An EBSD camera as a tool to characterise in-plane magnetisation vectors on Fe-Si (001) surface

Previous studies have shown that type-II magnetic-domain contrasts are caused by differences in the backscattering yields of magnetic domains of opposite magnetisation. Imaging the magnetic domains when the magnetisation vectors in the opposite-magnetisation domains are perpendicular to the tilt axis of the specimen has been considered difficult, because of the lack of change in the backscattering yields between the domains. An alternative way to obtain the type-II magnetic-domain contrasts is to utilise the difference in the exit angular distribution of the backscattered electrons from different magnetic domains. In this study, it is found that an electron backscatter diffraction (EBSD) camera can be used to obtain the type-II magnetic-domain contrasts caused by the above two mechanisms simultaneously. We verify this by distinguishing all four possible in-plane magnetisation vectors on a Fe-Si (001) surface without a sample rotation, using an EBSD detector as an array of electron detectors. The change in contrast between the magnetic domains, with respect to the location of a virtual electron detector, can provide information on the directions of the magnetisation vectors. A method to suppress the topographic contrast superimposed on the magnetic-domain contrast is also demonstrated.

Magnetic domain structure and crystallographic orientation of electrical steels revealed by a forescatter detector and electron backscatter diffraction

The magnetic properties of non-oriented electrical steels (NOES) are an important factor in determining the efficiency of electric vehicle drivetrains. Due to the highly variable texture of NOES, the relationships between crystal orientation, the magnetic domain structure, and the final magnetic properties are complicated and not fully understood. In this study, a NOES sample was characterized with a method capable of imaging surface magnetic domains using scanning electron microscopy (SEM) with an electron backscatter diffraction (EBSD) system equipped with a forescatter detector. This method used type II magnetic contrast without a specialized SEM setup, and imaged with a resolution limit of approximately 250-300nm. The domain structure of the NOES sample was successfully related to β, which was defined as the angle between the closest magnetic easy axis and the surface of the sample (the RD-TD plane). However, it was shown that if the easy axes were aligned between neighbouring grains with respect to the grain boundary normal, the domain structure could align with an easy axis that was not the closest to the surface, and complex domain structures could be become wider. This structure and width change of complex domain structures has not been previously observed from single crystal or large-grained material studies. The successful application of this method to reveal the influence of surrounding grains can be used to better understand the magnetic properties of NOES.