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Shen Y, Howard L, Yu XY. Secondary Ion Mass Spectral Imaging of Metals and Alloys. MATERIALS (BASEL, SWITZERLAND) 2024; 17:528. [PMID: 38276468 PMCID: PMC10820874 DOI: 10.3390/ma17020528] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/27/2023] [Revised: 01/18/2024] [Accepted: 01/20/2024] [Indexed: 01/27/2024]
Abstract
Secondary Ion Mass Spectrometry (SIMS) is an outstanding technique for Mass Spectral Imaging (MSI) due to its notable advantages, including high sensitivity, selectivity, and high dynamic range. As a result, SIMS has been employed across many domains of science. In this review, we provide an in-depth overview of the fundamental principles underlying SIMS, followed by an account of the recent development of SIMS instruments. The review encompasses various applications of specific SIMS instruments, notably static SIMS with time-of-flight SIMS (ToF-SIMS) as a widely used platform and dynamic SIMS with Nano SIMS and large geometry SIMS as successful instruments. We particularly focus on SIMS utility in microanalysis and imaging of metals and alloys as materials of interest. Additionally, we discuss the challenges in big SIMS data analysis and give examples of machine leaning (ML) and Artificial Intelligence (AI) for effective MSI data analysis. Finally, we recommend the outlook of SIMS development. It is anticipated that in situ and operando SIMS has the potential to significantly enhance the investigation of metals and alloys by enabling real-time examinations of material surfaces and interfaces during dynamic transformations.
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Affiliation(s)
- Yanjie Shen
- College of Biology and Oceanography, Weifang University, 5147 Dongfeng East Street, Weifang 261061, China
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA
| | - Logan Howard
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA
- The Bredesen Center, 310 Ferris Hall, 1508 Middle Drive, Knoxville, TN 37996, USA
| | - Xiao-Ying Yu
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA
- The Bredesen Center, 310 Ferris Hall, 1508 Middle Drive, Knoxville, TN 37996, USA
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Astley S, Hu D, Hazeldine K, Ash J, Cross RE, Cooil S, Allen MW, Evans J, James K, Venturini F, Grinter DC, Ferrer P, Arrigo R, Held G, Williams GT, Evans DA. Identifying chemical and physical changes in wide-gap semiconductors using real-time and near ambient-pressure XPS. Faraday Discuss 2022; 236:191-204. [PMID: 35510538 DOI: 10.1039/d1fd00119a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Photoelectron spectroscopy is a powerful characterisation tool for semiconductor surfaces and interfaces, providing in principle a correlation between the electronic band structure and surface chemistry along with quantitative parameters such as the electron affinity, interface potential, band bending and band offsets. However, measurements are often limited to ultrahigh vacuum and only the top few atomic layers are probed. The technique is seldom applied as an in situ probe of surface processing; information is usually provided before and after processing in a separate environment, leading to a reduction in reproducibility. Advances in instrumentation, in particular electron detection has enabled these limitations to be addressed, for example allowing measurement at near-ambient pressures and the in situ, real-time monitoring of surface processing and interface formation. A further limitation is the influence of the measurement method through irreversible chemical effects such as radiation damage during X-ray exposure and reversible physical effects such as the charging of low conductivity materials. For wide-gap semiconductors such as oxides and carbon-based materials, these effects can be compounded and severe. Here we show how real-time and near-ambient pressure photoelectron spectroscopy can be applied to identify and quantify these effects, using a gold alloy, gallium oxide and semiconducting diamond as examples. A small binding energy change due to thermal expansion is followed in real-time for the alloy while the two semiconductors show larger temperature-induced changes in binding energy that, although superficially similar, are identified as having different and multiple origins, related to surface oxygen bonding, surface band-bending and a room-temperature surface photovoltage. The latter affects the p-type diamond at temperatures up to 400 °C when exposed to X-ray, UV and synchrotron radiation and under UHV and 1 mbar of O2. Real-time monitoring and near-ambient pressure measurement with different excitation sources has been used to identify the mechanisms behind the observed changes in spectral parameters that are different for each of the three materials. Corrected binding energy values aid the completion of the energy band diagrams for these wide-gap semiconductors and provide protocols for surface processing to engineer key surface and interface parameters.
