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For: Korbutowicz R, Tłaczała M, Kovač J, Irmer G, Srnanek R. Cross-sectional and surface Raman mapping of thick GaN layers. Cryst Res Technol 2008. [DOI: 10.1002/crat.200800245] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
Number Cited by Other Article(s)
1
Lv S, Wang S, Li L, Xie S, Yu J, Zhong Y, Wang G, Liang C, Xu X, Zhang L. Gallium Nitride Based Electrode for High-Temperature Supercapacitors. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2023;10:e2300780. [PMID: 36965081 DOI: 10.1002/advs.202300780] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/07/2023] [Revised: 03/03/2023] [Indexed: 05/27/2023]
2
Szymański T, Wośko M, Paszkiewicz B, Serafińczuk J, Drzik M, Paszkiewicz R. Stress control by micropits density variation in strained AlGaN/GaN/SiN/AlN/Si(111) heterostructures. CRYSTAL RESEARCH AND TECHNOLOGY 2015. [DOI: 10.1002/crat.201500276] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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