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For: Seah M. Analytic function to describe interfaces and resolution consistency in sputter depth profiling. SURF INTERFACE ANAL 2017. [DOI: 10.1002/sia.6347] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/16/2022]
Number Cited by Other Article(s)
1
SIMS of organic layers with unknown matrix parameters: Locating the interface in dual beam argon gas cluster depth profiles. SURF INTERFACE ANAL 2019. [DOI: 10.1002/sia.6701] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/07/2023]
2
Karpov YA, Filippov MN, Baranovskaya VB. Solved and Unsolved Problems of the Metrology of Chemical Analysis. JOURNAL OF ANALYTICAL CHEMISTRY 2019. [DOI: 10.1134/s1061934819090053] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/23/2022]
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