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For: Lyding J, Shen TC, Abeln G, Wang C, Scott P, Tucker J, Avouris PH, Walkup R. Ultrahigh Vacuum Scanning Tunneling Microscope-Based Nanolithography and Selective Chemistry on Silicon Surfaces. Isr J Chem 2013. [DOI: 10.1002/ijch.199600003] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
Number Cited by Other Article(s)
1
Bottomley LA. Scanning Probe Microscopy. Anal Chem 1998. [DOI: 10.1021/a1980011o] [Citation(s) in RCA: 92] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
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