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For: Fian A, Haase A, Stadlober B, Jakopic G, Matsko NB, Grogger W, Leising G. AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors. Anal Bioanal Chem 2008;390:1455-61. [DOI: 10.1007/s00216-007-1663-7] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/31/2007] [Revised: 09/21/2007] [Accepted: 09/28/2007] [Indexed: 11/26/2022]
Number Cited by Other Article(s)
1
Schune C, Yonger M, Bresson B, Fretigny C, Guy L, Chaussée T, Lequeux F, Montes H, Verneuil E. Combining Ellipsometry and AFM To Probe Subnanometric Precursor Film Dynamics of Polystyrene Melts. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2019;35:7727-7734. [PMID: 31117730 DOI: 10.1021/acs.langmuir.9b00768] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
2
The Utility of Nanocomposites in Fire Retardancy. MATERIALS 2010;3:4580-4606. [PMID: 28883342 PMCID: PMC5445768 DOI: 10.3390/ma3094580] [Citation(s) in RCA: 62] [Impact Index Per Article: 4.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/21/2010] [Revised: 07/27/2010] [Accepted: 08/31/2010] [Indexed: 11/17/2022]
3
Singh Meena J, Chu MC, Kuo SW, Chang FC, Ko FH. Improved reliability from a plasma-assisted metal-insulator-metal capacitor comprising a high-k HfO2 film on a flexible polyimide substrate. Phys Chem Chem Phys 2010;12:2582-9. [DOI: 10.1039/b917604g] [Citation(s) in RCA: 23] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
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