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For: Glaser E, Götz G, Sobolev N, Wesch W. Investigations of Radiation Damage Production in Ion Implanated Silicon. ACTA ACUST UNITED AC 1982. [DOI: 10.1002/pssa.2210690221] [Citation(s) in RCA: 23] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
Number Cited by Other Article(s)
1
Hedler A, Klaumünzer SL, Wesch W. Amorphous silicon exhibits a glass transition. NATURE MATERIALS 2004;3:804-809. [PMID: 15502833 DOI: 10.1038/nmat1241] [Citation(s) in RCA: 46] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/22/2004] [Accepted: 09/08/2004] [Indexed: 05/24/2023]
2
Ga¨rtner K, Hehl K, Schlotzhauer G. Axial dechanneling. ACTA ACUST UNITED AC 1983. [DOI: 10.1016/0167-5087(83)90361-7] [Citation(s) in RCA: 51] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
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