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For: Kudriavtsev Y, Hernández A, Asomoza R, Korol V. Time-of-flight mass spectrometry depth profiling of sodium-implanted polyethylene terephthalate. SURF INTERFACE ANAL 2017. [DOI: 10.1002/sia.6264] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]

For:	Kudriavtsev Y, Hernández A, Asomoza R, Korol V. Time-of-flight mass spectrometry depth profiling of sodium-implanted polyethylene terephthalate. SURF INTERFACE ANAL 2017. [DOI: 10.1002/sia.6264] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]

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Leitzenberger M, Kuegler P, Krivec S, Hutter H. Acquisition of artifact free alkali metal distributions in SiO ₂ by ToF‐SIMS Cs ⁺ depth profiling at low temperatures. SURF INTERFACE ANAL 2021. [DOI: 10.1002/sia.6956] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/05/2022]