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Affiliation(s)
- Simon Astley
- Department of Physics, Aberystwyth University, Aberystwyth SY23 3BZ, UK.
| | - Di Hu
- Department of Physics, Aberystwyth University, Aberystwyth SY23 3BZ, UK.
| | - Kerry Hazeldine
- Department of Physics, Aberystwyth University, Aberystwyth SY23 3BZ, UK.
| | - Johnathan Ash
- Department of Physics, Aberystwyth University, Aberystwyth SY23 3BZ, UK.
| | - Rachel E Cross
- Department of Physics, Aberystwyth University, Aberystwyth SY23 3BZ, UK.
| | - Simon Cooil
- Department of Physics, Aberystwyth University, Aberystwyth SY23 3BZ, UK. .,Centre for Materials Science and Nanotechnology, University of Oslo, Oslo, 0318, Norway
| | - Martin W Allen
- Department of Electrical and Computer Engineering, University of Canterbury, Christchurch 8014, New Zealand
| | - James Evans
- Diamond Centre Wales Ltd, Talbot Green, RCT, CF72 9FG, UK
| | - Kelvin James
- Diamond Centre Wales Ltd, Talbot Green, RCT, CF72 9FG, UK
| | - Federica Venturini
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE, UK
| | - David C Grinter
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE, UK
| | - Pilar Ferrer
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE, UK
| | - Rosa Arrigo
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE, UK
| | - Georg Held
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE, UK
| | | | - D Andrew Evans
- Department of Physics, Aberystwyth University, Aberystwyth SY23 3BZ, UK.
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Wang T, Xu Y, Li Y, Xin L, Liu B, Jiang F, Liu X. Sodium-Mediated Bimetallic Fe–Ni Catalyst Boosts Stable and Selective Production of Light Aromatics over HZSM-5 Zeolite. ACS Catal 2021. [DOI: 10.1021/acscatal.1c00169] [Citation(s) in RCA: 24] [Impact Index Per Article: 8.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/18/2022]
Affiliation(s)
- Ting Wang
- Department of Chemical Engineering, School of Chemical and Material Engineering, Jiangnan University, 214122 Wuxi, Jiangsu, P.R. China
| | - Yuebing Xu
- Department of Chemical Engineering, School of Chemical and Material Engineering, Jiangnan University, 214122 Wuxi, Jiangsu, P.R. China
| | - Yufeng Li
- Department of Chemical Engineering, School of Chemical and Material Engineering, Jiangnan University, 214122 Wuxi, Jiangsu, P.R. China
| | - Lei Xin
- Department of Chemical Engineering, School of Chemical and Material Engineering, Jiangnan University, 214122 Wuxi, Jiangsu, P.R. China
| | - Bing Liu
- Department of Chemical Engineering, School of Chemical and Material Engineering, Jiangnan University, 214122 Wuxi, Jiangsu, P.R. China
| | - Feng Jiang
- Department of Chemical Engineering, School of Chemical and Material Engineering, Jiangnan University, 214122 Wuxi, Jiangsu, P.R. China
| | - Xiaohao Liu
- Department of Chemical Engineering, School of Chemical and Material Engineering, Jiangnan University, 214122 Wuxi, Jiangsu, P.R. China
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Kang N, Joong Kim K, Seog Kim J, Hae Lee J. Roles of chemical metrology in electronics industry and associated environment in Korea: a tutorial. Talanta 2014; 134:284-291. [PMID: 25618669 DOI: 10.1016/j.talanta.2014.11.030] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/10/2014] [Revised: 11/14/2014] [Accepted: 11/15/2014] [Indexed: 11/25/2022]
Abstract
Chemical metrology is gaining importance in electronics industry that manufactures semiconductors, electronic displays, and microelectronics. Extensive and growing needs from this industry have raised the significance of accurate measurements of the amount of substances and material properties. For the first time, this paper presents information on how chemical metrology is being applied to meet a variety of needs in the aspects of quality control of electronics products and environmental regulations closely associated with electronics industry. For a better understanding of the roles of the chemical metrology within electronics industry, the recent research activities and results in chemical metrology are presented using typical examples in Korea where electronic industry is leading a national economy. Particular attention is paid to the applications of chemical metrology for advancing emerging electronics technology developments. Such examples are a novel technique for the accurate quantification of gas composition at nano-liter levels within a MEMS package, the surface chemical analysis of a semiconductor device. Typical metrological tools are also presented for the development of certified reference materials for fluorinated greenhouse gases and proficiency testing schemes for heavy metals and chlorinated toxic gas in order to cope properly with environmental issues within electronics industry. In addition, a recent technique is presented for the accurate measurement of the destruction and removal efficiency of a typical greenhouse gas scrubber.
