Imaging of surface nanobubbles by atomic force microscopy in liquids: Influence of drive frequency on the characterization of ultrasoft matter

Sink or float? Characterization of shell-stabilized bulk nanobubbles using a resonant mass measurement technique

Nano-sized shell-stabilized gas bubbles have applications in various fields ranging from environmental science to biomedical engineering. A resonant mass measurement (RMM) technique is demonstrated here as a new and only method capable of simultaneously measuring the size and concentration of buoyant and non-buoyant particles in a nanobubble sample used as a next-generation ultrasound contrast agent.

Theory of Single-Impact Atomic Force Spectroscopy in liquids with material contrast

Scanning probe microscopy has enabled nanoscale mapping of mechanical properties in important technological materials, such as tissues, biomaterials, polymers, nanointerfaces of composite materials, to name only a few. To improve and widen the measurement of nanoscale mechanical properties, a number of methods have been proposed to overcome the widely used force-displacement mode, that is inherently slow and limited to a quasi-static regime, mainly using multiple sinusoidal excitations of the sample base or of the cantilever. Here, a different approach is put forward. It exploits the unique capabilities of the wavelet transform analysis to harness the information encoded in a short duration spectroscopy experiment. It is based on an impulsive excitation of the cantilever and a single impact of the tip with the sample. It performs well in highly damped environments, which are often seen as problematic in other standard dynamic methods. Our results are very promising in terms of viscoelastic property discrimination. Their potential is oriented (but not limited) to samples that demand imaging in liquid native environments and also to highly vulnerable samples whose compositional mapping cannot be obtained through standard tapping imaging techniques.

Signal distortion in atomic force microscopy photodetector

The frequency-dependent complex impedance of an atomic force microscope photodetector is measured. The inverse problem is solved obtaining the voltage that would have been collected with a hypothetical, perfectly flat-frequency-response photodetector from the experimentally available voltage. This information is used to study the distortion that the true input signal undergoes as it passes through the photodetector on the way to becoming the experimentally measured output signal. It is found that signals with features of interest shorter than 10 μs render noticeable differences between the true and measured raw voltages and forces. Signals with features shorter than 1 μs produce experimentally measured force curves that deviate substantially from the true force curves. A method is proposed for correcting the measured raw voltage signal.