• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article (55647553)   Find a Category (125)   Find a Journal (6166)   Find a Scholar (4225)   Find an Academic Assistant (18)
Find an Article PDF (4636755)   Today's Articles (3382)   Subscriber (50112)
Citation(s) in RCA

Indexed Articles
Ranked By
Results Analysis
  •   
  •   
  •   
  •   
Results Analysis
Article Statistics
Refine
For: Lefèvre H. Trap-centers of self-interstitials in silicon. ACTA ACUST UNITED AC 1980;22:15-22. [DOI: 10.1007/bf00897926] [Citation(s) in RCA: 24] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022]
Number Cited by Other Article(s)
1
Intrinsic Point Defects. COMPUTATIONAL MICROELECTRONICS 2004. [DOI: 10.1007/978-3-7091-0597-9_2] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/19/2023]
2
New oxygen donors in silicon. ACTA ACUST UNITED AC 1989. [DOI: 10.1007/bf00617763] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/26/2022]
PrevPage 1 of 1 1Next
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA