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Number Cited by Other Article(s)
1
Seok S, Park H, Kim J. Analysis of Experimental Biaxial Surface Wrinkling Pattern Based on Direct 3D Numerical Simulation. MICROMACHINES 2024;15:543. [PMID: 38675354 PMCID: PMC11051757 DOI: 10.3390/mi15040543] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/28/2024] [Revised: 04/13/2024] [Accepted: 04/17/2024] [Indexed: 04/28/2024]
2
Seok S. FEM Analysis of Buckled Dielectric Thin-Film Packaging Based on 3D Direct Numerical Simulation. MICROMACHINES 2023;14:1312. [PMID: 37512623 PMCID: PMC10383614 DOI: 10.3390/mi14071312] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/26/2023] [Revised: 06/13/2023] [Accepted: 06/23/2023] [Indexed: 07/30/2023]
3
Seok S, Park H, Coste P, Kim J. Direct Numerical Simulation of Surface Wrinkling for Extraction of Thin Metal Film Material Properties. MICROMACHINES 2023;14:747. [PMID: 37420980 DOI: 10.3390/mi14040747] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/27/2023] [Revised: 03/20/2023] [Accepted: 03/27/2023] [Indexed: 07/09/2023]
4
Nikravesh S, Shen YL. Evolution of Thin-Film Wrinkle Patterns on a Soft Substrate: Direct Simulations and the Effects of the Deformation History. NANOMATERIALS (BASEL, SWITZERLAND) 2022;12:3505. [PMID: 36234633 PMCID: PMC9565707 DOI: 10.3390/nano12193505] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 09/01/2022] [Revised: 10/02/2022] [Accepted: 10/05/2022] [Indexed: 06/16/2023]
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