Holmestad R, Birkeland CR, Marthinsen K, Høier R, Zuo JM. Use of quantitative convergent-beam electron diffraction in materials science.
Microsc Res Tech 1999;
46:130-45. [PMID:
10423558 DOI:
10.1002/(sici)1097-0029(19990715)46:2<130::aid-jemt6>3.0.co;2-o]
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Abstract
Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non-centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed.
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