Loading…
Login
Scholar Register
Business Register
Subscribe
Loading…
Article Title
Abstract
Keyword
Category
MESH Heading
Grant Agency
RCAID
DOI
PMID
PMCID
Author
Affiliation
Email
Journal Title
ISSN
Publisher
Loading…
Contains
Equals
Find an Article
Find an Article (55347802)
Find a Category (124)
Find a Journal (6144)
Find a Scholar (3970)
Find an Academic Assistant (17)
Find an Article PDF (4612468)
Today's Articles (69)
Subscriber (49385)
Citation(s) in
RCA
14
(from Reference Citation Analysis)
Indexed Articles
Today (0)
Yesterday (0)
This Week (0)
Last Week (0)
Current Month (0)
Last Month (0)
Ranked By
Impact Index Per Article
Citation(s) in
RCA
Results Analysis
Year Published Analysis
Article Type Analysis
Journal Title Analysis
Category Analysis
Results Analysis
Year Published
2014 (1)
2008 (1)
2003 (1)
1999 (1)
1990 (3)
1988 (4)
1987 (1)
1986 (2)
Show more
Refine
Article Statistics
RCA (14)
SCIE (14)
Refine
Publication Titles
SURFACE AND INTERFACE ANALYSIS (13)
ACTA ACUSTICA UNITED WITH ACUSTICA (1)
Show more
Refine
Category
Chemistry, Physical (13)
Multidisciplinary Sciences (1)
Show more
Refine
For:
Hofmann S
, Sanz JM.
Depth Resolution and Quantitative Evaluation of AES Sputtering Profiles.
Thin Film and Depth Profile Analysis
1984. [DOI:
10.1007/978-3-642-46499-7_7
]
[
Citation(s) in
RCA
: 24
]
[
Impact Index Per Article: 0.6
]
[
Reference Citation Analysis
]
[
What about the content of this article? (
0
)
]
[
Track Full Text
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 02/13/2023]
Number
Cited by Other Article(s)
1
Hofmann S
. Sputter depth profiling: past, present, and future.
SURF INTERFACE ANAL
2014. [DOI:
10.1002/sia.5489
]
[
Citation(s) in
RCA
: 20
]
[
Impact Index Per Article: 2.0
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/10/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
S. Hofmann
Max Planck Institute for Intelligent Systems (formerly MPI for Metals Research); Heisenbergstrasse 3 70569 Stuttgart Germany
Collapse
2
Information depth determination for hard X-ray photoelectron spectroscopy up to 15 keV photoelectron kinetic energy.
SURF INTERFACE ANAL
2008. [DOI:
10.1002/sia.2920
]
[
Citation(s) in
RCA
: 34
]
[
Impact Index Per Article: 2.1
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/07/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
3
SIMS: from research to production control.
SURF INTERFACE ANAL
2003. [DOI:
10.1002/sia.1569
]
[
Citation(s) in
RCA
: 12
]
[
Impact Index Per Article: 0.6
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/07/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
4
Hofmann S
. From depth resolution to depth resolution function: refinement of the concept for delta layers, single layers and multilayers.
SURF INTERFACE ANAL
1999. [DOI:
10.1002/(sici)1096-9918(199909)27:9<825::aid-sia638>3.0.co;2-d
]
[
Citation(s) in
RCA
: 65
]
[
Impact Index Per Article: 2.6
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/12/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
5
Weiss Z
. Correcting the depth profiles broadened by the crater effect: A numerical procedure.
SURF INTERFACE ANAL
1990. [DOI:
10.1002/sia.740151213
]
[
Citation(s) in
RCA
: 5
]
[
Impact Index Per Article: 0.1
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/06/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
6
Pamler W
, Wildenauer E, Mitwalsky A. Improved depth resolution in Auger depth profiles of TiN thin films by optimized sputtering parameters.
SURF INTERFACE ANAL
1990. [DOI:
10.1002/sia.740151010
]
[
Citation(s) in
RCA
: 17
]
[
Impact Index Per Article: 0.5
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/11/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
7
Bukaluk A
. AES depth profile studies of interdiffusion in the AgCu bilayer and multilayer thin films.
ACTA ACUST UNITED AC
1990. [DOI:
10.1002/pssa.2211180111
]
[
Citation(s) in
RCA
: 17
]
[
Impact Index Per Article: 0.5
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/08/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
8
Queirolo G
, Manzini S, Meda L, Anderle M, Canteri R, Armigliato A, Frabboni S. On the silicon dioxide/polycrystalline silicon interface width measurement.
SURF INTERFACE ANAL
1988. [DOI:
10.1002/sia.740130406
]
[
Citation(s) in
RCA
: 4
]
[
Impact Index Per Article: 0.1
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/09/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
9
Lam NQ
. Ion bombardment effects on the near-surface composition during sputter profiling.
SURF INTERFACE ANAL
1988. [DOI:
10.1002/sia.740120202
]
[
Citation(s) in
RCA
: 70
]
[
Impact Index Per Article: 1.9
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/10/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
10
Tapping RL
, Davidson RD, Jackman TE, Davies JA. Effect of analytical method on thickness measurements of thin oxide films.
SURF INTERFACE ANAL
1988. [DOI:
10.1002/sia.740110806
]
[
Citation(s) in
RCA
: 12
]
[
Impact Index Per Article: 0.3
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/06/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
11
Mischler S
, Mathieu HJ, Landolt D. Investigation of a passive film on an ironchromium alloy by AES and XPS.
SURF INTERFACE ANAL
1988. [DOI:
10.1002/sia.740110403
]
[
Citation(s) in
RCA
: 86
]
[
Impact Index Per Article: 2.4
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/07/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
12
Hofmann S
, Zalar A. Depth resolution improvement in AES sputter profiling of Ni/Cr multilayers on rough substrates using two ion beams.
SURF INTERFACE ANAL
1987. [DOI:
10.1002/sia.740100103
]
[
Citation(s) in
RCA
: 17
]
[
Impact Index Per Article: 0.5
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/12/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
13
Sanz JM
, Hofmann S. Quantitative AES depth profiling of very thin overlayers.
SURF INTERFACE ANAL
1986. [DOI:
10.1002/sia.740080403
]
[
Citation(s) in
RCA
: 41
]
[
Impact Index Per Article: 1.1
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/07/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
14
Hofmann S
. Determination of depth resolution from measured sputtering profiles of multilayer structures: Equations and approximations.
SURF INTERFACE ANAL
1986. [DOI:
10.1002/sia.740080209
]
[
Citation(s) in
RCA
: 49
]
[
Impact Index Per Article: 1.3
]
[
Reference Citation Analysis
]
[
Track Full Text
]
[
Journal Information
]
[
Subscribe
]
[
Scholar Register
]
[Indexed: 11/09/2022]
Abstract
Collapse
Key Words
Collapse
MESH Headings
Collapse
Grants
Collapse
Affiliation(s)
Collapse
Page 1 of 1
1
Loading…
Loading…
Export Articles to File
Export Citation Analysis
Export Citation Analysis
Article Number From
to
A maximum of 600 records can be exported at a time.
Format:
*
Excel
Plain Text
PDF
WORD
Invalid value
Loading…
Click to Download the Exported File
Loading…
Loading…
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA
Select the Category
Loading…
Loading…
Impact Index Per Article
Calculation for Impact Index Per Article
Times Cited ÷ Number of Years = Impact Index Per Article
TM
Loading…
