• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4602591)   Today's Articles (1994)   Subscriber (49368)
For: Hunger HJ, Baumann W, Schulze S. A new method for determining the thickness and composition of thin layers by electron probe microanalysis. Cryst Res Technol 1985. [DOI: 10.1002/crat.2170201102] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
Number Cited by Other Article(s)
1
Measuring the Thickness of Metal Coatings: A Review of the Methods. COATINGS 2020. [DOI: 10.3390/coatings10121211] [Citation(s) in RCA: 27] [Impact Index Per Article: 6.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
2
X-ray Microanalysis of Precious Metal Thin Films: Thickness and Composition Determination. COATINGS 2018. [DOI: 10.3390/coatings8020084] [Citation(s) in RCA: 19] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
3
Baumann W, Weise K, Marx G. Investigation of carbonaceous insulating films by electron beam X-ray microanalysis. Anal Bioanal Chem 1994. [DOI: 10.1007/bf00323240] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/26/2022]
4
Quantitative Analysis of (Y2O3)x (ZrO2)1-x Films on Silicon by EPMA. ACTA ACUST UNITED AC 1992. [DOI: 10.1007/978-3-7091-6679-6_22] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
5
Willich P, Obertop D. Composition and thickness of submicron metal coatings and multilayers on Si determined by EPMA. SURF INTERFACE ANAL 1988. [DOI: 10.1002/sia.740130106] [Citation(s) in RCA: 22] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
PrevPage 1 of 1 1Next
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA