Reference Citation Analysis: Find an Article, Find a Category, Find a Journal, Find a Scholar

For:	Anthony J, Thomas J. Accelerator based mass spectrometry of semiconductor materials. ACTA ACUST UNITED AC 1983;218:463-7. [DOI: 10.1016/0167-5087(83)91022-0] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/22/2022]

Number	Cited by Other Article(s)
1	McDaniel FD, Matteson S, Anthony JM, Weathers DL, Duggan JL, Marble DK, Hassan I, Zhao ZY, Arrale AM, Kim YD. Trace element analysis by accelerator mass spectrometry. J Radioanal Nucl Chem 1993. [DOI: 10.1007/bf02037200] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
2	McDaniel FD, Matteson S, Weathers DL, Duggan JL, Marble DK, Hassan I, Zhao ZY, Anthony JM. Radionuclide dating and trace element analysis by accelerator mass spectrometry. J Radioanal Nucl Chem 1992. [DOI: 10.1007/bf02041663] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
3	Shaffner TJ. New developments in surface characterization techniques for the semiconductor industry. SURF INTERFACE ANAL 1989. [DOI: 10.1002/sia.740141007] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse