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For: Rooke MA, Sherwood PMA. X-ray photoelectron spectroscopic study of ion etching and electrical biasing of silicon nitride on a carbon fiber. SURF INTERFACE ANAL 1994. [DOI: 10.1002/sia.740211002] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
Number Cited by Other Article(s)
1
Wang YQ, Chen J, Gao F, Sherwood PM. Photoelectron spectroscopic studies of the interfacial reaction between glass and commercial adhesive. SURF INTERFACE ANAL 2009. [DOI: 10.1002/sia.3048] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
2
Cazaux J. Electron- and X-ray-induced electron emissions from insulators. POLYM INT 2001. [DOI: 10.1002/pi.650] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
3
Havercroft NJ, Sherwood PMA. Use of differential surface charging to separate chemical differences in x-ray photoelectron spectroscopy. SURF INTERFACE ANAL 2000. [DOI: 10.1002/(sici)1096-9918(200003)29:3<232::aid-sia731>3.0.co;2-6] [Citation(s) in RCA: 38] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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