Reference Citation Analysis: Find an Article, Find a Category, Find a Journal, Find a Scholar

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Number	Cited by Other Article(s)
1	Heydenreich J, Breitenstein O. Characterization of defects in semiconductors by combined application of SEM(EBIC) and SDLTS. J Microsc* 2011. [DOI: 10.1111/j.1365-2818.1986.tb02710.x] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
2	Cathodoluminescence Characterization of Semiconductors. SEM MICROCHARACTERIZATION OF SEMICONDUCTORS 1989. [DOI: 10.1016/b978-0-12-353855-0.50014-2] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/24/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
3	Gleichmann R, Breitenstein O, Mohr U. Copper precipitation in long-time processed transistor samples. CRYSTAL RESEARCH AND TECHNOLOGY 1983. [DOI: 10.1002/crat.2170180907] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
4	Kühne H, Morgenstern T, Kühne C. Temperature profile and homogeneity of the growth rate of CVD Silicon from SiH4-HCl-H2 mixtures. CRYSTAL RESEARCH AND TECHNOLOGY 1982. [DOI: 10.1002/crat.2170170907] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/09/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse