zhejiang, P. R. China.
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Wu W, Li D, Xu Y, Zeng XC. Two-Dimensional GeC 2 with Tunable Electronic and Carrier Transport Properties and a High Current ON/OFF Ratio. J Phys Chem Lett 2021; 12:11488-11496. [PMID: 34793176 DOI: 10.1021/acs.jpclett.1c03477] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
In this study, we present that 2D tetrahex-GeC2 materials possess novel electronic and carrier transport properties based on density functional theory computations combined with the nonequilibrium Green's function method. We show that under the 4% (-4%) in-plane expansion (compression) along the a-direction (b-direction) of the tetrahex-GeC2 monolayer, the bandgap can be enlarged to a desirable 1.26 eV (1.32 eV), close to that of silicon. The carrier transport properties of both the sub-10 nm tetrahex-GeC2 monolayer and the bilayer show strong anisotropy within the bias from -1 to 1 V. The current ON (a-direction)/OFF (b-direction) ratio amounts to 105 for the tetrahex-GeC2 monolayer. A striking negative differential conductance arises with the maximum Ipeak/Ivalley on the order of 104 under the 4% uniaxial expansion along the b-direction of the tetrahex-GeC2 monolayer. Overall, the 2D tetrahex-GeC2 monolayer and bilayer possess highly tunable electronic and carrier transport properties under uniaxial strain, which can be exploited for potential applications in nanoelectronics.
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Affiliation(s)
- Wenjun Wu
- School of Microelectronics and Control Engineering, Changzhou University, Changzhou 213164, Jiangsu China
| | - Dongze Li
- School of Microelectronics and Control Engineering, Changzhou University, Changzhou 213164, Jiangsu China
| | - Yuehua Xu
- School of Microelectronics and Control Engineering, Changzhou University, Changzhou 213164, Jiangsu China
| | - Xiao Cheng Zeng
- Department of Chemistry, University of Nebraska-Lincoln, Lincoln, Nebraska 68588, United States
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Shi B, Tang H, Song Z, Li J, Xu L, Liu S, Yang J, Sun X, Quhe R, Yang J, Lu J. Phase transition and topological transistors based on monolayer Na 3Bi nanoribbons. NANOSCALE 2021; 13:15048-15057. [PMID: 34533149 DOI: 10.1039/d1nr02221k] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
Recently, a topological-to-trivial insulator quantum-phase transition induced by an electric field has been experimentally reported in monolayer (ML) and bilayer (BL) Na3Bi. A narrow ML/BL Na3Bi nanoribbon is necessary to fabricate a high-performance topological transistor. By using the density functional theory method, we found that wider ML Na3Bi nanoribbons (>7 nm) are topological insulators, featured by insulating bulk states and dissipationless metallic edge states. However, a bandgap is opened for extremely narrow ML Na3Bi nanoribbons (<4 nm) due to the quantum confinement effect, and its size increases with the decrease in width. In the topological insulating ML Na3Bi nanoribbons, a bandgap is opened in the metallic edge states under an external displacement electric field, with strength (∼1.0 V Å-1) much smaller than the reopened displacement electric field in ML Na3Bi (3 V Å-1). An ultrashort ML Na3Bi zigzag nanoribbon topological transistor switched by the electrical field was calculated using first-principles quantum transport simulation. It shows an on/off current/conductance ratio of 4-71 and a large on-state current of 1090 μA μm-1. Therefore, a proof of the concept of topological transistors is presented.
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Affiliation(s)
- Bowen Shi
- State Key Laboratory for Mesoscopic Physics and Department of Physics, Peking University, Beijing 100871, P. R. China.
| | - Hao Tang
- State Key Laboratory for Mesoscopic Physics and Department of Physics, Peking University, Beijing 100871, P. R. China.
| | - Zhigang Song
- Computational Research Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
| | - Jingzhen Li
- State Key Laboratory for Mesoscopic Physics and Department of Physics, Peking University, Beijing 100871, P. R. China.
| | - Lianqiang Xu
- School of Physics and Electronic Information Engineering, Engineering Research Center of Nanostructure and Functional Materials, Ningxia Normal University, Guyuan, Ningxia 756000, P. R. China
| | - Shiqi Liu
- State Key Laboratory for Mesoscopic Physics and Department of Physics, Peking University, Beijing 100871, P. R. China.
| | - Jie Yang
- State Key Laboratory for Mesoscopic Physics and Department of Physics, Peking University, Beijing 100871, P. R. China.
| | - Xiaotian Sun
- College of Chemistry and Chemical Engineering, and Henan Key Laboratory of Function-Oriented Porous Materials, Luoyang Normal University, Luoyang 471934, P. R. China
| | - Ruge Quhe
- State Key Laboratory of Information Photonics and Optical Communications and School of Science, Beijing University of Posts and Telecommunications, Beijing 100876, P. R. China
| | - Jinbo Yang
- State Key Laboratory for Mesoscopic Physics and Department of Physics, Peking University, Beijing 100871, P. R. China.
- Collaborative Innovation Center of Quantum Matter, Beijing 100871, P. R. China
- Beijing Key Laboratory for Magnetoelectric Materials and Devices (BKL-MEMD), Beijing 100871, P. R. China
| | - Jing Lu
- State Key Laboratory for Mesoscopic Physics and Department of Physics, Peking University, Beijing 100871, P. R. China.
- Collaborative Innovation Center of Quantum Matter, Beijing 100871, P. R. China
- Beijing Key Laboratory for Magnetoelectric Materials and Devices (BKL-MEMD), Beijing 100871, P. R. China
- Peking University Yangtze Delta Institute of Optoelectronics, Peking University, Nantong 226010, P. R. China
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