Reference Citation Analysis: Find an Article, Find a Category, Find a Journal, Find a Scholar

For:	Schulz M, Goetzberger A, Fränz I, Langheinrich W. Controlled gold doping of silicon by using ion implantation. ACTA ACUST UNITED AC 1974. [DOI: 10.1007/bf00887275] [Citation(s) in RCA: 19] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]

Number	Cited by Other Article(s)
1	Oualid J, Sarti D, Gervais J, Martinuzzi S. Characterisation of electron traps in Cu2S-CdS polycrystalline cells by capacitance transient measurements. ACTA ACUST UNITED AC 2001. [DOI: 10.1088/0022-3719/12/12/017] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
2	On the theory of the diffusion of gold into dislocated silicon wafers. ACTA ACUST UNITED AC 1982. [DOI: 10.1007/bf00616669] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/26/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
3	Mechanism and kinetics of the diffusion of gold in silicon. ACTA ACUST UNITED AC 1980. [DOI: 10.1007/bf00903217] [Citation(s) in RCA: 307] [Impact Index Per Article: 6.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
4	Axmann A, Schulz M, Fritzsche CR. Implantation doping of germanium with Sb, As, and P. ACTA ACUST UNITED AC 1977. [DOI: 10.1007/bf00896143] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/26/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
5	Schulz M. Determination of deep trap levels in silicon using ion-implantation and CV-measurements. ACTA ACUST UNITED AC 1974. [DOI: 10.1007/bf00884233] [Citation(s) in RCA: 41] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
6	Ion implantation: A useful tool for semiconductor research. ACTA ACUST UNITED AC 1974. [DOI: 10.1007/bf00884263] [Citation(s) in RCA: 17] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/26/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse