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For: Hofer W, Liebl H, Roos G, Staudenmaier G. An electronic aperture for in-depth analysis of solids with an ion microprobe. ACTA ACUST UNITED AC 1976;19:327-34. [DOI: 10.1016/0020-7381(76)80015-0] [Citation(s) in RCA: 22] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Number Cited by Other Article(s)
1
Wittmaack K. Depth profiling by means of sims: Recent progress and current problems. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/00337578208222841] [Citation(s) in RCA: 27] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
2
Hues SM, Colton RJ. Results of a SIMS round robin sponsored by ASTM committee E-42 on surface analysis. SURF INTERFACE ANAL 1989. [DOI: 10.1002/sia.740140302] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/05/2022]
3
6. Ion Scattering and Secondary-Ion Mass Spectrometry. ACTA ACUST UNITED AC 1985. [DOI: 10.1016/s0076-695x(08)60320-8] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 04/13/2023]
4
Traxlmayr U, Riedling K, Zinner E. On the dead-time correction of ion counting systems during gated raster SIMS measurements. ACTA ACUST UNITED AC 1984. [DOI: 10.1016/0168-1176(84)87100-1] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
5
Laxhuber L, Möhwald H, Hashmi M. Secondary-ion mass spectrometry of organized organic model systems. ACTA ACUST UNITED AC 1983. [DOI: 10.1016/0020-7381(83)85031-1] [Citation(s) in RCA: 19] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/15/2022]
6
Tsong I, Power G, Hoffman D, Magee C. Edge-effects correction in depth profiles obtained by ion-beam sputtering. ACTA ACUST UNITED AC 1980. [DOI: 10.1016/0029-554x(80)91283-5] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
7
Degrève F, Figaret R, Laty P. Depth profiling by ion microprobe with high mass resolution. ACTA ACUST UNITED AC 1979. [DOI: 10.1016/0020-7381(79)80005-4] [Citation(s) in RCA: 20] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
8
Hofer WO, Martin PJ. On the influence of reactive gases on sputtering and secondary ion emission. ACTA ACUST UNITED AC 1978. [DOI: 10.1007/bf00885122] [Citation(s) in RCA: 49] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
9
Liebl H. Mass spectrometry of solids ? with special emphasis on probe sampling. Mikrochim Acta 1978. [DOI: 10.1007/bf01201730] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022]
10
Ziegler J, Wu C, Williams P, White C, Terreault B, Scherzer B, Schulte R, Schneid E, Magee C, Ligeon E, 'Ecuyer J, Lanford W, Kuehne F, Kamykowski E, Hofer W, Guivarc'h A, Filleux C, Deline V, Evans C, Cohen B, Clark G, Chu W, Brassard C, Blewer R, Behrisch R, Appleton B, Allred D. Profiling hydrogen in materials using ion beams. ACTA ACUST UNITED AC 1978. [DOI: 10.1016/0029-554x(78)90834-0] [Citation(s) in RCA: 143] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
11
Raster scanning depth profiling of layer structures. ACTA ACUST UNITED AC 1977. [DOI: 10.1007/bf00896140] [Citation(s) in RCA: 74] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022]
12
A simple electronic aperture for rastered-beam depth profiles. ACTA ACUST UNITED AC 1976. [DOI: 10.1016/0020-7381(76)80092-7] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
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