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For: Baird R, Fadley C, Kawamoto S, Mehta M. Direct observation of surface-profile effects on X-ray-photoelectron angular distributions. Chem Phys Lett 1975. [DOI: 10.1016/0009-2614(75)80198-9] [Citation(s) in RCA: 22] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022]
Number Cited by Other Article(s)
1
ZEMEK J. Electron Spectroscopy of Corrugated Solid Surfaces. ANAL SCI 2010;26:177-86. [DOI: 10.2116/analsci.26.177] [Citation(s) in RCA: 15] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/23/2022]
2
Wu O, Peterson G, LaRocca W, Butler E. ESCA signal intensity dependence on surface area (roughness). ACTA ACUST UNITED AC 1982. [DOI: 10.1016/0378-5963(82)90058-7] [Citation(s) in RCA: 27] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
3
Waff HS, Holdren GR. The nature of grain boundaries in dunite and lherzolite xenoliths: Implications for magma transport in refractory upper mantle material. ACTA ACUST UNITED AC 1981. [DOI: 10.1029/jb086ib05p03677] [Citation(s) in RCA: 21] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
4
Mehta M, Fadley C. Angular-dependent X-ray photoemission study of oxidized silicon at low X-ray incidence angles. Chem Phys Lett 1977. [DOI: 10.1016/0009-2614(77)85248-2] [Citation(s) in RCA: 17] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/18/2022]
5
Properties of oxidized silicon as determined by angular-dependent X-ray photoelectron spectroscopy. Chem Phys Lett 1976. [DOI: 10.1016/0009-2614(76)80496-4] [Citation(s) in RCA: 230] [Impact Index Per Article: 4.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/23/2022]
6
Solid state—and surface—analysis by means oF angular-dependent x-ray photoelectron spectroscopy. PROG SOLID STATE CH 1976. [DOI: 10.1016/0079-6786(76)90013-3] [Citation(s) in RCA: 139] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
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