New Strategies for e-Beam Characterization of Catalysts

OUP accepted manuscript

We first review the significance of resolution and contrast in electron microscopy and the effect of the electron optics on these two quantities. We then outline the physics of the generation of secondary electrons (SEs) and their transport and emission from the surface of a specimen. Contrast and resolution are discussed for different kinds of SE imaging in scanning electron microscope (SEM) and scanning-transmission microscope instruments, with some emphasis on the observation of individual atoms and atomic columns in a thin specimen. The possibility of achieving atomic resolution from a bulk specimen at SEM energies is also considered.

Transmission electron microscopy and the science of carbon nanomaterials

Carbon is a unique and versatile element that is capable of forming different architectures at nanoscale. The element has become a key component in nanoscience and nanotechnology. Transmission electron microscopy (TEM) acts as "our eyes" enabling us not only to reveal the morphology, but also to provide structural, chemical and electronic information of nanocarbon on the atomic level. In fact, except for fullerene, nearly all types of carbon nanomaterials were discovered by TEM, such as carbon nanotubes, carbon nanocones, and graphene-like nanocarbon. It cannot be imagined what nanoscience and nanotechnology would be without the contributions of TEM. Herein, the "interaction" between TEM and the science of carbon nanomaterials is reviewed and it is demonstrated for some selected examples that TEM provides a dramatic driving force for the development of nanocarbon science.