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Affiliation(s)
- Namgoo Kang
- Center for Gas Analysis, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-Gu, Daejeon 305-340, Republic of Korea.
| | - Kyung Joong Kim
- Center for New Functional Materials, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-Gu, Daejeon 305-340, Republic of Korea
| | - Jin Seog Kim
- Center for Gas Analysis, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-Gu, Daejeon 305-340, Republic of Korea
| | - Joung Hae Lee
- Center for Inorganic Analysis, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-Gu, Daejeon 305-340, Republic of Korea
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Safronov AP, Kurlyandskaya GV, Chlenova AA, Kuznetsov MV, Bazhin DN, Beketov IV, Sanchez-Ilarduya MB, Martinez-Amesti A. Carbon deposition from aromatic solvents onto active intact 3d metal surface at ambient conditions. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2014; 30:3243-3253. [PMID: 24593324 DOI: 10.1021/la4049709] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
The process of carbon deposition onto 3d metal surface immersed in aromatic solvents (benzene, toluene, xylene) at ambient conditions was studied for as-prepared magnetic nanoparticles (MNPs) and Fe-based films by thermal analysis, mass spectrometry, X-ray diffraction, X-ray photoelectron spectroscopy, Raman spectroscopy, electron microscopy, and energy-dispersive X-ray spectroscopy. The mechanism of the deposition at the interface is likely the heterogeneous Scholl oxidation of the aromatic hydrocarbons, which is the cationic polymerization of the aryl rings. It results in the formation of polycyclic aromatic hydrocarbons (PAH) chemically bonded to the surface of a MNP or thin metallic film. The benzene rings in the polycyclic deposit do not maintain planar aligned structures and do not provide delocalization of the π-electrons in the zone structure. Contrary to the dense graphite layers, the polycyclic layers, although chemically bonded, are not attached tightly to the surface. Such "hairlike" structure of the carboneous deposit might be especially favorable for the applications that imply the enhanced interaction at the surfaces incorporated in the functional matrices (polymeric composites or biosensors). The aromatic chemical nature of the deposit provides strong interaction with most polymers, while its loose structure favors conformational mobility of macromolecular chains at the interface.
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Affiliation(s)
- A P Safronov
- Ural Federal University , Ekaterinburg 620002, Russia
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Hodoroaba VD, Kim KJ, Unger WES. Energy dispersive electron probe microanalysis (ED-EPMA) of elemental composition and thickness of Fe-Ni alloy films. SURF INTERFACE ANAL 2012. [DOI: 10.1002/sia.4975] [Citation(s) in RCA: 22] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
Affiliation(s)
- Vasile-Dan Hodoroaba
- BAM Federal Institute for Materials Research and Testing; D-12200 Berlin Germany
| | - Kyung Joong Kim
- Korea Research Institute of Standards and Science (KRISS); 1 Doryong Yuseong Daejeon 305-600 Korea
| | - Wolfgang E. S. Unger
- BAM Federal Institute for Materials Research and Testing; D-12200 Berlin Germany
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Lim WC, Lee J, Won S, Lee Y. Characterization of Cu(InGa)Se2 (CIGS) thin films in solar cell devices. SURF INTERFACE ANAL 2012. [DOI: 10.1002/sia.4820] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
Affiliation(s)
- Weon Cheol Lim
- Advanced Analysis Center; Korea Institute of Science and Technology; Seoul; 136-791; Korea
| | | | - Sungok Won
- Advanced Analysis Center; Korea Institute of Science and Technology; Seoul; 136-791; Korea
| | - Yeonhee Lee
- Advanced Analysis Center; Korea Institute of Science and Technology; Seoul; 136-791; Korea
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Inter-laboratory comparison: Quantitative surface analysis of thin Fe-Ni alloy films. SURF INTERFACE ANAL 2011. [DOI: 10.1002/sia.3795] [Citation(s) in RCA: 25] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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