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Nishinomiya S, Toshin K, Shishido R, Suzuki S. TOF-SIMS imaging of polyester/melamine resin with bismuth cluster ions. SURF INTERFACE ANAL 2016. [DOI: 10.1002/sia.6087] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
Affiliation(s)
- S. Nishinomiya
- Nippon Steel and Sumitomo Metal Corporation; 20-1 Shintomi Futtsu Chiba 293-8511 Japan
| | - K. Toshin
- Nippon Steel and Sumitomo Metal Corporation; 20-1 Shintomi Futtsu Chiba 293-8511 Japan
| | - R. Shishido
- Institute of Multidisciplinary Research for Advanced Materials; Tohoku University; Katahira, Aoba-ku Sendai Miyagi 980-8577 Japan
| | - S. Suzuki
- Institute of Multidisciplinary Research for Advanced Materials; Tohoku University; Katahira, Aoba-ku Sendai Miyagi 980-8577 Japan
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You YW, Chang HY, Lin WC, Kuo CH, Lee SH, Kao WL, Yen GJ, Chang CJ, Liu CP, Huang CC, Liao HY, Shyue JJ. Molecular dynamic-secondary ion mass spectrometry (D-SIMS) ionized by co-sputtering with C60+ and Ar+. RAPID COMMUNICATIONS IN MASS SPECTROMETRY : RCM 2011; 25:2897-2904. [PMID: 21913268 DOI: 10.1002/rcm.5181] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
Dynamic secondary ion mass spectrometry (D-SIMS) analysis of poly(ethylene terephthalate) (PET) and poly(methyl methacrylate) (PMMA) was conducted using a quadrupole mass analyzer with various combinations of continuous C(60)(+) and Ar(+) ion sputtering. Individually, the Ar(+) beam failed to generate fragments above m/z 200, and the C(60)(+) beam generated molecular fragments of m/z ~1000. By combining the two beams, the auxiliary Ar(+) beam, which is proposed to suppress carbon deposition due to C(60)(+) bombardment and/or remove graphitized polymer, the sputtering range of the C(60)(+) beam is extended. Another advantage of this technique is that the high sputtering rate and associated high molecular ion intensity of the C(60)(+) beam generate adequate high-mass fragments that mask the damage from the Ar(+) beam. As a result, fragments at m/z ~900 can be clearly observed. As a depth-profiling tool, the single C(60)(+) beam cannot reach a steady state for either PET or PMMA at high ion fluence, and the intensity of the molecular fragments produced by the beam decreases with increasing C(60)(+) fluence. As a result, the single C(60)(+) beam is suitable for profiling surface layers with limited thickness. With C(60)(+)-Ar(+) co-sputtering, although the initial drop in intensity is more significant than with single C(60)(+) ionization because of the damage introduced by the auxiliary Ar(+), the intensity levels indicate that a more steady-state process can be achieved. In addition, the secondary ion intensity at high fluence is higher with co-sputtering. As a result, the sputtered depth is enhanced with co-sputtering and the technique is suitable for profiling thick layers. Furthermore, co-sputtering yields a smoother surface than single C(60)(+) sputtering.
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Affiliation(s)
- Yun-Wen You
- Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan
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Wehbe N, Houssiau L. Comparative Study of the Usefulness of Low Energy Cs+, Xe+, and O2+ Ions for Depth Profiling Amino-Acid and Sugar Films. Anal Chem 2010; 82:10052-9. [DOI: 10.1021/ac101696c] [Citation(s) in RCA: 14] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/25/2022]
Affiliation(s)
- Nimer Wehbe
- Research Centre in Physics of Matter and Radiation (PMR), University of Namur (FUNDP), 61, rue de Bruxelles, B-5000 Namur, Belgium
| | - Laurent Houssiau
- Research Centre in Physics of Matter and Radiation (PMR), University of Namur (FUNDP), 61, rue de Bruxelles, B-5000 Namur, Belgium
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Mahoney CM. Cluster secondary ion mass spectrometry of polymers and related materials. MASS SPECTROMETRY REVIEWS 2010; 29:247-293. [PMID: 19449334 DOI: 10.1002/mas.20233] [Citation(s) in RCA: 120] [Impact Index Per Article: 8.6] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
Cluster secondary ion mass spectrometry (cluster SIMS) has played a critical role in the characterization of polymeric materials over the last decade, allowing for the ability to obtain spatially resolved surface and in-depth molecular information from many polymer systems. With the advent of new molecular sources such as C(60)(+), Au(3)(+), SF(5)(+), and Bi(3)(+), there are considerable increases in secondary ion signal as compared to more conventional atomic beams (Ar(+), Cs(+), or Ga(+)). In addition, compositional depth profiling in organic and polymeric systems is now feasible, without the rapid signal decay that is typically observed under atomic bombardment. The premise behind the success of cluster SIMS is that compared to atomic beams, polyatomic beams tend to cause surface-localized damage with rapid sputter removal rates, resulting in a system at equilibrium, where the damage created is rapidly removed before it can accumulate. Though this may be partly true, there are actually much more complex chemistries occurring under polyatomic bombardment of organic and polymeric materials, which need to be considered and discussed to better understand and define the important parameters for successful depth profiling. The following presents a review of the current literature on polymer analysis using cluster beams. This review will focus on the surface and in-depth characterization of polymer samples with cluster sources, but will also discuss the characterization of other relevant organic materials, and basic polymer radiation chemistry.
