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Citation(s) in RCA

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For: Feld H, Rading D, Leute A, Benninghoven A. Comparative investigations of the secondary ion emission of metal complexes under MeV and keV ion bombardment. ACTA ACUST UNITED AC 1993. [DOI: 10.1002/oms.1210280805] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Number Cited by Other Article(s)
1
Benninghoven A. Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). ACTA ACUST UNITED AC 1994. [DOI: 10.1002/anie.199410231] [Citation(s) in RCA: 397] [Impact Index Per Article: 13.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
2
Benninghoven A. Chemische Analyse von anorganischen und organischen Oberflächen und von dünnen Schichten mit der statischen Flugzeit-Sekundärionen-Massenspektrometrie (TOF-SIMS). Angew Chem Int Ed Engl 1994. [DOI: 10.1002/ange.19941061004] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
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