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Citation(s) in
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For:
Ligeon E
, Bruel M, Bontemps A, Chambert G, Monnier J.
Analyse du phosphore dans le silicium par reactions nucleaires.
J Radioanal Nucl Chem
1973;
16
:537-50. [DOI:
10.1007/bf02514183
]
[
Citation(s) in
RCA
: 7
]
[
Impact Index Per Article: 0.1
]
[
Reference Citation Analysis
]
[
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[Indexed: 10/24/2022]
Number
Cited by Other Article(s)
1
Differential pulse polarographic determination of traces of phosphorus in semiconductor silicon.
Anal Chim Acta
1981. [DOI:
10.1016/s0003-2670(01)83902-7
]
[
Citation(s) in
RCA
: 3
]
[
Impact Index Per Article: 0.1
]
[
Reference Citation Analysis
]
[
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]
[
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[Indexed: 11/22/2022]
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2
Industrial analytical application of particle accelerators.
J Radioanal Nucl Chem
1980. [DOI:
10.1007/bf02516856
]
[
Citation(s) in
RCA
: 1
]
[
Impact Index Per Article: 0.0
]
[
Reference Citation Analysis
]
[
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]
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[Indexed: 10/23/2022]
Abstract
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3
The determination of traces of phosphorus in semiconductor silicon.
Anal Chim Acta
1978. [DOI:
10.1016/s0003-2670(01)84072-1
]
[
Citation(s) in
RCA
: 4
]
[
Impact Index Per Article: 0.1
]
[
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[Indexed: 11/23/2022]
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4
Bibliography section.
J Radioanal Nucl Chem
1974. [DOI:
10.1007/bf02516340
]
[
Citation(s) in
RCA
: 0
]
[
Impact Index Per Article: 0
]
[
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[Indexed: 10/23/2022]
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5
Determination des fonctions d'excitation des reactions19F(p, α0)16O et7Li(p, α0)4He entre 150 et 1800 keV.
ACTA ACUST UNITED AC
1974. [DOI:
10.1007/bf02518097
]
[
Citation(s) in
RCA
: 17
]
[
Impact Index Per Article: 0.3
]
[
Reference Citation Analysis
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[Indexed: 11/26/2022]
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