1
|
Park J, Leem JW, Park M, Kim JO, Ku Z, Chegal W, Kang SW, Kim YL. Heteronanostructured Field-Effect Transistors for Enhancing Entropy and Parameter Space in Electrical Unclonable Primitives. ACS NANO 2024; 18:1041-1053. [PMID: 38117976 PMCID: PMC10786166 DOI: 10.1021/acsnano.3c10308] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/20/2023] [Revised: 12/08/2023] [Accepted: 12/14/2023] [Indexed: 12/22/2023]
Abstract
Hardware security is not a new problem but is ever-growing in consumer and medical domains owing to hyperconnectivity. A physical unclonable function (PUF) offers a promising hardware security solution for cryptographic key generation, identification, and authentication. However, electrical PUFs using nanomaterials or two-dimensional (2D) transition metal dichalcogenides (TMDCs) often have limited entropy and parameter space sources, both of which increase the vulnerability to attacks and act as bottlenecks for practical applications. We report an electrical PUF with enhanced entropy as well as parameter space by incorporating 2D TMDC heteronanostructures into field-effect transistors (FETs). Lateral heteronanostructures of 2D molybdenum disulfide and tungsten disulfide serve as a potent entropy source. The variable feature of FETs is further leveraged to enhance the parameter space that provides multiple challenge-response pairs, which are essential for PUFs. This combination results in stably repeatable yet highly variable FET characteristics as alternative electrical PUFs. Comprehensive PUF performance analyses validate the bit uniformity, reproducibility, uniqueness, randomness, false rates, and encoding capacity. The 2D material heteronanostructure-driven electrical PUFs with strong FET-to-FET variability can potentially be augmented as an immediately deployable and scalable security solution for various hardware devices.
Collapse
Affiliation(s)
- Jaeseo Park
- Advanced
Instrumentation Institute, Korea Research
Institute of Standard & Science, Daejeon 34113, Republic of Korea
- Precision
Measurement, University of Science and Technology, Daejeon 34113, Republic of Korea
| | - Jung Woo Leem
- Weldon
School of Biomedical Engineering, Purdue
University, West Lafayette, Indiana 47907, United States
| | - Minji Park
- Advanced
Instrumentation Institute, Korea Research
Institute of Standard & Science, Daejeon 34113, Republic of Korea
| | - Jun Oh Kim
- Advanced
Instrumentation Institute, Korea Research
Institute of Standard & Science, Daejeon 34113, Republic of Korea
| | - Zahyun Ku
- Materials
and Manufacturing Directorate, Air Force
Research Laboratory, Wright-Patterson
AFB, Ohio 45433, United States
| | - Won Chegal
- Advanced
Instrumentation Institute, Korea Research
Institute of Standard & Science, Daejeon 34113, Republic of Korea
| | - Sang-Woo Kang
- Advanced
Instrumentation Institute, Korea Research
Institute of Standard & Science, Daejeon 34113, Republic of Korea
- Precision
Measurement, University of Science and Technology, Daejeon 34113, Republic of Korea
| | - Young L. Kim
- Weldon
School of Biomedical Engineering, Purdue
University, West Lafayette, Indiana 47907, United States
- Purdue
Quantum Science and Engineering Institute, Purdue University, West Lafayette, Indiana 47907, United States
| |
Collapse
|