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For:
Baird R
, Fadley C, Kawamoto S, Mehta M.
Direct observation of surface-profile effects on X-ray-photoelectron angular distributions.
Chem Phys Lett
1975. [DOI:
10.1016/0009-2614(75)80198-9
]
[
Citation(s) in
RCA
: 22
]
[
Impact Index Per Article: 0.4
]
[
Reference Citation Analysis
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[Indexed: 11/26/2022]
Number
Cited by Other Article(s)
1
ZEMEK J
. Electron Spectroscopy of Corrugated Solid Surfaces.
ANAL SCI
2010;
26
:177-86. [DOI:
10.2116/analsci.26.177
]
[
Citation(s) in
RCA
: 15
]
[
Impact Index Per Article: 1.0
]
[
Reference Citation Analysis
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[Indexed: 11/23/2022]
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Affiliation(s)
J. ZEMEK
Institute of Physics, Academy of Sciences of the Czech Republic
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2
Wu O
, Peterson G, LaRocca W, Butler E. ESCA signal intensity dependence on surface area (roughness).
ACTA ACUST UNITED AC
1982. [DOI:
10.1016/0378-5963(82)90058-7
]
[
Citation(s) in
RCA
: 27
]
[
Impact Index Per Article: 0.6
]
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[Indexed: 11/16/2022]
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3
Waff HS
, Holdren GR. The nature of grain boundaries in dunite and lherzolite xenoliths: Implications for magma transport in refractory upper mantle material.
ACTA ACUST UNITED AC
1981. [DOI:
10.1029/jb086ib05p03677
]
[
Citation(s) in
RCA
: 21
]
[
Impact Index Per Article: 0.5
]
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[Indexed: 11/09/2022]
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4
Mehta M
, Fadley C. Angular-dependent X-ray photoemission study of oxidized silicon at low X-ray incidence angles.
Chem Phys Lett
1977. [DOI:
10.1016/0009-2614(77)85248-2
]
[
Citation(s) in
RCA
: 17
]
[
Impact Index Per Article: 0.4
]
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[Indexed: 10/18/2022]
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5
Properties of oxidized silicon as determined by angular-dependent X-ray photoelectron spectroscopy.
Chem Phys Lett
1976. [DOI:
10.1016/0009-2614(76)80496-4
]
[
Citation(s) in
RCA
: 230
]
[
Impact Index Per Article: 4.7
]
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[Indexed: 11/23/2022]
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6
Solid state—and surface—analysis by means oF angular-dependent x-ray photoelectron spectroscopy.
PROG SOLID STATE CH
1976. [DOI:
10.1016/0079-6786(76)90013-3
]
[
Citation(s) in
RCA
: 139
]
[
Impact Index Per Article: 2.8
]
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[Indexed: 10/27/2022]
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