Ziegler J, Wu C, Williams P, White C, Terreault B, Scherzer B, Schulte R, Schneid E, Magee C, Ligeon E, 'Ecuyer J, Lanford W, Kuehne F, Kamykowski E, Hofer W, Guivarc'h A, Filleux C, Deline V, Evans C, Cohen B, Clark G, Chu W, Brassard C, Blewer R, Behrisch R, Appleton B, Allred D. Profiling hydrogen in materials using ion beams.
ACTA ACUST UNITED AC 1978. [DOI:
10.1016/0029-554x(78)90834-0]
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