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Affiliation(s)
- Christine M Mahoney
- Chemical Science and Technology Laboratory, Surface and Microanalysis Science Division, National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD 20899-8371, USA.
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Zhu Z, Nachimuthu P, Lea AS. Molecular Depth Profiling of Sucrose Films: A Comparative Study of C60n+ Ions and Traditional Cs+ and O2+ Ions. Anal Chem 2009; 81:8272-9. [DOI: 10.1021/ac900553z] [Citation(s) in RCA: 17] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Affiliation(s)
- Zihua Zhu
- Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, P.O. Box 999, Richland, Washington 99352
| | - Ponnusamy Nachimuthu
- Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, P.O. Box 999, Richland, Washington 99352
| | - Alan S. Lea
- Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, P.O. Box 999, Richland, Washington 99352
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Shard AG, Rafati A, Ogaki R, Lee JLS, Hutton S, Mishra G, Davies MC, Alexander MR. Organic Depth Profiling of a Binary System: the Compositional Effect on Secondary Ion Yield and a Model for Charge Transfer during Secondary Ion Emission. J Phys Chem B 2009; 113:11574-82. [DOI: 10.1021/jp904911n] [Citation(s) in RCA: 17] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/09/2023]
Affiliation(s)
- Alexander G. Shard
- Quality of Life Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW, U.K.; Laboratory of Biophysics and Surface Analysis, School of Pharmacy, University of Nottingham, Nottingham NG7 2RD, U.K.; and Kratos Analytical, Wharfside, Trafford Wharf Road, Manchester M17 1GP, U.K
| | - Ali Rafati
- Quality of Life Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW, U.K.; Laboratory of Biophysics and Surface Analysis, School of Pharmacy, University of Nottingham, Nottingham NG7 2RD, U.K.; and Kratos Analytical, Wharfside, Trafford Wharf Road, Manchester M17 1GP, U.K
| | - Ryosuke Ogaki
- Quality of Life Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW, U.K.; Laboratory of Biophysics and Surface Analysis, School of Pharmacy, University of Nottingham, Nottingham NG7 2RD, U.K.; and Kratos Analytical, Wharfside, Trafford Wharf Road, Manchester M17 1GP, U.K
| | - Joanna L. S. Lee
- Quality of Life Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW, U.K.; Laboratory of Biophysics and Surface Analysis, School of Pharmacy, University of Nottingham, Nottingham NG7 2RD, U.K.; and Kratos Analytical, Wharfside, Trafford Wharf Road, Manchester M17 1GP, U.K
| | - Simon Hutton
- Quality of Life Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW, U.K.; Laboratory of Biophysics and Surface Analysis, School of Pharmacy, University of Nottingham, Nottingham NG7 2RD, U.K.; and Kratos Analytical, Wharfside, Trafford Wharf Road, Manchester M17 1GP, U.K
| | - Gautam Mishra
- Quality of Life Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW, U.K.; Laboratory of Biophysics and Surface Analysis, School of Pharmacy, University of Nottingham, Nottingham NG7 2RD, U.K.; and Kratos Analytical, Wharfside, Trafford Wharf Road, Manchester M17 1GP, U.K
| | - Martyn C. Davies
- Quality of Life Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW, U.K.; Laboratory of Biophysics and Surface Analysis, School of Pharmacy, University of Nottingham, Nottingham NG7 2RD, U.K.; and Kratos Analytical, Wharfside, Trafford Wharf Road, Manchester M17 1GP, U.K
| | - Morgan R. Alexander
- Quality of Life Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW, U.K.; Laboratory of Biophysics and Surface Analysis, School of Pharmacy, University of Nottingham, Nottingham NG7 2RD, U.K.; and Kratos Analytical, Wharfside, Trafford Wharf Road, Manchester M17 1GP, U.K
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Shard AG, Green FM, Brewer PJ, Seah MP, Gilmore IS. Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS. J Phys Chem B 2008; 112:2596-605. [PMID: 18254619 DOI: 10.1021/jp077325n] [Citation(s) in RCA: 117] [Impact Index Per Article: 7.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Abstract
Alternating layers of two different organic materials, Irganox1010 and Irganox3114, have been created using vapor deposition. The layers of Irganox3114 were very thin ( approximately 2.5 nm) in comparison to the layers of Irganox1010 ( approximately 55 or approximately 90 nm) to create an organic equivalent of the inorganic 'delta-layers' commonly employed as reference materials in dynamic secondary ion mass spectrometry. Both materials have identical sputtering yields, and we show that organic delta layers may be used to determine some of the important metrological parameters for cluster ion beam depth profiling. We demonstrate, using a C(60) ion source, that the sputtering yield, S, diminishes with ion dose and that the depth resolution also degrades. By comparison with atomic force microscopy data for films of pure Irganox1010, we show that the degradation in depth resolution is caused by the development of topography. Secondary ion intensities are a well-behaved function of sputtering yield and may be employed to obtain useful analytical information. Fragments characteristic of highly damaged material have intensity proportional to S, and those fragments with minimal molecular rearrangment exhibit intensities proportional to S(2). We demonstrate quantitative analysis of the amount of substance in buried layers of a few nanometer thickness with an accuracy of approximately 10%. Organic delta layers are valuable reference materials for comparing the capabilities of different cluster ion sources and experimental arrangements for the depth profiling of organic materials.
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