The role of molecular weight on the ToF-SIMS spectra of PMMA using Au + and C 60+ primary ions: Role of molecular weight on ToF-SIMS spectra

Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging

RATIONALE

Microscope mode imaging for secondary ion mass spectrometry is a technique with the promise of simultaneous high spatial resolution and high-speed imaging of biomolecules from complex surfaces. Technological developments such as new position-sensitive detectors, in combination with polyatomic primary ion sources, are required to exploit the full potential of microscope mode mass spectrometry imaging, i.e. to efficiently push the limits of ultra-high spatial resolution, sample throughput and sensitivity.

METHODS

In this work, a C60 primary source was combined with a commercial mass microscope for microscope mode secondary ion mass spectrometry imaging. The detector setup is a pixelated detector from the Medipix/Timepix family with high-voltage post-acceleration capabilities. The system's mass spectral and imaging performance is tested with various benchmark samples and thin tissue sections.

RESULTS

The high secondary ion yield (with respect to 'traditional' monatomic primary ion sources) of the C60 primary ion source and the increased sensitivity of the high voltage detector setup improve microscope mode secondary ion mass spectrometry imaging. The analysis time and the signal-to-noise ratio are improved compared with other microscope mode imaging systems, all at high spatial resolution.

CONCLUSIONS

We have demonstrated the unique capabilities of a C60 ion microscope with a Timepix detector for high spatial resolution microscope mode secondary ion mass spectrometry imaging.

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

In-vacuum active pixel detectors enable high sensitivity, highly parallel time- and space-resolved detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined with a secondary ion mass spectrometer for microscope mode secondary ion mass spectrometry (SIMS) imaging. Time resolved images from various benchmark samples demonstrate the imaging capabilities of the detector system. The main advantages of the active pixel detector are the higher signal-to-noise ratio and parallel acquisition of arrival time and position. Microscope mode SIMS imaging of biomolecules is demonstrated from tissue sections with the Timepix detector.

Molecular dynamic-secondary ion mass spectrometry (D-SIMS) ionized by co-sputtering with C60+ and Ar+

Dynamic secondary ion mass spectrometry (D-SIMS) analysis of poly(ethylene terephthalate) (PET) and poly(methyl methacrylate) (PMMA) was conducted using a quadrupole mass analyzer with various combinations of continuous C(60)(+) and Ar(+) ion sputtering. Individually, the Ar(+) beam failed to generate fragments above m/z 200, and the C(60)(+) beam generated molecular fragments of m/z ~1000. By combining the two beams, the auxiliary Ar(+) beam, which is proposed to suppress carbon deposition due to C(60)(+) bombardment and/or remove graphitized polymer, the sputtering range of the C(60)(+) beam is extended. Another advantage of this technique is that the high sputtering rate and associated high molecular ion intensity of the C(60)(+) beam generate adequate high-mass fragments that mask the damage from the Ar(+) beam. As a result, fragments at m/z ~900 can be clearly observed. As a depth-profiling tool, the single C(60)(+) beam cannot reach a steady state for either PET or PMMA at high ion fluence, and the intensity of the molecular fragments produced by the beam decreases with increasing C(60)(+) fluence. As a result, the single C(60)(+) beam is suitable for profiling surface layers with limited thickness. With C(60)(+)-Ar(+) co-sputtering, although the initial drop in intensity is more significant than with single C(60)(+) ionization because of the damage introduced by the auxiliary Ar(+), the intensity levels indicate that a more steady-state process can be achieved. In addition, the secondary ion intensity at high fluence is higher with co-sputtering. As a result, the sputtered depth is enhanced with co-sputtering and the technique is suitable for profiling thick layers. Furthermore, co-sputtering yields a smoother surface than single C(60)(+) sputtering.

Impact ionisation spectra from hypervelocity impacts using aliphatic poly(methyl methacrylate) microparticle projectiles

We report impact ionisation spectra from spherical poly(methyl methacrylate) (PMMA) microparticles of 724 nm diameter impacting a rhodium target. These projectiles were coated with an ultrathin (~11 nm) overlayer of polypyrrole, an electrically conducting organic polymer; this enabled the accumulation of sufficient surface charge to allow electrostatic acceleration up to speeds of 4 to 8 km s(-1) using a high-voltage Van de Graaff instrument. A grid above the target (held at 3.33 kV cm(-1) with respect to the target) accelerated the cations that were generated during the hypervelocity impacts, and these ions then drifted to a charge detector. By measuring the collected charge vs. time and assuming only single ionisation events, time-of-flight mass spectra were obtained. Strong signals were observed for cationic species with ions of m/z 41, 65 and 115. There were also minor contributions from cations with masses ranging from m/z 29 to 142. The three major signals are assigned to fragment ions (C(3)H(5)(+), C(4)H(5)O(+)/C(5)H(9)(+) and C(6)H(11)O(2)(+)) which are known to be associated with the decomposition of PMMA. These impact ionisation spectra differ significantly from those reported earlier using polystyrene (PS) microparticles. The aliphatic PMMA microparticles generate small (m/z <100) fragment ions more readily at lower speeds than the predominantly aromatic PS microparticles, where speeds of at least 10 km s(-1) are typically required for substantial yields of low-mass fragment ions. This correlates well with the well-known greater chemical and thermal fragility of PMMA compared to PS. The PMMA microparticles should prove useful synthetic mimics for aliphatic carbonaceous micrometeorites.