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Aranzales D, Wijenberg JHOJ, Koper MTM. The Effect of Naphthalene‐Based Additives on the Kinetics of Tin Electrodeposition on Boron‐Doped Diamond Electrodes. ChemElectroChem 2021. [DOI: 10.1002/celc.202100034] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Affiliation(s)
- Diana Aranzales
- Leiden Institute of Chemistry Leiden University P.O. Box 9502 2300 RA Leiden The Netherlands
| | - Jacques H. O. J. Wijenberg
- Tata Steel Research & Development IJmuiden Technology Centre P.O. Box 10.000 1970 CA IJmuiden The Netherlands
| | - Marc T. M. Koper
- Leiden Institute of Chemistry Leiden University P.O. Box 9502 2300 RA Leiden The Netherlands
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Oskam G, Long JG, Nikolova M, Searson PC. Electrochemical Deposition of Metals on Semiconductors. ACTA ACUST UNITED AC 2011. [DOI: 10.1557/proc-451-257] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022]
Abstract
ABSTRACTThe general concepts governing the electrochemical deposition of metal films on semiconductors are discussed, and recent results on the fabrication of Schottky junctions consisting of silicon electrodeposited with platinum, copper and gold are presented. In order to obtain good adherent metal films, the density of nuclei should be high and the films should be grown at low current densities where the charge transfer process is rate limiting. This situation can be realized using potential controlled electrochemical deposition. For metal deposition on silicon, the surface should be pretreated in HF to dissolve the oxide layer. Furthermore, the surface should be stable during deposition which can be achieved by tailoring the deposition solutions and by using electrochemical deposition at negative potentials. It is shown that by using this approach, n-type silicon / Pt, Au, and Cu Schottky junctions can be fabricated of a quality comparable to that of junctions prepared by sputter and vapor deposition techniques.
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Zegenhagen J, Lee TL, Gründer Y, Renner FU, Fimland BO. The Adsorption and Growth of Copper on As-Terminated GaAs(001): Physical Vapour versus Electrochemical Deposition. ACTA ACUST UNITED AC 2009. [DOI: 10.1524/zpch.2007.221.9-10.1273] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
Abstract
The adsorption of copper deposited from an effusion cell in ultra high vacuum and electrodeposited from aqueous solution on As-terminated GaAs(001) is investigated by scanning tunneling microscopy, X-ray diffraction, as well as X-ray standing waves in combination with X-ray fluorescence spectroscopy. The analysis of the adsorbate is performed in situ with the samples either in ultra high vacuum or in aqueous electrolyte under potential control. Deposited as Cu ions from sulphuric acid solution, submonolayer coverages of Cu diffuse into the GaAs interface region assumimg predominantly Ga substitutional positions. Different positions with lower symmetry are occupied by Cu if submonolayer are deposited at room temperature in ultra high vacuum. At higher coverage, epitaxial Cu clusters grow by electrodeposition on the As-terminated GaAs(001), but with the Cu lattice of the islands rotated and inclined with respect to the GaAs substrate lattice, leading in total to eight equivalent domains. At comparable coverage, no epitaxial growth was observed for Cu deposited in ultra high vacuum.
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Yagi I, Idojiri S, Awatani T, Uosaki K. Electrodeposition of flattened Cu nanoclusters on a p-GaAs(001) electrode monitored by in situ optical second harmonic generation. J Phys Chem B 2007; 109:5021-32. [PMID: 16863162 DOI: 10.1021/jp045458s] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/12/2023]
Abstract
In situ optical second harmonic generation (SHG) technique was employed to investigate the shape and density of Cu nanoclusters, which were electrochemically formed on p-GaAs(001) electrode surfaces. Since GaAs is not a centrosymmetric medium, a significant portion of SHG signal arises from the bulk dipole susceptibility, but it was possible to separate a surface-induced signal from a bulk-induced signal by choosing an appropriate experimental geometry and appropriate data processing. The rotational anisotropy (RA) pattern of the SHG signal from a p-GaAs(001) electrode changed in both shape and magnitude during potential cycling in an electrolyte solution containing Cu2+. The surface plasmon-induced SHG signal from Cu nanoclusters deposited on GaAs was attributed to the modulation source for the RA-SHG pattern. More detailed study was carried out with both in situ SHG and ex situ AFM measurements for Cu nanoclusters deposited by potential step. The results showed that the SHG signal at the present optical geometry was sensitive to the number of oblate or flattened Cu nanoclusters with lateral diameter larger than 30 nm and that the SHG enhancement occurred because of resonant coupling between the surface plasmon induced in the flattened Cu nanoclusters and the near-infrared fundamental light.
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Affiliation(s)
- Ichizo Yagi
- Physical Chemistry Laboratory, Division of Chemistry, Graduate School of Science, Hokkaido University, Sapporo 060-0810, Japan.
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Guo L, Radisic A, Searson PC. Kinetic Monte Carlo Simulations of Nucleation and Growth in Electrodeposition. J Phys Chem B 2005; 109:24008-15. [PMID: 16375391 DOI: 10.1021/jp055077u] [Citation(s) in RCA: 29] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Abstract
Nucleation and growth during bulk electrodeposition is studied using kinetic Monte Carlo (KMC) simulations. Ion transport in solution is modeled using Brownian dynamics, and the kinetics of nucleation and growth are dependent on the probabilities of metal-on-substrate and metal-on-metal deposition. Using this approach, we make no assumptions about the nucleation rate, island density, or island distribution. The influence of the attachment probabilities and concentration on the time-dependent island density and current transients is reported. Various models have been assessed by recovering the nucleation rate and island density from the current-time transients.
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Affiliation(s)
- Lian Guo
- Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218, USA
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Ehlers C, König U, Staikov G, Schultze J. Role of surface states in electrodeposition of Pb on n-Ge(111). Electrochim Acta 2001. [DOI: 10.1016/s0013-4686(01)00590-4] [Citation(s) in RCA: 32] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
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Schmuki P, Erickson LE. Selective high-resolution electrodeposition on semiconductor defect patterns. PHYSICAL REVIEW LETTERS 2000; 85:2985-2988. [PMID: 11005984 DOI: 10.1103/physrevlett.85.2985] [Citation(s) in RCA: 25] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/27/2000] [Indexed: 05/23/2023]
Abstract
We report a new principle and technique that allows one to electrodeposit material patterns of arbitrary shape down to the submicrometer scale. We demonstrate that an electrochemical metal deposition reaction can be initiated selectively at surface defects created in a p-type Si(100) substrate by Si (++) focused ion beam bombardment. The key principle is that, for cathodic electrochemical polarization of p-type material in the dark, breakdown of the blocking Schottky barrier at the semiconductor/electrolyte interface occurs at significantly lower voltages at implanted locations than for an unimplanted surface. This difference in the threshold voltages is exploited to achieve selective electrochemical deposition.
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Affiliation(s)
- P Schmuki
- Swiss Federal Institute of Technology (EPFL), Department of Materials Science, LC-DMX, CH-1015 Lausanne, Switzerland
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Ziegler J, Reitzle A, Bunk O, Zegenhagen J, Kolb D. Metal deposition on n-Si(111):H electrodes. Electrochim Acta 2000. [DOI: 10.1016/s0013-4686(00)00611-3] [Citation(s) in RCA: 59] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
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Tamura K, Oyanagi H, Kondo T, Koinuma M, Uosaki K. Structural Study of Electrochemically Deposited Cu on p-GaAs(100) in H2SO4 Solution by In Situ Surface-Sensitive X-ray Absorption Fine Structure Measurements. J Phys Chem B 2000. [DOI: 10.1021/jp0011286] [Citation(s) in RCA: 28] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Affiliation(s)
- Kazuhisa Tamura
- Physical Chemistry Laboratory, Division of Chemistry, Graduate School of Science, Hokkaido University, Sapporo 060-0810, Japan, and Electrotechnical Laboratory, Tsukuba, Ibaraki, 305-8568, Japan
| | - Hiroyuki Oyanagi
- Physical Chemistry Laboratory, Division of Chemistry, Graduate School of Science, Hokkaido University, Sapporo 060-0810, Japan, and Electrotechnical Laboratory, Tsukuba, Ibaraki, 305-8568, Japan
| | - Toshihiro Kondo
- Physical Chemistry Laboratory, Division of Chemistry, Graduate School of Science, Hokkaido University, Sapporo 060-0810, Japan, and Electrotechnical Laboratory, Tsukuba, Ibaraki, 305-8568, Japan
| | - Michio Koinuma
- Physical Chemistry Laboratory, Division of Chemistry, Graduate School of Science, Hokkaido University, Sapporo 060-0810, Japan, and Electrotechnical Laboratory, Tsukuba, Ibaraki, 305-8568, Japan
| | - Kohei Uosaki
- Physical Chemistry Laboratory, Division of Chemistry, Graduate School of Science, Hokkaido University, Sapporo 060-0810, Japan, and Electrotechnical Laboratory, Tsukuba, Ibaraki, 305-8568, Japan
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Krumm R, Guel B, Schmitz C, Staikov G. Nucleation and growth in electrodeposition of metals on n-Si(111). Electrochim Acta 2000. [DOI: 10.1016/s0013-4686(00)00418-7] [Citation(s) in RCA: 79] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/25/2022]
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Electrochemical characterisation of a semiconductor–metal junction: n-type InP|Cu; influence of the structure of the metallic layer. J Electroanal Chem (Lausanne) 1998. [DOI: 10.1016/s0022-0728(98)00168-5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/19/2022]
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Vereecken P, Strubbe K, Gomes W. An improved procedure for the processing of chronoamperometric data: Application to the electrodeposition of Cu upon (100) n-GaAs. J Electroanal Chem (Lausanne) 1997. [DOI: 10.1016/s0022-0728(97)00195-2] [Citation(s) in RCA: 21] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
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Sutter E, Mathieu C, Moulayat N, Etcheberry A. Effect of copper coating on the behaviour of p-InP electrodes. J Electroanal Chem (Lausanne) 1997. [DOI: 10.1016/s0022-0728(96)05020-6] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
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