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For:	Yücel Kurt H, Kurt E, Salamov BG. Fractal processing for an analysis of the quality and resistivity of large semiconductor plates. Cryst Res Technol 2004. [DOI: 10.1002/crat.200410248] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]

Number	Cited by Other Article(s)
1	Yücel Kurt H, Kurt E, Salamov BG. Identification of the dynamics of plasma-induced damage in a CuInSe2 thin film by fractal processing. CRYSTAL RESEARCH AND TECHNOLOGY 2006. [DOI: 10.1002/crat.200510651] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/06/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse

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Cited by Other Article(s)

Yücel Kurt H, Kurt E, Salamov BG. Identification of the dynamics of plasma-induced damage in a CuInSe2 thin film by fractal processing. CRYSTAL RESEARCH AND TECHNOLOGY 2006. [DOI: 10.1002/crat.200510651] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]