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Citation(s) in
RCA
4
(from Reference Citation Analysis)
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1995 (2)
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RCA (4)
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SURFACE AND INTERFACE ANALYSIS (2)
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For:
Ebel H
, Ebel MF, Fischer H, Schoßmann B, Svagera R.
Experimental influences on the results of concentration depth profiling by ARXPS.
SURF INTERFACE ANAL
1994. [DOI:
10.1002/sia.740210629
]
[
Citation(s) in
RCA
: 4
]
[
Impact Index Per Article: 0.1
]
[
Reference Citation Analysis
]
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[Indexed: 11/11/2022]
Number
Cited by Other Article(s)
1
Powell CJ
, Werner WSM, Smekal W. Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy data.
SURF INTERFACE ANAL
2010. [DOI:
10.1002/sia.3689
]
[
Citation(s) in
RCA
: 11
]
[
Impact Index Per Article: 0.8
]
[
Reference Citation Analysis
]
[
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]
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[Indexed: 11/06/2022]
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2
Turner NH
, Schreifels JA. Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy.
Anal Chem
1996. [DOI:
10.1021/a19600146
]
[
Citation(s) in
RCA
: 21
]
[
Impact Index Per Article: 0.8
]
[
Reference Citation Analysis
]
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[Indexed: 11/28/2022]
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Affiliation(s)
Noel H. Turner
Chemistry Division, Naval Research Laboratory, Washington, D.C. 20375-5342
John A. Schreifels
Department of Chemistry, George Mason University, Fairfax, Virginia 22030
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3
Werner WSM
. Partial intensity analysis (PIA) for quantitative electron spectroscopy.
SURF INTERFACE ANAL
1995. [DOI:
10.1002/sia.740231103
]
[
Citation(s) in
RCA
: 51
]
[
Impact Index Per Article: 1.8
]
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[Indexed: 11/07/2022]
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4
Depth profiling by ARXPS in surface analysis.
ACTA ACUST UNITED AC
1995. [DOI:
10.1007/bf00322091
]
[
Citation(s) in
RCA
: 3
]
[
Impact Index Per Article: 0.1
]
[
Reference Citation Analysis
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[Indexed: 10/26/2022]
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