Visualization of the electrical conductivity of freestanding nanowires

Low Energy Electron Point Source Microscopy of Two-Dimensional Carbon Nanostructures

1 nm thick carbon nanomembranes (CNMs) are investigated with Low Energy Electron Point Source (LEEPS) microscopy. A CNM consists of a freely suspended carbon film made from a cross-linked self-assembled monolayer (SAM). During thermal annealing the CNM transforms into nanocrystalline graphene.We determined the electron transmissivity of CNMs from the LEEPS images. After pyrolysis, the LEEPS images showed clear differences compared to pristine CNMs. Upon annealing above 800 ºC the LEEPS images exhibit distinct features that are related to the structural transition. A comparison of LEEPS images with transmission electron micrographs of the same regions and features demonstrates that both microscopic techniques reveal similar structural features.

Low energy electron point source microscopy: beyond imaging

Low energy electron point source (LEEPS) microscopy has the capability to record in-line holograms at very high magnifications with a fairly simple set-up. After the holograms are numerically reconstructed, structural features with the size of about 2 nm can be resolved. The achievement of an even higher resolution has been predicted. However, a number of obstacles are known to impede the realization of this goal, for example the presence of electric fields around the imaged object, electrostatic charging or radiation induced processes. This topical review gives an overview of the achievements as well as the difficulties in the efforts to shift the resolution limit of LEEPS microscopy towards the atomic level. A special emphasis is laid on the high sensitivity of low energy electrons to electrical fields, which limits the structural determination of the imaged objects. On the other hand, the investigation of the electrical field around objects of known structure is very useful for other tasks and LEEPS microscopy can be extended beyond the task of imaging. The determination of the electrical resistance of individual nanowires can be achieved by a proper analysis of the corresponding LEEPS micrographs. This conductivity imaging may be a very useful application for LEEPS microscopes.