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For: Hofmann S, Sanz JM. Characterization of contamination layers by emission angle dependent XPS with a double-pass CMA. SURF INTERFACE ANAL 1984. [DOI: 10.1002/sia.740060207] [Citation(s) in RCA: 29] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
Number Cited by Other Article(s)
1
Iwasaki T, Park HJ, Konuma M, Lee DS, Smet JH, Starke U. Long-range ordered single-crystal graphene on high-quality heteroepitaxial Ni thin films grown on MgO(111). NANO LETTERS 2011;11:79-84. [PMID: 21126100 DOI: 10.1021/nl102834q] [Citation(s) in RCA: 40] [Impact Index Per Article: 3.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
2
Pamler W. Advances in Auger microanalysis for semiconductor technology. SURF INTERFACE ANAL 1994. [DOI: 10.1002/sia.740220172] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/05/2022]
3
Holloway PH, Bussing TD. Quantitative surface analysis of layered materials. SURF INTERFACE ANAL 1992. [DOI: 10.1002/sia.740180402] [Citation(s) in RCA: 24] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
4
Steffen J, Hofmann S. Oxidation of NiCr and NiCrFe alloys at room temperature. SURF INTERFACE ANAL 1988. [DOI: 10.1002/sia.740111207] [Citation(s) in RCA: 49] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
5
Sanz JM, Hofmann S. Quantitative AES depth profiling of very thin overlayers. SURF INTERFACE ANAL 1986. [DOI: 10.1002/sia.740080403] [Citation(s) in RCA: 41] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
6
Hofmann S. Practical surface analysis: state of the art and recent developments in AES, XPS, ISS and SIMS. SURF INTERFACE ANAL 1986. [DOI: 10.1002/sia.740090104] [Citation(s) in RCA: 90] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
7
Quantification of preferential sputtering and contamination overlayer effects in AES sputter profiling. SURF INTERFACE ANAL 1984. [DOI: 10.1002/sia.740060208] [Citation(s) in RCA: 20] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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