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Nguyen CL, Metson JB. Differential sputtering and the formation of repeating fragments in ToF-SIMS spectra of light metal alloy surfaces. SURF INTERFACE ANAL 2012. [DOI: 10.1002/sia.5013] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
Affiliation(s)
- Chuong L. Nguyen
- Light Metals Research Centre, School of Chemical Sciences; The University of Auckland; Private Bag 92019 Auckland 1142 New Zealand
- Materials Accelerator; The University of Auckland; Private Bag 92019 Auckland 1142 New Zealand
| | - James B. Metson
- Light Metals Research Centre, School of Chemical Sciences; The University of Auckland; Private Bag 92019 Auckland 1142 New Zealand
- MacDiarmid Institute for Advanced Materials and Nanotechnology; Victoria University of Wellington; PO Box 600 Wellington 6140 New Zealand
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Seah MP, Geller J, Suzuki M. Accurate measurement of sputtered depth for ion sputtering rates and yields: the mesh replica method. SURF INTERFACE ANAL 2007. [DOI: 10.1002/sia.2511] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
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Pola J, Bastl Z, Urbanov� M, ??ubrt J, Beckers H. Perhydridosilicone films produced by IR laser-induced chemical vapour deposition from disiloxane. Appl Organomet Chem 2000. [DOI: 10.1002/1099-0739(200009)14:9<453::aid-aoc31>3.0.co;2-c] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
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K�hler L, Scaglione S, Giorgi R, Riga J, Rudolf P, Caudano R. Ability of a Kaufman source to functionalize the surface of polystyrene by low-energy (80-225 eV) nitrogen ion bombardment. SURF INTERFACE ANAL 2000. [DOI: 10.1002/1096-9918(200010)29:10<647::aid-sia911>3.0.co;2-o] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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de Lange R, Hekkink J, Keizer K, Burggraaf A. Formation and characterization of supported microporous ceramic membranes prepared by sol-gel modification techniques. J Memb Sci 1995. [DOI: 10.1016/0376-7388(94)00206-e] [Citation(s) in RCA: 171] [Impact Index Per Article: 5.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
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Goschnick J, Fichtner M, Schneider T, Ache HJ. Rapid determination of erosion rates with electron beam SNMS. Anal Bioanal Chem 1995. [DOI: 10.1007/bf00321332] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
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Viefhaus H, Hennesen K, Lucas M, Müller-Lorenz EM, Grabke HJ. Ion sputter rates and yields for iron-, chromium- and aluminium oxide layers. SURF INTERFACE ANAL 1994. [DOI: 10.1002/sia.740210911] [Citation(s) in RCA: 25] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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Malherbe JB, van der Berg NG. Argon bombardment-induced topography development on InP. SURF INTERFACE ANAL 1994. [DOI: 10.1002/sia.7402201114] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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Depth-structure of airborne microparticles sampled downwind from the city of Karlsruhe in the river Rhine valley. ACTA ACUST UNITED AC 1994. [DOI: 10.1007/bf00321785] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/26/2022]
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Meuris M, De Bisschop P, Vandervorst W. Quantitative study of background signals from crater edges and surroundings in depth profiling of small areas with secondary ion mass spectrometry. SURF INTERFACE ANAL 1993. [DOI: 10.1002/sia.740200304] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
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Zandvliet HJ, Elswijk HB, Tsong IS. Scanning tunneling microscopy and spectroscopy of ion-bombarded Si(111) and Si(100) surfaces. PHYSICAL REVIEW. B, CONDENSED MATTER 1992; 46:7581-7587. [PMID: 10002497 DOI: 10.1103/physrevb.46.7581] [Citation(s) in RCA: 64] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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American society for testing and materials. Standard guide for depth profiling in auger electron spectroscopy (E1127-91). SURF INTERFACE ANAL 1991. [DOI: 10.1002/sia.740171310] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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Measurement of the electric potential in silicon solar cells employing an electron-beam tester. Anal Bioanal Chem 1991. [DOI: 10.1007/bf00321558] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/27/2022]
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Cirlin EH, Cheng YT, Ireland P, Clemens B. Influence of ion mixing, ion beam-induced roughness and temperature on the depth resolution of sputter depth profiling of metallic bilayer interfaces. SURF INTERFACE ANAL 1990. [DOI: 10.1002/sia.740150507] [Citation(s) in RCA: 29] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
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Hanekamp LJ, van den Berg AHJ, Bouwmeester HJM, Sasse AGBM, Kruidhof H. In-depth compositional analysis of ceramic (Bi2O3)0.75(Er2O3)0.25 by AES and XPS. Mikrochim Acta 1990. [DOI: 10.1007/bf01244171] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
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Blain MG, Della-Negra S, Joret H, Schweikert EA. Secondary-ion yields from surfaces bombarded with keV molecular and cluster ions. PHYSICAL REVIEW LETTERS 1989; 63:1625-1628. [PMID: 10040627 DOI: 10.1103/physrevlett.63.1625] [Citation(s) in RCA: 47] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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