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For: Bok J, Schauer P. Performance of SEM scintillation detector evaluated by modulation transfer function and detective quantum efficiency function. Scanning 2014;36:384-393. [PMID: 24323770 DOI: 10.1002/sca.21130] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/23/2013] [Accepted: 11/10/2013] [Indexed: 06/03/2023]
Number Cited by Other Article(s)
1
Schauer P. Comparison of photon transport efficiency in simple scintillation electron detector configurations for scanning electron microscope. Microsc Res Tech 2022;85:1870-1883. [PMID: 34984755 DOI: 10.1002/jemt.24048] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/21/2021] [Revised: 11/08/2021] [Accepted: 12/19/2021] [Indexed: 11/05/2022]
2
Schauer P, Lalinský O, Kučera M. Overview of S(T)EM electron detectors with garnet scintillators: Some potentials and limits. Microsc Res Tech 2020;84:753-770. [PMID: 33135847 DOI: 10.1002/jemt.23634] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/26/2020] [Revised: 10/14/2020] [Accepted: 10/14/2020] [Indexed: 11/12/2022]
3
Schauer P, Lalinský O, Kučera M. Prospective scintillation electron detectors for S(T)EM based on garnet film scintillators. Microsc Res Tech 2019;82:272-282. [PMID: 30589166 DOI: 10.1002/jemt.23169] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/06/2018] [Revised: 09/25/2018] [Accepted: 10/15/2018] [Indexed: 11/08/2022]
4
Bok J, Lalinský O, Hanuš M, Onderišinová Z, Kelar J, Kučera M. GAGG:ce single crystalline films: New perspective scintillators for electron detection in SEM. Ultramicroscopy 2016;163:1-5. [PMID: 26855204 DOI: 10.1016/j.ultramic.2016.01.003] [Citation(s) in RCA: 16] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/26/2015] [Revised: 01/16/2016] [Accepted: 01/23/2016] [Indexed: 11/16/2022]
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