Temperature Dependence of Arn+ Cluster Backscattering from Polymer Surfaces: a New Method to Determine the Surface Glass Transition Temperature

Investigating the relationship between the mechanical properties of plasma polymer-like thin films and their glass transition temperature

This work aims at understanding the influence of the substrate temperature (T_s) on the viscoelastic properties of propanethiol plasma polymer films (PPFs). By means of state-of-the-art AFM characterization-based techniques including peak force quantitative nanomechanical mapping (PFQNM), nano dynamic mechanical analysis (nDMA) and "scratch" experiments, it has been demonstrated that the mechanical behaviour of PPFs is dramatically affected by the thermal conditions of the substrate. Indeed, the material behaves from a high viscous liquid (i.e. viscosity ∼ 10⁶ Pa s) to a viscoelastic solid (loss modulus ∼ 1.17 GPa, storage modulus ∼ 1.61 GPa) and finally to an elastic solid (loss modulus ∼ 1.95 GPa, storage modulus ∼ 8.51 GPa) when increasing T_s from 10 to 45 °C. This behaviour is ascribed to an increase in the surface glass transition temperature of the polymeric network. The latter has been correlated with the chemical composition through the presence of unbound molecules acting as plasticizers and the cross-linking density of the layers. In a second step, this knowledge is exploited for the fabrication of a nanopattern by generating surface instabilities in the propanethiol PPF/Al bilayer system.

Large cluster ions: soft local probes and tools for organic and bio surfaces

Ionised cluster beams have been produced and employed for thin film deposition and surface processing for half a century. In the last two decades, kiloelectronvolt cluster ions have also proved to be outstanding for surface characterisation by secondary ion mass spectrometry (SIMS), because their sputter and ion yields are enhanced in a non-linear fashion with respect to monoatomic projectiles, with a resulting step change of sensitivity for analysis and imaging. In particular, large gas cluster ion beams, or GCIB, have now become a reference in organic surface and thin film analysis using SIMS and X-ray photoelectron spectroscopy (XPS). The reason is that they induce soft molecular desorption and offer the opportunity to conduct damageless depth-profiling and 3D molecular imaging of the most sensitive organic electronics and biological samples, with a nanoscale depth resolution. In line with these recent developments, the present review focuses on rather weakly-bound, light-element cluster ions, such as noble or other gas clusters, and water or alcohol nanodroplets (excluding clusters made of metals, inorganic salts or ionic liquids) and their interaction with surfaces (essentially, but not exclusively, organic). The scope of this article encompasses three aspects. The first one is the fundamentals of large cluster impacts with surfaces, using the wealth of information provided by molecular dynamics simulations and experimental observations. The second focus is on recent applications of large cluster ion beams in surface characterisation, including mass spectrometric analysis and 2D localisation of large molecules, molecular depth-profiling and 3D molecular imaging. Finally, the perspective explores cutting edge developments, involving (i) new types of clusters with a chemistry designed to enhance performance for mass spectrometry imaging, (ii) the use of cluster fragment ion backscattering to locally retrieve physical surface properties and (iii) the fabrication of new biosurface and thin film architectures, where large cluster ion beams are used as tools to transfer biomolecules in vacuo from a target reservoir to any collector substrate.

Time-of-flight secondary ion mass spectrometry analysis of chitosan-treated viscose fibres

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was employed to analyse cellulose viscose fibres treated with different chitosan-based solutions. The analysis reports several new features in the TOF-SIMS spectra for systems with various forms of chitosan-treated surfaces. The characteristic positive ion TOF-SIMS signals for chitosan are reported at m/z 147.90, 207.07, and 221.09, and characteristic signals for trimethyl chitosan are present at m/z 58.03 and 102.09. Furthermore, new fragments were suggested to characterise acetylated chitosan molecules. The relative surface concentrations of different species were obtained based on the specific signal ratios (originating from a specific fragment and cellulose). SIMS imaging was then performed in order to investigate the surface distribution of chitosan, trimethyl chitosan, and Na-containing nanoparticles. In order to perform TOF-SIMS imaging, the above-mentioned characteristic signals were employed and m/z 22.99 was used for Na nanoparticles.