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For: Gleichmann R, Breitenstein O, Mohr U. Copper precipitation in long-time processed transistor samples. Cryst Res Technol 1983. [DOI: 10.1002/crat.2170180907] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
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